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You searched on: Author: curt richter

Displaying records 31 to 40 of 172 records.
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31. Fabrication of silicon-based Molecular Electronic Structures Using Flip Chip Lamination
Published: 1/19/2011
Authors: Christina Ann Hacker, Michael A Walsh, Mariona Coll Bau, Curt A Richter
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908430

32. Thermo-Magneto-Electrical Measurement Platform
Published: 10/19/2010
Authors: Kurt Pernstich, Curt A Richter, David J Gundlach
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907222

33. Switching in Flexible Titanium Oxide Memristors
Published: 6/25/2010
Authors: Joseph Leo Tedesco, Nadine Emily Gergel-Hackett, Laurie A. Stephey, Christina Ann Hacker, Curt A Richter
Abstract: In this study, memristors were fabricated on flexible polyethylene terephthalate (PET) substrates with aluminum contacts and a titanium dioxide film formed with a sol-gel of titanium isopropoxide and ethanol. To study the electric field dependence of ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=906392

34. Graphene Nanoribbon Schottky-barrier FETs for End-of-the-roadmap CMOS: Challenges and Opportunities
Published: 6/23/2010
Authors: Qin Q. Zhang, Yeqing Lu, Huili Xing, Curt A Richter, Steven J Koester, Siyuranga Koswatta
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907102

35. Probing Stress Effects in Single Crystal Organic Transistors by Scanning Kelvin Probe Microscopy
Published: 6/23/2010
Authors: LC Teague, Oana Jurchescu, Curt A Richter, Sankar Subramanian, John E Anthony, Thomas Jackson, David J Gundlach, James G. Kushmerick
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907141

36. Graphene Nanoribbon Schottky-barrier FETs for End-of-the-roadmap CMOS: Challenges and Opportunities
Published: 6/21/2010
Authors: Qin Q. Zhang, Y Lu, Huili Xing, Curt A Richter, Steven J Koester, S O Koswatta
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907136

37. Flip Chip Lamination Approach to Fabricate Ultrasmooth Metal Contacts for Organic-based Electronic Device
Published: 6/4/2010
Authors: Mariona Coll Bau, Nadine Emily Gergel-Hackett, Oana Jurchescu, Curt A Richter, Christina Ann Hacker
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907066

38. Metrology to Support Innovation in Nanoelectronics
Published: 5/20/2010
Author: Curt A Richter
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907133

39. Probing Stress Effects in Single Crystal Organic Transistors by Scanning Kelvin Probe Microscopy
Published: 5/1/2010
Authors: L C Teague, Oana Jurchescu, Curt A Richter, Sanker Subramanian, John E Anthony, Thomas Jackson, David J Gundlach, James Kushmerick
Abstract: We report scanning Kelvin probe microscopy SKPM of single crystal difluoro bistriethylsilylethynyl anthradithiophene diF-TESADT organic transistors. SKPM provides a direct measurement of the intrinsic charge transport in the crystals independent of c ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907043

40. Metrology of Molecular Devices made by Flip Chip Lamination
Published: 4/30/2010
Authors: Christina Ann Hacker, Mariona Coll Bau, Curt A Richter
Abstract: Scaling of conventional electronics has continued unabated to dimensions approaching fundamental physical limits. As technology continues to evolve there are increasing demands to identify alternate routes of performing electrical functions. One po ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=904896



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