NIST logo

Publications Portal

You searched on:
Author: william rippey
Sorted by: date

Displaying records 1 to 10 of 41 records.
Resort by: Date / Title


1. Design and Usage Guide for Version 0.92 of the Quality Information Framework Data Model and XML (Extensible Markup Language) Schemas
Series: Technical Note (NIST TN)
Report Number: 1777
Published: 11/23/2012
Authors: Fiona Zhao, Thomas Rollin Kramer, Robert Brown, Scott Hoffman, Matt Hoffman, William G Rippey, Robert Stone
Abstract: This document describes the design approach used for implementing version 0.92 of the Quality Information Framework (QIF) data model, including implementation practices for the Extensible Markup Language (XML) Schema Definition Language (XSD) sch ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910400

2. Toward Better Integration of Vehicle Assembly Production Systems
Published: 11/15/2012
Authors: Jorge Arinez, John L Michaloski, Frederick M Proctor, William G Rippey, C Jerry Yen
Abstract: In today's manufacturing world, system integration often necessitates composing systems of technology that are not designed to interoperate with each other. This inherent incompatibility results in redundant, non-value added work that is required fo ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=911930

3. An Integrated Data Model for Quality Information Exchange in Manufacturing Systems
Published: 7/27/2012
Authors: William G Rippey, Yaoyao Fiona Zhao, Thomas Rollin Kramer, John A Horst, Frederick M Proctor
Abstract: Quality measurement is an integrated part of modern manufacturing systems. As the manufacturing industry has entered a digital and virtual era, information technology has become increasingly important for both machining and measurement systems. Effec ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910781

4. Quality Information Framework ‹ Integrating Metrology Processes
Published: 5/25/2012
Authors: Fiona Zhao, Thomas Rollin Kramer, John A Horst, William G Rippey, Robert Brown
Abstract: As defined by major dimensional metrology system users and suppliers, the Quality Information Framework (QIF) is an integrated and holistic set of information models which, if widely adopted, can enable the effective exchange of metrology data throug ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910396

5. Validating the Inspection Results Specification of the Quality Information Framework (QIF)
Published: 4/1/2011
Authors: Fiona Zhao, William G Rippey
Abstract: The Quality Information Framework (QIF) is a new standards effort to define standard information interfaces in dimensional inspection. Validating a specification means ensuring that the specification can express all of the data needed by consumers ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908116

6. DMSC Rallies at IMTS 2010, and frequently asked questions
Published: 3/21/2011
Author: William G Rippey
Abstract: The Dimensional Metrology Standards Consortium (DMSC) marketing roadshow converged on the International Manufacturing Technology Show (IMTS) 2010 in Chicago this past September. Buoyed by many supporters, the organization showed the importance of dim ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908115

7. The Dimensional Markup Language Specification for Inspection Results Data
Published: 10/1/2009
Author: William G Rippey
Abstract: The Dimensional Markup Language (DML) specification defines a data model and Extensible Model Language (XML) encoding rules for dimensional inspection results for discrete parts. To support manufacturing quality assurance processes, DML results file ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=903179

8. Update on DMIS Certification
Published: 10/1/2009
Author: William G Rippey
Abstract: The Dimensional Standards Consortium (DMSC) and the National Institute of Standards and Technology (NIST) announced the rollout of the DMSC's DMIS Certification Program at the International Manufacturing Technology Show (IMTS), September 2008. Th ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=903180

9. Interoperability Testing for Shop Floor Measurement
Published: 12/28/2007
Authors: Frederick M Proctor, William G Rippey, John A Horst, Joseph A Falco, Thomas Rollin Kramer
Abstract: Manufactured parts are typically inspected to ensure quality. Inspection involves equipment and software from many different vendors, and interoperability is a major problem faced by manufacturers. The I++ Dimensional Measuring Equipment (DME) specif ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=823620

10. AIAG Demonstrates Metrology Interoperability: To Save You Time and Money
Published: 5/31/2005
Author: William G Rippey
Abstract: The Automotive Industry Action Group (AIAG) is working on the challenges of interconnecting components of automated dimensional metrology systems. Our presentation explains how products that support interoperability standards for components of metrol ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=822678



Search NIST-wide:


(Search abstract and keywords)


Last Name:
First Name:







Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series