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Author: bruce ravel

Displaying records 11 to 20.
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11. Tomography of Integrated Circuit Interconnects
Published: 10/1/2001
Authors: Zachary H Levine, A R Kalukin, M Kuhn, S P Frigo, I McNulty, C C Retsch, Y Wang, Uwe Arp, Thomas B Lucatorto, Bruce D Ravel, Charles S Tarrio
Abstract: 00 Word summary based on the paper:Z. H. Levine, A. R. Kalukin, M. Kuhn, S. P. Frigo, I. McNulty,>C. C. Retsch, Y. Wang, U. Arp, T. B. Lucatorto, B. D. Ravel, and C. Tarrio,>``Microtomography of Integrated Circuit Interconnect with an> Electromigra ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=840113

12. Tomography of Integrated Circuit Interconnect With an Electromigration Void
Published: 5/1/2000
Authors: Zachary H Levine, A R Kalukin, M Kuhn, S P Frigo, I McNulty, C C Retsch, Y Wang, Uwe Arp, Thomas B Lucatorto, Bruce D Ravel, Charles S Tarrio
Abstract: An integrated circuit interconnect was subject to accelerated-life conditions to induce an electromigration void. The silicon substrate was removed, leaving only the interconnect encased test structure encased in silica. We imaged the sample wit ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=840087

13. Combined EXAFS and First-Principles Theory Study of Pb^d1-x^Ge^dx^Te
Published: 12/1/1999
Authors: Bruce D Ravel, Eric J Cockayne, E Newville, K M Rabe
Abstract: The narrow band-gap semiconductor Pb^d1-x^Ge^dx^Te has a low-temperature ferroelectric rhombohedral phase whose average structure is a distorted rocksalt structure. We have measured the Extended X-Ray-Absorption Fine-Structure (EXAFS) spectra of Pb^ ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=850304

14. X-Ray-Absorption Edge Separation Using Diffraction Anomalous Fine-Structure
Published: 7/1/1999
Authors: Bruce D Ravel, Charles E. Bouldin, H Renevier, J -L Hodeau, J -F Berar
Abstract: When two or more absorption edges in a material are sufficiently close in energy, Extended X-ray-Absorption Fine-Structure (EXAFS) spectroscopy may be of limited utility as the usable data range above the lower energy edge is truncated by the presenc ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=850292

15. The Local Structure of Ferroelectric Pb^d1-x^Ge^dx^Te
Published: 5/1/1999
Authors: Bruce D Ravel, Eric J Cockayne, K M Rabe
Abstract: The narrow band-gap semiconductor Pb_{1-x}Ge_xTe has a low-temperature ferroelectric rhombohedral phase whose average structure is a distorted rock salt structure. We have measured the Extended X-ray-Absorption Fine-Structure spectra of Pb_{1-x}Ge_x ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=850297

16. Identification of Materials in Integrated Circuit Interconnects Using X-Ray Absorption Near Edge Spectroscopy
Published: 1/1/1999
Authors: Zachary H Levine, Bruce D Ravel
Abstract: Most integrated circuit interconnects are principally composed of a few metals, including aluminum alloyed with copper, tungsten, titanium, A1^d3^ Ti, and A1^d2^Cu, in a silica matrix. Integrated circuit interconnects have recently been proposed as ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=840009

17. Diffraction Anomalous Fine Structure Study of Strained GA^d1-x^In^dx^As on GaAs(001)
Published: 8/20/1998
Authors: Joseph C Woicik, J O Cross, Charles E. Bouldin, Bruce D Ravel, J G Pellegrino, B W Steiner, S G Bompadre, L B Sorensen, K E Miyano, J P Kirkland
Abstract: Diffraction anomalous fine-structure measurements performed at both the Ga and As K edges have determined the Ga-As bond length to be 2.442 {+ or -} 0.005 {Angstrom} in a buried, 213 {Angstrom} thick Ga^0.78^In^d0.22^As layer grown coherently on GaAs ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=850225

18. Real Space Multiple Scattering Calculation and Interpretation of X-Ray Absorption Near Edge Structure
Published: 1/23/1998
Authors: A L Ankudinov, Bruce D Ravel, J J Rehr, S D Conradson
Abstract: A self-consistent, real space multiple-scattering (RSMS) approach for calculations of x-ray absorption near edge structure (XANES) is presented and implemented in an ab initio code applicable to arbitrary aperiodic or periodic systems. This approach ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=850187

19. Precise Determination of the Energy-Dependent X-Ray Diffraction Phases and the Site-Specific Short-Range Order in Yba^d2^Cu^d3^O^d6.8^ Using DAFS
Published: Date unknown
Authors: Charles E. Bouldin, H Stragier, Bruce D Ravel, L B Sorensen
Abstract: We have used a self-comsistent Kramers-Kr nig analysis of the diffraction anomalous fine structure (DAFS) signals to precisely determine the phase of a series of (00L) Bragg reflections in Yba^d2^Cu^d3^O^d6.8^. Our method is a new solution to the cr ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=850212

20. Stoichiometry and Phase Composition of MOCVD Barium Titanate Films
Published: Date unknown
Authors: Charles E. Bouldin, Joseph C Woicik, Bruce D Ravel, Debra L Kaiser, Mark D Vaudin
Abstract: X-ray absorption fine structure (XAFS), x-ray diffraction (XRD) and x-ray fluorescence (XRF) have been used to study the stoichiometry and phase composition of thin ({approximately equal to} 1 micron) films deposited on MgO substrates. Deposition tem ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=850530



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