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Author: curt richter

Displaying records 31 to 40 of 166 records.
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31. Graphene Nanoribbon Schottky-barrier FETs for End-of-the-roadmap CMOS: Challenges and Opportunities
Published: 6/21/2010
Authors: Qin Q. Zhang, Y Lu, Huili Xing, Curt A Richter, Steven J Koester, S O Koswatta
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907136

32. Flip Chip Lamination Approach to Fabricate Ultrasmooth Metal Contacts for Organic-based Electronic Device
Published: 6/4/2010
Authors: Mariona Coll Bau, Nadine Emily Gergel-Hackett, Oana Jurchescu, Curt A Richter, Christina Ann Hacker
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907066

33. Metrology to Support Innovation in Nanoelectronics
Published: 5/20/2010
Author: Curt A Richter
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907133

34. Probing Stress Effects in Single Crystal Organic Transistors by Scanning Kelvin Probe Microscopy
Published: 5/1/2010
Authors: L C Teague, Oana Jurchescu, Curt A Richter, Sanker Subramanian, John E Anthony, Thomas Jackson, David J Gundlach, James Kushmerick
Abstract: We report scanning Kelvin probe microscopy SKPM of single crystal difluoro bistriethylsilylethynyl anthradithiophene diF-TESADT organic transistors. SKPM provides a direct measurement of the intrinsic charge transport in the crystals independent of c ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907043

35. Metrology of Molecular Devices made by Flip Chip Lamination
Published: 4/30/2010
Authors: Christina Ann Hacker, Mariona Coll Bau, Curt A Richter
Abstract: Scaling of conventional electronics has continued unabated to dimensions approaching fundamental physical limits. As technology continues to evolve there are increasing demands to identify alternate routes of performing electrical functions. One po ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=904896

36. Advanced Capacitance Metrology for Nanoscale Device Characterization
Published: 4/29/2010
Authors: Joseph Leo Tedesco, Nadine Emily Gergel-Hackett, Laurie A. Stephey, Christina Ann Hacker, Curt A Richter
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=906391

37. Flexible Memristors
Published: 4/28/2010
Authors: Nadine Emily Gergel-Hackett, Laurie A. Stephey, Barbara Dunlap, Joseph Leo Tedesco, Curt A Richter
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905414

38. Metrology of Molecular Devices Made by Flip-chip Lamination
Published: 4/28/2010
Authors: Christina Ann Hacker, Mariona Coll Bau, Curt A Richter
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907126

39. Flexible Titanium Dioxide Memory
Published: 4/25/2010
Authors: Nadine Emily Gergel-Hackett, Laurie Stephey, Barbara Dunlap, Behrang H Hamadani, David J Gundlach, Curt A Richter
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907155

40. Characterization of TiO2 Memristors on Flexible Substrates
Published: 4/19/2010
Authors: Joseph Leo Tedesco, Nadine Emily Gergel-Hackett, Laurie A. Stephey, Christina Ann Hacker, Curt A Richter
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=906390



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