NIST logo

Publications Portal

You searched on: Author: lee richter

Displaying records 81 to 90 of 93 records.
Resort by: Date / Title

81. Nonlinear Optics as a Detection Scheme for Biomimetic Sensors: SFG Spectroscopy of Hybrid Bilayer Membrane Formation
Published: 12/15/1999
Authors: T Petralli-Mallow, Kimberly A Briggman, Lee J Richter, John C. Stephenson, Anne L Plant
Abstract: Vibrational spectra of biomimetic membranes have been obtained using a broad-band approach to sum frequency generation (SFG). A new innovation, broad band SFG (BBSFG) allows for high quality SFG spectra with rapid collection times. With the BBSFG a ...

82. Removing Optical Artifacts in Near-Field Scanning Optical Microscopy by Using a Three Dimensional Scanning Mode
Published: 9/1/1999
Authors: C. E. Jordan, Stephan J Stranick, Lee J Richter, Richard R Cavanagh
Abstract: We demonstrate a method of acquiring near-field scanning optical microscopy data that allows for the construction of three different types of images from one data set: topographic, constant-gap, and constant-height. This data set includes the topogr ...

83. Influence of Secondary Tip Shape on Illumination-Mode Near-Field Scanning Optical Microscopy Images
Published: 8/1/1999
Authors: Lee J Richter, C EJ Dentinger, Richard R Cavanagh, Garnett W Bryant, A Liu, Stephan J Stranick, C D Keating, M J Natan
Abstract: We report illumination-mode near-field optical microscopy images of individual 80-115 nm diameter Au particles recorded with metal-coated fiber probes. It is found that the images are strongly influenced by the metal-coating thickness. This depend ...

84. Near-Field Scanning Optical Microscopy Incorporating Raman Scattering for Vibrational Mode Contrast
Published: 1/1/1999
Authors: C EJ Dentinger, Stephan J Stranick, Richard R Cavanagh, Lee J Richter, D B Chase
Abstract: Near-field scanning optical microscopy offers the ability to combine a broad range of spectral contrast features with spatial resolution that is an order of magnitude better than that set by the diffraction limit of the probe light. For many chemica ...

85. High Efficiency, Dual Collection Mode Near-Field Scanning Optical Microscope
Published: 12/1/1998
Authors: Stephan J Stranick, Lee J Richter, Richard R Cavanagh

86. Vibrationally-Resolved Sum-Frequency Generation With Broad Bandwidth Infrared Pulses
Published: 10/15/1998
Authors: Lee J Richter, T Petralli-Mallow, John C. Stephenson
Abstract: We present a novel procedure for vibrationally-resolved sum-frequency generation (SFG) in which a broad-bandwidth IR pulse is mixed with a narrow-bandwidth visible pulse. The resultant SFG spectrum is dispersed with a spectrograph and detected in pa ...

87. High Efficiency, Dual Collection Mode Near-Field Scanning Optical Microscope
Published: 7/1/1998
Authors: Stephan J Stranick, Lee J Richter, Richard R Cavanagh
Abstract: We have developed a near-field scanning optical microscope that provides simultaneous transmission and reflection mode measurements while concurrently recording a topograph of the sample surface. In this microscope design, an ellipsoidal cavity is u ...

88. Depletion-Electric-Field-Induced Second-Harmonic Generation Near Oxidized GaAs(001) Surfaces
Published: 4/15/1997
Authors: T A Germer, K Kolasinski, J C Stephenson, Lee J Richter

89. Femtosecond Laser-Induced Desorption of CO from (Cu100): Comparison of Theory and Experiment
Published: 12/1/1996
Authors: L M Struck, Lee J Richter, Steven A Buntin, Richard R Cavanagh, J C Stephenson

90. Enhanced Near-Field Raman Spectroscopy
Published: Date unknown
Authors: C EJ Dentinger, Stephan J Stranick, Lee J Richter, Richard R Cavanagh
Abstract: Near-field Raman spectroscopy can be used to obtain chemical specificity with the subwavelength spatial resolution of near-field scanning optical microscopy (NSOM). We report detailed measurements of near-field Raman spectra from a single crystal di ...

Search NIST-wide:

(Search abstract and keywords)

Last Name:
First Name:

Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series