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Author: lee richter

Displaying records 21 to 30 of 86 records.
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21. In situ measurement of annealing-induced line shape decay in nanoimprinted polymers using scatterometry
Published: 3/2/2009
Authors: Heather J Patrick, Thomas Avery Germer, Yifu Ding, Hyun Wook Ro, Lee J Richter, Christopher L Soles
Abstract: Thermal embossing nanoimprint lithography (NIL) is an area of continuing interest because it allows direct patterning of nanoscale structures into a wide variety of functional polymer materials. Measuring the shape evolution of nanoimprinted lines d ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=901568

22. Semiconducting Thienothiophene Copolymers: Design, Synthesis, Morphology and Performance in Thin Film Organic Transistors
Published: 3/1/2009
Authors: Iain McCulloch, Martin Heeney, Michael L. Chabinyc, Dean M DeLongchamp, Regis J Kline, Michael Colle, Warren Duffy, Daniel A Fischer, David J Gundlach, Behrang H Hamadani, Rick Hamilton, Lee J Richter, Alberto Salleo, Martin Shkunov, David Sparrowe, Steve Tierney, Weimin Zhang
Abstract: Organic semiconductors are emerging as a viable alternative to amorphous silicon in a range of thin film transistor devices. , With the possibility to formulate these p-type materials as inks and subsequently print into patterned devices, organic bas ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=854123

23. The molecular basis of mesophase ordering in a thiophene-based copolymer
Published: 2/18/2009
Authors: Dean M DeLongchamp, Regis J Kline, Youngsuk Jung, Eric K Lin, Daniel A Fischer, David J Gundlach, Andrew Moad, Lee J Richter, Michael F. Toney, Martin Heeney, Iain McCulloch
Abstract: The carrier mobility of poly(2,5-bis(3-alkylthiophen-2-yl) thieno[3,2-b]thiophene) semiconductors can be substantially enhanced after heating through a thermotropic mesophase transition, which causes a significant improvement in thin film structural ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=852781

24. Scatterometry for in situ measurement of pattern reflow in nanoimprinted polymers
Published: 12/9/2008
Authors: Heather J Patrick, Thomas Avery Germer, Yifu Ding, Hyun Wook Ro, Lee J Richter, Christopher L Soles
Abstract: We use optical scatterometry to extract the time evolution of the profile of nanoimprinted lines in low and high molecular mass polymer gratings during reflow at the glass transition temperature. The data are obtained continuously during the anneal ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=900878

25. Contact-induced crystallinity for high-performance soluble acene-based transistors and circuits
Published: 3/8/2008
Authors: David J Gundlach, James E Royer, SK Park, Sankar Subramanian, Oana Jurchescu, Behrang H Hamadani, Andrew Moad, Regis J Kline, LC Teague, Oleg A Kirillov, Curt A Richter, Lee J Richter, Sean R Parkin, Thomas Jackson, JE Anthony
Abstract: The use of organic materials presents a tremendous opportunity to significantly impact the functionality and pervasiveness of large-area electronics. Commercialization of this technology requires reduction in manufacturing costs by exploiting inexpen ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=854062

26. Demonstration of Molecular Assembly on Silicon (100) for CMOS-Compatible Molecule-Based Electronic Devices
Published: 3/7/2008
Authors: Nadine Emily Gergel-Hackett, Christopher D Zangmeister, Christina Ann Hacker, Lee J Richter, Curt A Richter
Abstract: In this work, we establish the potential of a UV-promoted direct attachment of alkanes with alcohol and thiol linkers to the CMOS-compatible silicon (100) orientation for use in closed, planar, molecular electronic devices. We develop processes for m ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=32875

27. Contact Induced Crystallinity for High Performance Soluble Acene-Based TFTs
Published: 2/17/2008
Authors: David J Gundlach, James Royer, Behrang H Hamadani, Lucile C. Teague, Andrew J Moad, Oana Jurchescu, Oleg A Kirillov, Lee J Richter, James G. Kushmerick, Curt A Richter, Sungkyu Park, Thomas Jackson, Sankar Subramanian, John E Anthony
Abstract: Organic electronics present a tremendous opportunity to significantly impact the functionality and pervasiveness of large-area electronics. However, the lack of low-temperature low-cost deposition and patterning techniques limits the potential for th ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=32683

28. Critical Role of Side-Chain Attachment Density on the Order and Device Performance of Polythiophenes
Published: 10/30/2007
Authors: Regis J Kline, Dean M DeLongchamp, Daniel A Fischer, Eric K Lin, Lee J Richter, Michael L. Chabinyc, Martin Heeney, Iain McCulloch
Abstract: High performance, solution processable semiconductors are critical to the realization of low cost, large area electronics. We show that a signature molecular packing motif - side-chain interdigitation - correlates to high performance for a large and ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=852680

29. The Characterization of Silicon-Based Molecular Devices
Published: 9/30/2007
Authors: Nadine Emily Gergel-Hackett, Christina Ann Hacker, Lee J Richter, Oleg A Kirillov, Curt A Richter
Abstract: In order to realize molecular electronic (ME) technology, an intermediate integration with more traditional silicon-based technologies will likely be required. However, there has been little effort to develop the metrology needed to enable the fabric ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=32615

30. Distinguishing Between Nonlinear Channel Transport and Contact Effects in Organic FETs
Published: 8/30/2007
Authors: Behrang H Hamadani, Jeremy LeBoeuf, R J Kline, Iain McCulloch, Martin Heeney, Curt A Richter, Lee J Richter, David J Gundlach
Abstract: We investigate charge injection and transport in organic field-effect transistors fabricated by using poly(2,5-bis(3-tetradecylthiophene-2-yl)thieno[3,2-b]thiophene) (pBTTT-C14) as the active polymer layer. We show that in high mobility devices where ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=32741



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