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Author: thomas renegar

Displaying records 21 to 30 of 37 records.
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21. Correlation of Topography Measurements of NIST SRM 2460 Standard Bullets by Four Techniques
Published: 1/1/2006
Authors: Jun-Feng Song, Theodore Vincent Vorburger, Thomas B Renegar, Hyug-Gyo Rhee, A Zheng, L Ma, John M Libert, Susan M Ballou, B Bachrach, K Bogart
Abstract: Three optical instruments including an interferometric microscope, a Nipkow disk confocal microscope and a laser scanning confocal microscope are used for the measurements of bullet profile signatures of a NIST (National Institute of Standards and Te ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=823187

22. Correlation of Topography Measurements of NIST SRM 2460 Standard Bullets by Four Techniques
Published: 1/1/2006
Authors: Jun-Feng Song, Theodore Vincent Vorburger, Thomas B Renegar, Xiaoyu A Zheng, Hyug-Gyo Rhee, John M Libert, Li Ma, K Bogart, Susan M Ballou, B Bachrach
Abstract: Three optical instruments including an interferometric microscope, a Nipkow disk confocal microscope and a laser scanning confocal microscope are used for the measurements of bullet profile signatures of a National Institute of Standards and Technolo ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=822359

23. International Comparison of Surface Roughness and Step Height (Depth) Standards, SIM 4.8
Published: 1/1/2006
Authors: K Doytchinov, F Kornblit, C Colin Castellanos, J C Oliveira, Thomas B Renegar, Theodore Vincent Vorburger
Abstract: Calibration services of 5 countries from the SIM region are compared through measurements of surface roughness and step height standards.  A surface roughness standard with a nominal Ra value of 0.2 mm, a surface roughness standard with a nomina ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=823180

24. Internet-Based Surface Metrology Algorithm Testing System
Published: 1/1/2005
Authors: Mark C Malburg, Jayaraman Raja, Son H. Bui, Thomas B Renegar, Bui Son Brian, Theodore Vincent Vorburger
Abstract: Software is an integral part of most measurement systems and it is particularly important in roughness measurement and analysis. Evaluation and assessment of measured roughness profiles must be performed in accordance with standards. Different types ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=822238

25. Internet-Based Surface Metrology Algorithm Testing System
Published: 12/1/2004
Authors: Son H. Bui, Thomas B Renegar, Theodore Vincent Vorburger, Jayaraman Raja, Mark C Malburg
Abstract: This paper presents the development of an Internet-based surface metrology algorithm testing system. The system includes peer-reviewed surface analysis tools and a surface texture specimen database for parameter evaluation and algorithm verification. ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=822143

26. Virtual Surface Calibration and Computational Uncertainty
Published: 10/1/2004
Authors: Son H. Bui, Theodore Vincent Vorburger, Thomas B Renegar
Abstract: This paper presents the development of a virtual surface calibration database for parameter evaluation and algorithm verification. The database runs from a web site at the National Institute of Standards and Technology (NIST), USA. Companies, univers ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=823170

27. Virtual Surface Calibration Database
Published: 1/1/2004
Authors: Thomas B Renegar, Theodore Vincent Vorburger, Son H. Bui
Abstract: This paper presents the development of a virtual surface calibration database for parameter evaluation and algorithm verification. The database runs from a web site at the National Institute of Standards and Technology (NIST), USA. Companies, univers ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=822149

28. NISURF-II, An Upgraded Surface Measuring Facility
Published: 9/1/2001
Authors: S Z Zahwi, M F Koura, Thomas B Renegar, A M Mekawi
Abstract: During 1982-1985, a cooperative project was made between the National Bureau of Standards (NBS) at that time (now National Institute of Standards and Technology (NIST - USA)) and the National Institute for Standards (NIS - Egypt) to establish a compu ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=821739

29. Atomic Level Surface Metrology
Published: 1/1/2001
Authors: Theodore Vincent Vorburger, Ronald G Dixson, Jun-Feng Song, Thomas B Renegar, Joseph Fu, Ndubuisi George Orji, V W. Tsai, E. C. Williams, H Edwards, D Cook, P West, R Nyffenegger
Abstract: MotivationSemiconductor wafers and many types of optical elementsrequire ultra-smooth surfaces in order to functionas specifiedExamples:Laser gyro mirrors with rms roughness ~ 0.1 nmSilicon gate oxides with thickness ~ 3 nm,rms roughness must be sign ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=823146

30. Dimensional Metrology of Millimeter- and Sub-millimeter-scale Components
Published: 10/1/2000
Authors: Theodore Vincent Vorburger, Jun-Feng Song, Joseph Fu, M Tundermann, Thomas B Renegar, Theodore D Doiron, N G Orji
Abstract: Decreasing sizes and tolerances of engineering components bring a demand for decreasing uncertainty in the dimensional measurements of these parts. Hence there is increasing need for measuring machines capable of performing dimensional and geometrica ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820999



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