Take a sneak peek at the new NIST.gov and let us know what you think!
(Please note: some content may not be complete on the beta site.).

View the beta site
NIST logo

Publications Portal

You searched on: Author: lee richter

Displaying records 81 to 90 of 96 records.
Resort by: Date / Title

81. Scanning Near-Field Infared Microscopy and Spectroscopy with a Broadband Laser Source
Published: 10/1/2000
Authors: Chris A Michaels, Lee J Richter, Richard R Cavanagh, Stephan J Stranick
Abstract: Near-field scanning optical microscopy (NSOM) is a powerful tool for the characterization of the optical properties of nanoscale objects, although pervasive artifacts often create difficulties in image interpretation. A three dimensional scanning NS ...

82. Scanning Near-Field Infrared Microscopy and Spectroscopy With a Broadband Laser Source
Published: 10/1/2000
Authors: Chris A Michaels, Stephan J Stranick, Lee J Richter, Richard R Cavanagh
Abstract: A scanning near-field microscopy that allows the fast acquisition of mid-infrared absorption spectra is described. The microscope couples the nanoscale spatial resolution of a scanning probe microscope with the chemical specificity of vibrational spe ...

83. Assessment of Sensitivity Advances in Near-Field Raman Spectroscopy
Published: 9/1/2000
Authors: Chris A Michaels, C EJ Dentinger, Lee J Richter, D B Chase, Richard R Cavanagh, Stephan J Stranick
Abstract: Near-field Raman spectroscopy can be used to obtain images with both chemical specificity and the subwavelength spatial resolution of near-field scanning optical microscopy (NSOM). In the absence of signal intensification factors, such as surface en ...

84. Nonlinear Optics as a Detection Scheme for Biomimetic Sensors: SFG Spectroscopy of Hybrid Bilayer Membrane Formation
Published: 12/15/1999
Authors: T Petralli-Mallow, Kimberly A Briggman, Lee J Richter, John Carter Stephenson, Anne L Plant
Abstract: Vibrational spectra of biomimetic membranes have been obtained using a broad-band approach to sum frequency generation (SFG). A new innovation, broad band SFG (BBSFG) allows for high quality SFG spectra with rapid collection times. With the BBSFG a ...

85. Removing Optical Artifacts in Near-Field Scanning Optical Microscopy by Using a Three Dimensional Scanning Mode
Published: 9/1/1999
Authors: C. E. Jordan, Stephan J Stranick, Lee J Richter, Richard R Cavanagh
Abstract: We demonstrate a method of acquiring near-field scanning optical microscopy data that allows for the construction of three different types of images from one data set: topographic, constant-gap, and constant-height. This data set includes the topogr ...

86. Influence of Secondary Tip Shape on Illumination-Mode Near-Field Scanning Optical Microscopy Images
Published: 8/1/1999
Authors: Lee J Richter, C EJ Dentinger, Richard R Cavanagh, Garnett W Bryant, A Liu, Stephan J Stranick, C D Keating, M J Natan
Abstract: We report illumination-mode near-field optical microscopy images of individual 80-115 nm diameter Au particles recorded with metal-coated fiber probes. It is found that the images are strongly influenced by the metal-coating thickness. This depend ...

87. Near-Field Scanning Optical Microscopy Incorporating Raman Scattering for Vibrational Mode Contrast
Published: 1/1/1999
Authors: C EJ Dentinger, Stephan J Stranick, Richard R Cavanagh, Lee J Richter, D B Chase
Abstract: Near-field scanning optical microscopy offers the ability to combine a broad range of spectral contrast features with spatial resolution that is an order of magnitude better than that set by the diffraction limit of the probe light. For many chemica ...

88. High Efficiency, Dual Collection Mode Near-Field Scanning Optical Microscope
Published: 12/1/1998
Authors: Stephan J Stranick, Lee J Richter, Richard R Cavanagh

89. Vibrationally-Resolved Sum-Frequency Generation With Broad Bandwidth Infrared Pulses
Published: 10/15/1998
Authors: Lee J Richter, T Petralli-Mallow, John Carter Stephenson
Abstract: We present a novel procedure for vibrationally-resolved sum-frequency generation (SFG) in which a broad-bandwidth IR pulse is mixed with a narrow-bandwidth visible pulse. The resultant SFG spectrum is dispersed with a spectrograph and detected in pa ...

90. High Efficiency, Dual Collection Mode Near-Field Scanning Optical Microscope
Published: 7/1/1998
Authors: Stephan J Stranick, Lee J Richter, Richard R Cavanagh
Abstract: We have developed a near-field scanning optical microscope that provides simultaneous transmission and reflection mode measurements while concurrently recording a topograph of the sample surface. In this microscope design, an ellipsoidal cavity is u ...

Search NIST-wide:

(Search abstract and keywords)

Last Name:
First Name:

Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series