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Author: lee richter

Displaying records 61 to 70 of 90 records.
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61. Selective Study of Polymer/Dielectric Interfaces with Vibrationally Resonant Sum Frequency Generation Via Thin-Film Interference
Published: 4/1/2002
Authors: P T. Wilson, Kimberly A Briggman, William E Wallace III, John C. Stephenson, Lee J Richter
Abstract: A new technique for selective characterization of the structure of free and buried thin film interfaces by vibrationaly resonant sum frequency generation spectroscopy is described. Manipulation of Fressnel coefficients by choice of film thickness on ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831250

62. Vibrational Signatures of Polyethylene Glycol and Brighteners on Copper
Published: 2/1/2002
Authors: B C Baker, Clayton S. Yang, Lee J Richter, Thomas P Moffat
Abstract: With the use of fourier transform infrared spectroscopy (FTIR) and sum frequency generation spectroscopy (SFG), the surface coverage and confirmation of additives often used in copper deposition are identified on copper surfaces. Ex situ experiments ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=853128

63. Correlation of Molecular Orientation With Adhesion at Polystyrene/Solid Interfaces
Published: 1/1/2002
Authors: P T. Wilson, Lee J Richter, William E Wallace III, Kimberly A Briggman, John C. Stephenson
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=853828

64. Selective Study of Polymer/Dielectric Interfaces with Vibrationally Resonant Sum Frequency Generation via Thin Film Interference
Published: 1/1/2002
Authors: P T. Wilson, Kimberly A Briggman, William E Wallace III, John C. Stephenson, Lee J Richter
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=853826

65. Molecular Order at Polymer Interfaces Measured by Broad-Bandwidth Vibrationally Resolved Sum Frequency Generation Spectroscopy
Published: 4/23/2001
Authors: P T. Wilson, Kimberly A Briggman, John C. Stephenson, William E Wallace III, Lee J Richter
Abstract: Broad-bandwidth vibrationally-resolved sum frequency generation spectroscopy has been used to measure the molecular orientation distribution at polystyrene/dielectric interfaces. A novel microcavity structure allows isolation of the free or buried i ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831222

66. Absolute Molecular Orientational Distribution of the Polystyrene Surface
Published: 4/1/2001
Authors: Kimberly A Briggman, John C. Stephenson, William E Wallace III, Lee J Richter
Abstract: Vibrationally-resonant sum frequency generation (VR-SFG) has been used to study the absolute molecular orientational distribution of the pendant phenyl groups at the free surface of polystyrene (PS) thin films on oxidized Si substrates. Characteriza ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841486

67. Modeling Illumination-Mode Near-Field Optical Microscopy of Au Nanoparticles
Published: 3/1/2001
Authors: A Liu, A Rahmani, Garnett W Bryant, Lee J Richter, Stephan J Stranick
Abstract: We present a theoretical analysis of near-field scanning optical microscopy (NSOM) images of small Au particles made in illumination mode. We model the metal-coated fiber tip as a thin disk consisting of a glass core and an aluminum coating. An ext ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=840936

68. Imaging and Autocorrelation of Ultrafast Infrared Laser Pulses in the 3-11 {mu} Range With Silcon CCD Cameras and Photodiodes
Published: 2/15/2001
Authors: Kimberly A Briggman, Lee J Richter, John C. Stephenson
Abstract: Standard silicon photodiodes and CCD cameras are convenient and inexpensive alternatives to cryogenically cooled diodes or arrays for autocorrelation and imaging of ultrafast infrared (IR) laser pulses in the wavelength range 3-11 {mu}. The response ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841452

69. Imaging and autocorrelation of ultrafast infrared laser pulses in the 3 11 {mu} range with silicon CCD cameras and photodiodes
Published: 2/15/2001
Authors: Kimberly A Briggman, Lee J Richter, John C. Stephenson
Abstract: Standard silicon photodiodes and CCD cameras are convenient and inexpensive alternatives to cryogenically cooled diodes or arrays for autocorrelation and imaging of ultrafast IR laser pulses in the wavelength range 3-11 {mu}. The response of these Si ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=101291

70. Abstracts for the MSEL Assessment Panel, March 2001
Published: 1/26/2001
Authors: Leslie E Smith, Alamgir Karim, Leonid A Bendersky, C Lu, J J Scott, Ichiro Takeuchi, Kathleen M. Flynn, Vinod K Tewary, Davor Balzar, G A Alers, Stephen E Russek, Charles C. Han, Haonan Wang, William E Wallace III, Daniel A Fischer, K Efimenko, Wen-Li Wu, Jan Genzer, Joseph C Woicik, Thomas H Gnaeupel-Herold, Henry Joseph Prask, Charles F Majkrzak, Norman F. Berk, John Barker, Charles J. Glinka, Eric K Lin, Ward L Johnson, Paul R Heyliger, David Thomas Read, R R Keller, J Blendell, Grady S White, Lin-Sien H Lum, Eric J Cockayne, Igor Levin, C E Johnson, Maureen E Williams, Gery R Stafford, William J Boettinger, Kil Won Moon, Daniel Josell, Daniel Wheeler, Thomas P Moffat, W H Huber, Lee J Richter, Clayton S. Yang, Robert D Shull, R A. Fry, Robert D McMichael, William F. Egelhoff Jr., Ursula R Kattner, James A Warren, Jonathan E Guyer, Steven P Mates, Stephen D Ridder, Frank S. Biancaniello, D Basak, Jon C Geist, Kalman D Migler
Abstract: Abstracts relating to research and development in the NIST Materials Science and Engineering Laboratory (MSEL) are presented for a poster session to be presented to the 2001 MSEL Assessment Panel.
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=850052