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You searched on: Author: jon pratt Sorted by: title

Displaying records 1 to 10 of 92 records.
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1. 2nd Annual Tri-National Workshop on Standards for Nanotechnology - (NIST presentations)
Published: 12/10/2008
Authors: Ronald G Dixson, Jon Robert Pratt, Vincent A Hackley, James Edward Potzick, Richard A Allen, Ndubuisi George Orji, Michael T Postek, Herbert S Bennett, Theodore Vincent Vorburger, Jeffrey A Fagan, Robert L. Watters
Abstract: A new era of cooperation between North American National Measurement Institutes (NMIs) was ushered by the National Research Council of Canada Institute for National Measurement Standards (NRC-INMS) on February 7, 2007 when the first Tri-National wo ...

2. A Fiber-Optic Interferometer with Sub-Picometer Resolution for DC and Low-Frequency Displacement Measurement
Published: 3/13/2009
Authors: Douglas T Smith, Jon Robert Pratt, L Howard
Abstract: We have developed a fiber-optic interferometer optimized for best performance in the frequency range from DC to 1 kHz, with displacement linearity of 1 % over a range of ± 25 nm, and noise-limited resolution of 2 pm. The interferometer uses a tunabl ...

3. A Flexure Balance With Adjustable Restoring Torque for Nanonewton Force Measurement
Published: 1/1/2002
Authors: Jon Robert Pratt, David B Newell, John A Kramar
Abstract: The NIST electrostatic force balance compares mechanical probe forces to an SI realization of force derived from measurements of the capacitance gradient and voltage in an electronic null balance. As we approach the nanonewton regime, the finite stif ...

4. A Measurement System for Characterizing the Detection Performance of Metal Detectors: Design and Operation
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 6530
Published: 6/1/2000
Authors: Nicholas G Paulter Jr., Donald R Larson, Jon Robert Pratt
Abstract: A measurement system for evaluating the performance of hand-held (HH) and walk-through (WT) metal detectors is described. These detectors produce time-varying magnetic fields that interact with objects comprised of electrically conductive and/or mag ...

5. A New Microdevice for SI-Traceable Forces in Atomic Force Microscopy
Published: 6/2/2008
Authors: Gregory W Vogl, Jason John Gorman, Gordon Allan Shaw, Jon Robert Pratt
Abstract: A new self-excited micro-oscillator is proposed as a velocity standard for dissemination of nanoNewton-level forces that are traceable to the International System of Units (SI). The microfabricated oscillator is top-coated with magnetic thin films an ...

6. A New Oscillator for SI-Traceable Measurements in Atomic Force Microscopy
Published: 5/29/2008
Authors: Gregory W Vogl, Jason John Gorman, Gordon Allan Shaw, Jon Robert Pratt
Abstract: See attached

7. A New Oscillator for SI-Traceable Measurements in Atomic Force Microscopy
Published: 6/1/2008
Authors: Gregory W Vogl, Jason John Gorman, Gordon Allan Shaw, Jon Robert Pratt
Abstract: See attached.

8. A New Stable Speed Test Apparatus for Milling
Published: 5/1/2001
Authors: J P Snyder, Jon Robert Pratt, Matthew A. Davies, S J Smith
Abstract: This paper describes a new device that uses a non-contact force actuator in conjunction with spindle rotation to produce an impulsive periodic driving force on the tool at the tooth passing frequency. Measurements are made of the applied and of the ...

9. A Piezoresistive Cantilever Force Sensor for Direct AFM Force Calibration
Published: 4/8/2007
Authors: Jon Robert Pratt, John A Kramar, Gordon Allan Shaw, Douglas T Smith, John M Moreland
Abstract: We describe the design, fabrication, and calibration testing of a new piezoresistive cantilever force sensor suitable for the force calibration of atomic force microscopes in a range between tens of nanonewtons to hundreds of micronewtons. The sens ...

10. A Platform for Observing the Behavior of AFM Cantilevers During Quasi-Static Loading
Published: 10/19/2008
Authors: Jon Robert Pratt, Lee M. Kumanchik, Tony L. Schmitz
Abstract: This paper describes a platform for studying the bending behavior of ultra-compliant (stiffness less than 1 N/m) atomic force microscope (AFM) cantilevers. The fundamental issue is that a cantilever does not represent an ideal design for precision fo ...

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  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
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  • SP 823-XX: Integrated Services Digital Network Series