NIST logo

Publications Portal

You searched on:
Author: bruce ravel
Sorted by: title

Displaying records 1 to 10 of 20 records.
Resort by: Date / Title


1. Bromination of marine particulate organic matter through oxidative mechanisms
Published: 9/14/2014
Authors: Bruce D Ravel, Alessandra C Leri, Kathleen Thornton, Lawrence M Mayer
Abstract: Although bromine is considered conservative in seawater, it exhibits a well established correlation with organic carbon in marine sediments. This carbon-bromine association was recently attributed to covalent bonding, with organobromine in sinking pa ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=915663

2. Combined EXAFS and First-Principles Theory Study of Pb^d1-x^Ge^dx^Te
Published: 12/1/1999
Authors: Bruce D Ravel, Eric J Cockayne, E Newville, K M Rabe
Abstract: The narrow band-gap semiconductor Pb^d1-x^Ge^dx^Te has a low-temperature ferroelectric rhombohedral phase whose average structure is a distorted rocksalt structure. We have measured the Extended X-Ray-Absorption Fine-Structure (EXAFS) spectra of Pb^ ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=850304

3. Condensed Matter Astrophysics A Prescription for Determining the Species-Specific Composition and Quantity of Interstellar Dust using X-rays
Published: 9/10/2009
Authors: Bruce D Ravel, Julia C. Lee, Jingen Xiang, Jeffrey Kortright, Kathryn Flanagan
Abstract: We present a new technique for determining the quantity and composition of dust in astrophysical environments using < 6 keV X-rays. We argue that high resolution X-ray spectra as enabled by the Chandra and XMM-Newton gratings should be considered ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=903572

4. Diamond Sensors and Polycapillary Lenses for X-ray Absorption Spectroscopy
Published: 10/13/2013
Author: Bruce D Ravel
Abstract: Diamond sensors are evaluated as incident beam monitors for X-ray Absorption Spectroscopy experiments. These single crystal devices pose a challenge for an energyscanning experiment using hard X-rays due to the e ect of diffraction from the crystalli ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913887

5. Diffraction Anomalous Fine Structure Study of Strained GA^d1-x^In^dx^As on GaAs(001)
Published: 8/20/1998
Authors: Joseph C Woicik, J O Cross, Charles E. Bouldin, Bruce D Ravel, J G Pellegrino, B W Steiner, S G Bompadre, L B Sorensen, K E Miyano, J P Kirkland
Abstract: Diffraction anomalous fine-structure measurements performed at both the Ga and As K edges have determined the Ga-As bond length to be 2.442 {+ or -} 0.005 {Angstrom} in a buried, 213 {Angstrom} thick Ga^0.78^In^d0.22^As layer grown coherently on GaAs ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=850225

6. EXAFS Studies of Catalytic DNA Sensors for Mercury Contamination of Water
Published: 12/11/2009
Authors: Bruce D Ravel, S.C. Slimmer, X. Meng, G.C.L. Wong, Y. Lu
Abstract: Monitoring of metallic contaminants in domestic and agricultural water systems systems requires technology that is fast, flexible, sensitive, and selective. Recently, metal sensors based on catalytic DNA have been demonstrated as a practical monitor ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=854469

7. Identification of Materials in Integrated Circuit Interconnects Using X-Ray Absorption Near Edge Spectroscopy
Published: 1/1/1999
Authors: Zachary H Levine, Bruce D Ravel
Abstract: Most integrated circuit interconnects are principally composed of a few metals, including aluminum alloyed with copper, tungsten, titanium, A1^d3^ Ti, and A1^d2^Cu, in a silica matrix. Integrated circuit interconnects have recently been proposed as ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=840009

8. National Synchrotron Light Source II: Long Islands state-of-the-art X-ray microscope
Published: 5/20/2014
Authors: Bruce D Ravel, Scott Calvin, Linnea Russell
Abstract: This is an education and outreach effort that we have undertaken for the benefit of the Photon Sciences Users' Executive Committee. The UEC is the group that represents the user of the National Synchrotron Light Source, which is currently in its fina ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=915664

9. Pentavalent Uranium Oxide via Reduction of [UO^d2^]^u2+^ Under Hydrothermal Reaction Conditions
Published: 5/23/2008
Authors: Nebebech Belai, Mark Frisch, Eugene Ilton, Bruce D Ravel, Christopher Cahill
Abstract: The synthesis, crystal structure and spectroscopic characterization of [UV(H2O)2(UVIO2)2O4(OH)](H2O)4, a mixed-valent UV/UVI oxide material, are reported. The hydrothermal reaction of UO22+ with Zn and hydrazine at 120 °C for three days yields 1 in t ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=854092

10. Precise Determination of the Energy-Dependent X-Ray Diffraction Phases and the Site-Specific Short-Range Order in Yba^d2^Cu^d3^O^d6.8^ Using DAFS
Published: Date unknown
Authors: Charles E. Bouldin, H Stragier, Bruce D Ravel, L B Sorensen
Abstract: We have used a self-comsistent Kramers-Kr nig analysis of the diffraction anomalous fine structure (DAFS) signals to precisely determine the phase of a series of (00L) Bragg reflections in Yba^d2^Cu^d3^O^d6.8^. Our method is a new solution to the cr ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=850212



Search NIST-wide:


(Search abstract and keywords)


Last Name:
First Name:







Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series