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Author: bruce ravel

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11. Combined EXAFS and First-Principles Theory Study of Pb^d1-x^Ge^dx^Te
Published: 12/1/1999
Authors: Bruce D Ravel, Eric J Cockayne, E Newville, K M Rabe
Abstract: The narrow band-gap semiconductor Pb^d1-x^Ge^dx^Te has a low-temperature ferroelectric rhombohedral phase whose average structure is a distorted rocksalt structure. We have measured the Extended X-Ray-Absorption Fine-Structure (EXAFS) spectra of Pb^ ...

12. X-Ray-Absorption Edge Separation Using Diffraction Anomalous Fine-Structure
Published: 7/1/1999
Authors: Bruce D Ravel, Charles E. Bouldin, H Renevier, J -L Hodeau, J -F Berar
Abstract: When two or more absorption edges in a material are sufficiently close in energy, Extended X-ray-Absorption Fine-Structure (EXAFS) spectroscopy may be of limited utility as the usable data range above the lower energy edge is truncated by the presenc ...

13. The Local Structure of Ferroelectric Pb^d1-x^Ge^dx^Te
Published: 5/1/1999
Authors: Bruce D Ravel, Eric J Cockayne, K M Rabe
Abstract: The narrow band-gap semiconductor Pb_{1-x}Ge_xTe has a low-temperature ferroelectric rhombohedral phase whose average structure is a distorted rock salt structure. We have measured the Extended X-ray-Absorption Fine-Structure spectra of Pb_{1-x}Ge_x ...

14. Identification of Materials in Integrated Circuit Interconnects Using X-Ray Absorption Near Edge Spectroscopy
Published: 1/1/1999
Authors: Zachary H Levine, Bruce D Ravel
Abstract: Most integrated circuit interconnects are principally composed of a few metals, including aluminum alloyed with copper, tungsten, titanium, A1^d3^ Ti, and A1^d2^Cu, in a silica matrix. Integrated circuit interconnects have recently been proposed as ...

15. Diffraction Anomalous Fine Structure Study of Strained GA^d1-x^In^dx^As on GaAs(001)
Published: 8/20/1998
Authors: Joseph C Woicik, J O Cross, Charles E. Bouldin, Bruce D Ravel, J G Pellegrino, B W Steiner, S G Bompadre, L B Sorensen, K E Miyano, J P Kirkland
Abstract: Diffraction anomalous fine-structure measurements performed at both the Ga and As K edges have determined the Ga-As bond length to be 2.442 {+ or -} 0.005 {Angstrom} in a buried, 213 {Angstrom} thick Ga^0.78^In^d0.22^As layer grown coherently on GaAs ...

16. Real Space Multiple Scattering Calculation and Interpretation of X-Ray Absorption Near Edge Structure
Published: 1/23/1998
Authors: A L Ankudinov, Bruce D Ravel, J J Rehr, S D Conradson
Abstract: A self-consistent, real space multiple-scattering (RSMS) approach for calculations of x-ray absorption near edge structure (XANES) is presented and implemented in an ab initio code applicable to arbitrary aperiodic or periodic systems. This approach ...

17. Precise Determination of the Energy-Dependent X-Ray Diffraction Phases and the Site-Specific Short-Range Order in Yba^d2^Cu^d3^O^d6.8^ Using DAFS
Published: Date unknown
Authors: Charles E. Bouldin, H Stragier, Bruce D Ravel, L B Sorensen
Abstract: We have used a self-comsistent Kramers-Kr nig analysis of the diffraction anomalous fine structure (DAFS) signals to precisely determine the phase of a series of (00L) Bragg reflections in Yba^d2^Cu^d3^O^d6.8^. Our method is a new solution to the cr ...

18. Stoichiometry and Phase Composition of MOCVD Barium Titanate Films
Published: Date unknown
Authors: Charles E. Bouldin, Joseph C Woicik, Bruce D Ravel, Debra L Kaiser, Mark D Vaudin
Abstract: X-ray absorption fine structure (XAFS), x-ray diffraction (XRD) and x-ray fluorescence (XRF) have been used to study the stoichiometry and phase composition of thin ({approximately equal to} 1 micron) films deposited on MgO substrates. Deposition tem ...

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