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Author: hyun wook ro
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1. Anisotropic, Hierarchical Surface Patterns via Surface Wrinkling of Nanoimprinted Polymer Films
Published: 10/22/2012
Authors: Junghyun Lee, Hyun Wook Ro, Rui Huang, Thomas Avery Germer, Paul Lemaillet, Christopher L Soles, Christopher M Stafford
Abstract: we demonstrated the wrinkling behavior of nanopatterned PS films, whose wrinkle wavelength and resultant morphology depend strongly on geometric parameters of surface patterns as well as the direction of the applied strain relative to the nanopattern ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=912044

2. Capillary Instability in Nanoimprinted Polymer Films
Published: 5/21/2009
Authors: Kyle J. Alvine, Yifu Ding, Hyun Wook Ro, Brian C. Okerberg, Alamgir Karim, Christopher L Soles, Jack F Douglas
Abstract: Capillary forces play an active role in defining the equilibrium structure of nanoscale structures. This effect can be especially pronounced in soft materials such as polymers near or above their glass transition temperatures where material flow is ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=852751

3. Capillary Wave Dynamics of Thin Polymer films over Submerged Nanostructures
Published: 11/16/2012
Authors: Christopher L Soles, Hyun Wook Ro, K. J. Alvine, Oleg Shpyrko, Yenling Dai, Alec Sandy, Suresh Narayanan
Abstract: The surface dynamics of thin molten polystyrene films supported by nanoscale periodic silicon line-space gratings were investigated with X-ray photon correlation spectroscopy. Surface dynamics over these nanostructures exhibit high directional aniso ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910869

4. Characterizing Pattern Structures Using X-Ray Reflectivity
Published: 3/28/2008
Authors: Hae-Jeong Lee, Christopher L Soles, Hyun Wook Ro, Shuhui Kang, Eric K Lin, Alamgir Karim, Wen-Li Wu
Abstract: Specular X-ray reflectivity (SXR) can be used, in the limit of the effective medium approximation (EMA), as a high-resolution shape metrology for periodic patterns on a planar substrate. The EMA means that the density of the solid pattern and the sp ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=852735

5. Crystallization of Polyethylene Oxide Patterend by Nanoimprint Lithography
Published: 3/28/2007
Authors: Brian C. Okerberg, Christopher L Soles, Jack F Douglas, Hyun Wook Ro, Alamgir Karim
Abstract: The crystallization behavior of poly(ethylene oxide) (PEO) films patterned by nanoimprint lithography is studied. The imprinted PEO film consists of parallel lines, approximately 240 nm wide and 320 nm tall, on a 400 nm pitch with a residual laye ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=852701

6. Effect of Initial Resist Thickness on Residual Layer Thickness of Nanoimprinted Structures
Published: 12/1/2005
Authors: Hae-Jeong Lee, Hyun Wook Ro, Christopher L Soles, Ronald Leland Jones, Eric K Lin, Wen-Li Wu, Daniel R. Hines
Abstract: Accurate quantification and control of the residual layer thickness is a critical challenge to achieving sub-50 nm patterning with nanoimprint lithography. While characterization to within a few nanometers is essential, there is currently a lack of ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=852524

7. Electrical and structural characterization of high performance airbrushed organic thin film transistors
Published: 3/18/2010
Authors: Calvin Chan, Lee J Richter, Cherno Jaye, Brad Conrad, Hyun Wook Ro, David Germack, Daniel A Fischer, Dean M DeLongchamp, David J Gundlach
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905344

8. Evidence for Internal Stresses Induced by Nanoimprint Lithography
Published: 11/30/2006
Authors: Hyun Wook Ro, Yifu Ding, Hae-Jeong Lee, Daniel R. Hines, Ronald Leland Jones, Eric K Lin, Alamgir Karim, Wen-Li Wu, Christopher L Soles
Abstract: The thermal embossing form of nanoimprint lithography is used to pattern arrays of nanostructures into several different polymer films. The shape of the imprinted patterns is characterized with nm precision using both X-ray scattering and reflectivi ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=852638

9. High performance airbrushed organic thin film transistors
Published: 3/30/2010
Authors: Calvin Chan, Lee J Richter, Brad Anthony Dinardo, Cherno Jaye, Brad Conrad, Hyun Wook Ro, David Germack, Daniel A Fischer, Dean M DeLongchamp, David J Gundlach
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=904576

10. In situ measurement of annealing-induced line shape decay in nanoimprinted polymers using scatterometry
Published: 3/2/2009
Authors: Heather J Patrick, Thomas Avery Germer, Yifu Ding, Hyun Wook Ro, Lee J Richter, Christopher L Soles
Abstract: Thermal embossing nanoimprint lithography (NIL) is an area of continuing interest because it allows direct patterning of nanoscale structures into a wide variety of functional polymer materials. Measuring the shape evolution of nanoimprinted lines d ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=901568



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