NIST logo

Publications Portal

You searched on: Author: lee richter

Displaying records 51 to 60 of 94 records.
Resort by: Date / Title

51. An In Situ Ellipsometric Study of Cl^u-^ -Induced Adsorption of PEG on Ru and on Underpotential Deposited Cu on Ru
Published: 1/1/2006
Authors: Marlon L Walker, Lee J Richter, Daniel Josell, Thomas P Moffat
Abstract: The adsorption of PEG-Cl on a.) air-oxidized Ru, b.) reduced or activated Ru and c.) underpotential deposited (upd) Cu on activated Ru was examined in-situ using spectroscopic ellipsometry. In the absence of Cl- ion, PEG adsorption was minimal at ...

52. Electrodeposition of Cu on Ru Barrier Layers for Damascene Processing
Published: 12/2/2005
Authors: Thomas P Moffat, Marlon L Walker, P J Chen, John E Bonevich, William F. Egelhoff Jr., Lee J Richter, Daniel Josell, C A Witt, T Aaltonen, M Ritala, M Leskela
Abstract: Superfilling of sub-micrometer trenches by direct copper electrodeposition onto PVD and ALD Ru barriers is demonstrated. The Cu nucleation and growth mode is found to be sensitive to the oxidation state of the Ru surface as well as the copper deposi ...

53. Electrical and Spectroscopic Characterization of Metal/Monolayer/Si Devices
Published: 11/24/2005
Authors: Curt A Richter, Christina Ann Hacker, Lee J Richter
Abstract: A simple technique for vibrational spectroscopy of metal/monolayer/silicon structures is applied to study the interaction of Au, Al, and Ti with alkane monolayers, either assembled onto thin oxides or directly attached to Si. The results are correlat ...

54. Variations in Semiconducting Polymer Microstructure and Hole Mobility With Spin-Coating Speed
Published: 11/15/2005
Authors: Dean M DeLongchamp, Brandon M. Vogel, Youngsuk Jung, Curt A Richter, Oleg A Kirillov, Jan Obrzut, Daniel A Fischer, S Sambasivan, Marc Gurau, Lee J Richter, Eric K Lin
Abstract: Organic semiconductors permit low-cost processing methods such as spin-coating, dip coating, or ink-jet printing onto flexible substrates. However, the performance of these materials in devices is difficult to control and new processing methods can ...

55. Variations in Semiconducting Polymer Microstructure and Hole Mobility with Spin-Coating Speed
Published: 11/15/2005
Authors: Dean M. DeLongchamp, B M. Vogel, Y Jung, M C. Gurau, Curt A Richter, Oleg A Kirillov, J Obrzut, D A. Fischer, Sharadha Sambasivan, Lee J Richter, E K. Lin

56. Variations in semiconducting polymer microstructure and hole mobility with spin coating speed
Published: 11/15/2005
Authors: Daniel A Fischer, S Sambasivan, Lee J Richter, Eric K Lin

57. IR Spectroscopic Characterization of the Buried Metal Interface of Metal-Molecule-Silicon Vertical Diodes
Published: 9/28/2005
Authors: Christina Ann Hacker, Curt A Richter, Lee J Richter
Abstract: We have developed and utilized p-polarized backside reflection absorption infrared spectroscopy (pb-RAIRS) to examine dielectrics between silicon substrates and metallic overlayers. The technique has been used to investigate oxides, organic layers on ...

58. In Situ Ellipsometric Study of PEG/Cl^u-^ Coadsorption on Cu, Ag, and Au
Published: 5/1/2005
Authors: Marlon L Walker, Lee J Richter, Thomas P Moffat
Abstract: Spectroscopic ellipsometry was used to examine the adsorption of polyethylene glycol (PEG) and Cl- on polycrystalline Cu, Ag and Au electrodes in sulfuric acid. In halide-free sulfuric acid, PEG adsorption on Cu and Ag is minimal at potentials positi ...

59. Comparison of Si-O-C interfacial bonding of alcohols and aldehydes on Si(111) formed from dilute solution with ultraviolet irradiation
Published: 10/8/2004
Authors: Christina Ann Hacker, Kelly A Anderson, Lee J Richter, Curt A Richter
Abstract: Aliphatic alcohols and aldehydes were reacted with the Si(111)-H surface to form Si-O-C interfacial bonds from dilute solution using ultraviolet light. The monolayers were characterized by using transmission infrared spectroscopy, spectroscopic ellip ...

60. Structure of Polystyrene at the Interface With Various Liquids
Published: 9/4/2004
Authors: Clayton S. Yang, P T. Wilson, Lee J Richter
Abstract: Vibrationally resonant sum frequency generation (VR-SFG) is used to determine the structure of the phenyl side groups of deuterated polystyrene at the liquid/solid interface for the nonsolvent liquids: hexane, methanol, ethanol, glycerol, and water. ...

Search NIST-wide:

(Search abstract and keywords)

Last Name:
First Name:

Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series