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You searched on: Author: curt richter

Displaying records 161 to 170 of 175 records.
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161. Ultrathin SiO^d2^ and High-K Materials for ULSI Gate Dielectrics
Published: 9/1/1999
Authors: H. R. Huff, Curt A Richter, M. L. Green, G. Lucovsky, T. Hattori

162. preface to Ultrathin SiO^d2^ and High-K Materials for ULSI Gate Dielectrics, edited by H. R. Huff, C. A. Richter, M. L. Green, G. Lucovsky, and T. Hattori
Published: 9/1/1999
Authors: H. R. Huff, Curt A Richter, M. L. Green, G. Lucovsky, T. Hattori

163. The Future of Gate Dielectrics Considered
Published: 7/1/1999
Author: Curt A Richter
Abstract: Symposium R, Ultrathin SiO^d2^ and High-K Materials for ULSI Gate Dielectrics, provided a large (20 invited speakers and more than 100 total presentations) and exciting overviews of many possible solutions for technologically critical issues associat ...

164. Preface to Materials Research Society 1999 Proceedings
Published: 4/5/1999
Authors: H. R. Huff, Curt A Richter, M. L. Green, G. Lucovsky
Abstract: This Materials research society Proceedings contains 81 papers presented at the Ultrathin SiO^d2^ and High-K Materials for gate Dielectrics Symposium, held April 5-9, 1999, in San Francisco. The symposium was truly international with 34 of the 81 pub ...

165. Neutron Reflectometry, X-Ray Reflectometry, and Spectroscopic Ellipsometry Characterization of Thin SiO^d2^ on Si
Published: 10/12/1998
Authors: Joseph A. Dura, Curt A Richter, Charles F Majkrzak, Nhan V Nguyen

166. Characterization of Thin SiO^d2^ on Si by Spectroscopic Ellipsometry, Neutron Reflectometry, and X-Ray Reflectometry
Published: 7/1/1998
Authors: Curt A Richter, Nhan V Nguyen, Joseph A. Dura, Charles F Majkrzak
Abstract: We compare the results of neutron reflectometry, x-ray reflectometry, and spectroscopic ellipsometry measurements of a thin oxide film (=10 nm). These methods, which arise from three physically different scattering mechanisms, each determine physic ...

167. Thickness Determination of Ultra-Thin SiO^d2^ Films on Si by Spectroscopic Ellipsometry
Published: 12/31/1997
Authors: Nhan V Nguyen, Curt A Richter

168. X-Ray Reflectivity of Interface Roughness Correlated with Transport Properties of (AlGa)As/GaAs High Electron Mobility Transistor Devices
Published: 8/19/1996
Authors: Joseph A. Dura, Joseph G. Pellegrino, Curt A Richter

169. Quantum Conductance Fluctuations in a New Size-Scale Regime
Published: 5/5/1996
Authors: Curt A Richter, David G Seiler, Joseph G. Pellegrino

170. Buffer Layer - MODFET Interactions in the Al0.33Ga0.67As/GaAs Superlattice System
Published: 12/31/1995
Authors: Joseph G. Pellegrino, Curt A Richter, Joseph A. Dura, S. B. Qadri, B. Roughani, Paul M. Amirtharaj

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