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You searched on: Author: lee richter

Displaying records 51 to 60 of 96 records.
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51. Interface Characterization of Molecular-Monolayer/SiO2 Based Molecular Junctions
Published: 4/19/2006
Authors: Curt A Richter, Christina Ann Hacker, Lee J Richter, Oleg A Kirillov, John S Suehle, Eric M. Vogel
Abstract: We present a correlation of the results of dc-current-voltage (IV) and ac-capacitance-voltage (CV) measurements with vibrational spectroscopy of Au/monolayer/SiO2/Si structures to establish an improved understanding of the interactions at the buried ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=32175

52. Alkanethiols on Platinum: Multicomponent Self-Assembled Monolayers
Published: 3/14/2006
Authors: D Y Petrovykh, H Y Kimura-Suda, A Opdahl, Lee J Richter, Michael J Tarlov, L J Whitman
Abstract: We have studied the formation of self-assembled monolayers (SAMs) of n-alkanethiols on platinum thin films using X-ray photoelectron spectroscopy (XPS), reflection-absorption infrared spectroscopy (RAIRS), spectroscopic ellipsometry (SE), and contact ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=830909

53. An In Situ Ellipsometric Study of Cl^u-^ -Induced Adsorption of PEG on Ru and on Underpotential Deposited Cu on Ru
Published: 1/1/2006
Authors: Marlon L Walker, Lee J Richter, Daniel Josell, Thomas P Moffat
Abstract: The adsorption of PEG-Cl on a.) air-oxidized Ru, b.) reduced or activated Ru and c.) underpotential deposited (upd) Cu on activated Ru was examined in-situ using spectroscopic ellipsometry. In the absence of Cl- ion, PEG adsorption was minimal at ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831389

54. Electrodeposition of Cu on Ru Barrier Layers for Damascene Processing
Published: 12/2/2005
Authors: Thomas P Moffat, Marlon L Walker, P J Chen, John E Bonevich, William F. Egelhoff Jr., Lee J Richter, Daniel Josell, C A Witt, T Aaltonen, M Ritala, M Leskela
Abstract: Superfilling of sub-micrometer trenches by direct copper electrodeposition onto PVD and ALD Ru barriers is demonstrated. The Cu nucleation and growth mode is found to be sensitive to the oxidation state of the Ru surface as well as the copper deposi ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=853400

55. Electrical and Spectroscopic Characterization of Metal/Monolayer/Si Devices
Published: 11/24/2005
Authors: Curt A Richter, Christina Ann Hacker, Lee J Richter
Abstract: A simple technique for vibrational spectroscopy of metal/monolayer/silicon structures is applied to study the interaction of Au, Al, and Ti with alkane monolayers, either assembled onto thin oxides or directly attached to Si. The results are correlat ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=31908

56. Variations in Semiconducting Polymer Microstructure and Hole Mobility With Spin-Coating Speed
Published: 11/15/2005
Authors: Dean M DeLongchamp, Brandon M. Vogel, Youngsuk Jung, Curt A Richter, Oleg A Kirillov, Jan Obrzut, Daniel A Fischer, S Sambasivan, Marc Gurau, Lee J Richter, Eric K Lin
Abstract: Organic semiconductors permit low-cost processing methods such as spin-coating, dip coating, or ink-jet printing onto flexible substrates. However, the performance of these materials in devices is difficult to control and new processing methods can ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=852534

57. Variations in Semiconducting Polymer Microstructure and Hole Mobility with Spin-Coating Speed
Published: 11/15/2005
Authors: Dean M. DeLongchamp, B M. Vogel, Y Jung, M C. Gurau, Curt A Richter, Oleg A Kirillov, J Obrzut, Debra A. Fischer, Sharadha Sambasivan, Lee J Richter, E K. Lin
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=32494

58. Variations in semiconducting polymer microstructure and hole mobility with spin coating speed
Published: 11/15/2005
Authors: Daniel A Fischer, S Sambasivan, Lee J Richter, Eric K Lin
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=854301

59. IR Spectroscopic Characterization of the Buried Metal Interface of Metal-Molecule-Silicon Vertical Diodes
Published: 9/28/2005
Authors: Christina Ann Hacker, Curt A Richter, Lee J Richter
Abstract: We have developed and utilized p-polarized backside reflection absorption infrared spectroscopy (pb-RAIRS) to examine dielectrics between silicon substrates and metallic overlayers. The technique has been used to investigate oxides, organic layers on ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=31935

60. In Situ Ellipsometric Study of PEG/Cl^u-^ Coadsorption on Cu, Ag, and Au
Published: 5/1/2005
Authors: Marlon L Walker, Lee J Richter, Thomas P Moffat
Abstract: Spectroscopic ellipsometry was used to examine the adsorption of polyethylene glycol (PEG) and Cl- on polycrystalline Cu, Ag and Au electrodes in sulfuric acid. In halide-free sulfuric acid, PEG adsorption on Cu and Ag is minimal at potentials positi ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831365



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