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Author: bruce ravel
Displaying records 11 to 14.
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11.
Diffraction Anomalous Fine Structure Study of Strained GA^d1-x^In^dx^As on GaAs(001)
Published: 8/20/1998
Authors: Joseph C Woicik, J O Cross, Charles E. Bouldin, Bruce D Ravel, J G Pellegrino, B W Steiner, S G Bompadre, L B Sorensen, K E Miyano, J P Kirkland
Abstract: Diffraction anomalous fine-structure measurements performed at both the Ga and As K edges have determined the Ga-As bond length to be 2.442 {+ or -} 0.005 {Angstrom} in a buried, 213 {Angstrom} thick Ga^0.78^In^d0.22^As layer grown coherently on GaAs
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http://www.nist.gov/manuscript-publication-search.cfm?pub_id=850225
12.
Real Space Multiple Scattering Calculation and Interpretation of X-Ray Absorption Near Edge Structure
Published: 1/23/1998
Authors: A L Ankudinov, Bruce D Ravel, J J Rehr, S D Conradson
Abstract: A self-consistent, real space multiple-scattering (RSMS) approach for calculations of x-ray absorption near edge structure (XANES) is presented and implemented in an ab initio code applicable to arbitrary aperiodic or periodic systems. This approach
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http://www.nist.gov/manuscript-publication-search.cfm?pub_id=850187
13.
Precise Determination of the Energy-Dependent X-Ray Diffraction Phases and the Site-Specific Short-Range Order in Yba^d2^Cu^d3^O^d6.8^ Using DAFS
Published: Date unknown
Authors: Charles E. Bouldin, H Stragier, Bruce D Ravel, L B Sorensen
Abstract: We have used a self-comsistent Kramers-Kr nig analysis of the diffraction anomalous fine structure (DAFS) signals to precisely determine the phase of a series of (00L) Bragg reflections in Yba^d2^Cu^d3^O^d6.8^. Our method is a new solution to the cr
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http://www.nist.gov/manuscript-publication-search.cfm?pub_id=850212
14.
Stoichiometry and Phase Composition of MOCVD Barium Titanate Films
Published: Date unknown
Authors: Charles E. Bouldin, Joseph C Woicik, Bruce D Ravel, Debra L Kaiser, Mark D Vaudin
Abstract: X-ray absorption fine structure (XAFS), x-ray diffraction (XRD) and x-ray fluorescence (XRF) have been used to study the stoichiometry and phase composition of thin ({approximately equal to} 1 micron) films deposited on MgO substrates. Deposition tem
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http://www.nist.gov/manuscript-publication-search.cfm?pub_id=850530