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Author: jon pratt

Displaying records 31 to 40 of 82 records.
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31. Direct  Electrostatic Calibration of Hybrid Sensors for Small Force Measurement
Published: 6/4/2007
Authors: Koo-Hyun Chung, Gordon Allan Shaw, Jon Robert Pratt
Abstract: The measurement of forces from piconewtons to millinewtons is an area of interest from both an applied and pure research standpoint, however creating a link between small forces and the International System of Units (SI) has been difficult. In this w ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=822725

32. Traceable Micro-Force Sensor for Instrumented Indentation Calibration
Published: 4/10/2007
Authors: Douglas T Smith, Gordon Allan Shaw, R M Seugling, D Xiang, Jon Robert Pratt
Abstract: Instrumented indentation testing (IIT), commonly referred to as nanoindentation when small forces are used, is a popular technique for determining the mechanical properties of small volumes of material. Sample preparation is relatively easy, usuall ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=824624

33. A Piezoresistive Cantilever Force Sensor for Direct AFM Force Calibration
Published: 4/8/2007
Authors: Jon Robert Pratt, John A Kramar, Gordon Allan Shaw, Douglas T Smith, John M Moreland
Abstract: We describe the design, fabrication, and calibration testing of a new piezoresistive cantilever force sensor suitable for the force calibration of atomic force microscopes in a range between tens of nanonewtons to hundreds of micronewtons. The sens ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=822731

34. Traceable Micro-Force Calibration for Instrumented Indentation Testing
Published: 2/13/2007
Authors: Douglas T Smith, Gordon Allan Shaw, Richard Seugling, Jon Robert Pratt, Dan Xiang
Abstract: We describe the development, performance and application of an accurate SI-traceable force calibration and verification system for potential use in the field calibration of commercial instrumented indentation testing (IIT) instruments. The system co ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=854482

35. Prototype Cantilevers for SI Traceable NanoNewton Force Calibration
Published: 9/20/2006
Authors: Richard Swift Gates, Jon Robert Pratt
Abstract: A series of extremely uniform prototype reference cantilevers has been created that can be used to calibrate the spring constants of atomic force microscope (AFM) cantilevers and other micromechanical structures. By utilizing optimal combinations of ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=822599

36. Prototype Cantilevers for SI-Traceable NanoNewton Force Calibration
Published: 9/20/2006
Authors: Richard Swift Gates, Jon Robert Pratt
Abstract: A series of extremely uniform prototype reference cantilevers have been created that can be used to calibrate the spring constants of atomic force microscope (AFM) cantilevers and other micromechanical structures. By utilizing optimal combinations o ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=850947

37. SI-Traceable Spring Constant Calibration of Microfabricated Cantilevers for Small Force Measurement
Published: 9/14/2006
Authors: Gordon Allan Shaw, John A Kramar, Jon Robert Pratt
Abstract: A variety of methods exist to measure the stiffness of microfabricated cantilever beams such as those used as mechanical sensors in atomic force microscopy (AFM). In order for AFM to be used as a quantitative small force measurement tool, these meth ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=822356

38. New reference standards and artifacts for nanoscale physical property characterization
Published: 7/1/2006
Authors: Jon Robert Pratt, John A Kramar, Gordon Shaw, Richard Gates, Paul Rice, John M Moreland
Abstract: This paper provides an overview of calibration artifacts being developed at the National Institute of Standards and Technology (NIST) that are intended to aid the accurate determination of nanoscale physical properties across a broad range of applica ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=32411

39. Calibration of Microfabricated Cantilevers for SI-Traceable Small Force Measurement
Published: 1/1/2006
Authors: Gordon Allan Shaw, Jon Robert Pratt, John A Kramar
Abstract: A procedure is described by which the spring constant of a microfabricated cantilever beam can be calibrated for the measurement of small forces in an atomic force microscope (AFM) or other device. The procedure utilizes dynamic force instrumented i ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=821950

40. Force Calibration Via Electrostatics
Published: 1/1/2006
Authors: Jon Robert Pratt, John A Kramar, Gordon Allan Shaw, Lee Kumanchik
Abstract: We describe the electrical and length measurements necessary to realize micronewton forces in a fashion consistent with the International System of Units (SI). We first discuss instrumentation and procedures required to accurately characterize an el ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=822547



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