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Author: curt richter

Displaying records 31 to 40 of 170 records.
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31. Switching in Flexible Titanium Oxide Memristors
Published: 6/25/2010
Authors: Joseph Leo Tedesco, Nadine Emily Gergel-Hackett, Laurie A. Stephey, Christina Ann Hacker, Curt A Richter
Abstract: In this study, memristors were fabricated on flexible polyethylene terephthalate (PET) substrates with aluminum contacts and a titanium dioxide film formed with a sol-gel of titanium isopropoxide and ethanol. To study the electric field dependence of ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=906392

32. Graphene Nanoribbon Schottky-barrier FETs for End-of-the-roadmap CMOS: Challenges and Opportunities
Published: 6/23/2010
Authors: Qin Q. Zhang, Yeqing Lu, Huili Xing, Curt A Richter, Steven J Koester, Siyuranga Koswatta
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907102

33. Probing Stress Effects in Single Crystal Organic Transistors by Scanning Kelvin Probe Microscopy
Published: 6/23/2010
Authors: LC Teague, Oana Jurchescu, Curt A Richter, Sankar Subramanian, John E Anthony, Thomas Jackson, David J Gundlach, James G. Kushmerick
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907141

34. Graphene Nanoribbon Schottky-barrier FETs for End-of-the-roadmap CMOS: Challenges and Opportunities
Published: 6/21/2010
Authors: Qin Q. Zhang, Y Lu, Huili Xing, Curt A Richter, Steven J Koester, S O Koswatta
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907136

35. Flip Chip Lamination Approach to Fabricate Ultrasmooth Metal Contacts for Organic-based Electronic Device
Published: 6/4/2010
Authors: Mariona Coll Bau, Nadine Emily Gergel-Hackett, Oana Jurchescu, Curt A Richter, Christina Ann Hacker
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907066

36. Metrology to Support Innovation in Nanoelectronics
Published: 5/20/2010
Author: Curt A Richter
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907133

37. Probing Stress Effects in Single Crystal Organic Transistors by Scanning Kelvin Probe Microscopy
Published: 5/1/2010
Authors: L C Teague, Oana Jurchescu, Curt A Richter, Sanker Subramanian, John E Anthony, Thomas Jackson, David J Gundlach, James Kushmerick
Abstract: We report scanning Kelvin probe microscopy SKPM of single crystal difluoro bistriethylsilylethynyl anthradithiophene diF-TESADT organic transistors. SKPM provides a direct measurement of the intrinsic charge transport in the crystals independent of c ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907043

38. Metrology of Molecular Devices made by Flip Chip Lamination
Published: 4/30/2010
Authors: Christina Ann Hacker, Mariona Coll Bau, Curt A Richter
Abstract: Scaling of conventional electronics has continued unabated to dimensions approaching fundamental physical limits. As technology continues to evolve there are increasing demands to identify alternate routes of performing electrical functions. One po ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=904896

39. Advanced Capacitance Metrology for Nanoscale Device Characterization
Published: 4/29/2010
Authors: Joseph Leo Tedesco, Nadine Emily Gergel-Hackett, Laurie A. Stephey, Christina Ann Hacker, Curt A Richter
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=906391

40. Flexible Memristors
Published: 4/28/2010
Authors: Nadine Emily Gergel-Hackett, Laurie A. Stephey, Barbara Dunlap, Joseph Leo Tedesco, Curt A Richter
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905414



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