NIST logo

Publications Portal

You searched on:
Author: curt richter

Displaying records 151 to 160 of 166 records.
Resort by: Date / Title


151. Spectroscopic Ellipsometry of Ta^d2^0^d5^ On Si, in Ultrathin SiO^d2^ and High-K Materials for ULSI Gate Dielectrics, edited by H. R. Huff, C. A. Richter, M. L. Green, G. Lucovsky, and T. Hattori
Published: 9/1/1999
Authors: Curt A Richter, Nhan V Nguyen, G A Alers
Abstract: In this paper, we present the results of spectroscopic ellipsometry (SE) studies of Ta^d2^0^d5^ films on Si. Based on these results, we have experimentally determined an effective method for analyzing SE measurements of Ta^d2^0^d5^. A set of CVD-gro ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=10687

152. Ultrathin SiO^d2^ and High-K Materials for ULSI Gate Dielectrics
Published: 9/1/1999
Authors: H. R. Huff, Curt A Richter, M. L. Green, G. Lucovsky, T. Hattori
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=7328

153. preface to Ultrathin SiO^d2^ and High-K Materials for ULSI Gate Dielectrics, edited by H. R. Huff, C. A. Richter, M. L. Green, G. Lucovsky, and T. Hattori
Published: 9/1/1999
Authors: H. R. Huff, Curt A Richter, M. L. Green, G. Lucovsky, T. Hattori
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=20549

154. The Future of Gate Dielectrics Considered
Published: 7/1/1999
Author: Curt A Richter
Abstract: Symposium R, Ultrathin SiO^d2^ and High-K Materials for ULSI Gate Dielectrics, provided a large (20 invited speakers and more than 100 total presentations) and exciting overviews of many possible solutions for technologically critical issues associat ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=3728

155. Preface to Materials Research Society 1999 Proceedings
Published: 4/5/1999
Authors: H. R. Huff, Curt A Richter, M. L. Green, G. Lucovsky
Abstract: This Materials research society Proceedings contains 81 papers presented at the Ultrathin SiO^d2^ and High-K Materials for gate Dielectrics Symposium, held April 5-9, 1999, in San Francisco. The symposium was truly international with 34 of the 81 pub ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=30164

156. Neutron Reflectometry, X-Ray Reflectometry, and Spectroscopic Ellipsometry Characterization of Thin SiO^d2^ on Si
Published: 10/12/1998
Authors: Joseph A. Dura, Curt A Richter, Charles F Majkrzak, Nhan V Nguyen
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=16777

157. Characterization of Thin SiO^d2^ on Si by Spectroscopic Ellipsometry, Neutron Reflectometry, and X-Ray Reflectometry
Published: 7/1/1998
Authors: Curt A Richter, Nhan V Nguyen, Joseph A. Dura, Charles F Majkrzak
Abstract: We compare the results of neutron reflectometry, x-ray reflectometry, and spectroscopic ellipsometry measurements of a thin oxide film (=10 nm). These methods, which arise from three physically different scattering mechanisms, each determine physic ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=9343

158. Thickness Determination of Ultra-Thin SiO^d2^ Films on Si by Spectroscopic Ellipsometry
Published: 12/31/1997
Authors: Nhan V Nguyen, Curt A Richter
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=835

159. X-Ray Reflectivity of Interface Roughness Correlated with Transport Properties of (AlGa)As/GaAs High Electron Mobility Transistor Devices
Published: 8/19/1996
Authors: Joseph A. Dura, Joseph G. Pellegrino, Curt A Richter
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=9288

160. Quantum Conductance Fluctuations in a New Size-Scale Regime
Published: 5/5/1996
Authors: Curt A Richter, David G Seiler, Joseph G. Pellegrino
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=4443



Search NIST-wide:


(Search abstract and keywords)


Last Name:
First Name:







Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series