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1. The ABCs of Using Standard Reference Materials in the Analysis of Foods and Dietary Supplements: A Practical Guide
Series: Special Publication (NIST SP)
Report Number: 260-181
Published: 6/2/2014
Authors: Katherine E Sharpless, David Lee Duewer, Katrice A Lippa, Andrew L Rukhin
Abstract: Although ,nutraceuticals‰ and ,functional foods‰ seem to be ill-defined terms, both are often used to indicate a food that contains compounds providing benefits beyond basic nutrition, often with the expectation that these compounds are protectiv ...

2. Decision-Theoretic Aspects of Meta-Analysis
Published: 4/1/2014
Author: Andrew L Rukhin
Abstract: In the random-effects model of meta-analysis a canonical representation of the restricted likelihood function is obtained. The relationship between the common mean estimators and the heterogeneity variance estimators is explored via this representati ...

3. Bounds on Elementary Symmetric Functions
Published: 1/31/2014
Author: Andrew L Rukhin
Abstract: Tight bounds on an elementary symmetric function are established for given values of these polynomials of lower order.

4. Restricted Likelihood Representation for Multivariate Heterogeneous Random Effects Models
Published: 1/31/2014
Author: Andrew L Rukhin
Abstract: In the random-effects model of meta-analysis for heterogeneous multidimensional data a canonical representation of the restricted likelihood function is obtained. This representation is related to a linear data transform which is based on the algebr ...

5. Bayes Estimators of Heterogeneity Variance and T-Systems
Published: 1/8/2014
Author: Andrew L Rukhin
Abstract: The considered problem concerns simultaneous inference for curve-confined natural parameters of independent, heterogeneous gamma-random variables with known shape parameters. The meta-analysis motivated loss function is suggested and some propertie ...

6. Compatibility Verification of Certified Reference Materials and User Measurements
Published: 12/9/2013
Author: Andrew L Rukhin
Abstract: A problem that frequently occurs in metrology is one of assessing compatibility of data obtained by a user laboratory with the specified values and uncertainty estimates from the certificate of analysis. The user‰s data are summarized by a measura ...

7. Assessing Conformity of Two Laboratories: Formulations as a Statistical Hypothesis Testing Problem
Published: 1/9/2013
Author: Andrew L Rukhin
Abstract: A decision problem frequently occurring in metrology is that of compatibility of data obtained by two (or several) different laboratories, methods or instruments. Several statistical approaches to this conformity assessment problem are reviewed inclu ...

8. Simultaneous Estimation and Reduction of Nonconformity in Interlaboratory Studies
Published: 8/8/2012
Authors: Andrew L Rukhin, William E Strawderman
Abstract: Several procedures designed to reduce nonconformity in interlaboratory studies by shrinking data toward a consensus weighted mean are suggested. Some of them are shown to have a smaller quadratic risk than the vector sample mean. Shrinkage toward a w ...

9. Estimating heterogeneity variance in meta-analysis
Published: 8/6/2012
Author: Andrew L Rukhin
Abstract: Several new estimators of the between-study variability in a heterogeneous random effects meta-analysis model are derived. One of them can be interpreted as the empirical Bayes procedure for a diffuse prior with the given prior mean. Another is th ...

10. Estimating common mean and heterogeneity variance in two study case meta-analysis
Published: 4/1/2012
Author: Andrew L Rukhin
Abstract: The relative behavior of estimators of the common mean and of the heterogeneity variance in the simplest random effects model of meta-analysis is explored. A simple estimator improving on the DerSimonian-Laird procedure is derived.

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Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series