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You searched on: Author: jon pratt

Displaying records 31 to 40 of 83 records.
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31. Spring constant calibration of AFM cantilevers with a piezoresistive cantilever transfer standard
Published: 9/24/2007
Authors: Eric Langlois, G. A. Shaw, J. A. Kramar, Jon Robert Pratt, Donna C. Hurley
Abstract: We describe a method to calibrate the spring constants of cantilevers used in atomic force microscopy (AFM) by means of a piezoresistive cantilever. Before use, the piezoresistive cantilever was calibrated with an absolute force standard, the NIST el ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=50568

32. Spring constant calibration of AFM cantilevers with a piezosensor transfer standard
Published: 9/24/2007
Authors: Eric Langlois, Gordon Allan Shaw, John A Kramar, Jon Robert Pratt, Donna C. Hurley
Abstract: We describe a method to calibrate the spring constants of cantilevers for atomic force microscopy (AFM). The method makes use of a piezosensor comprised of a piezoresistive cantilever and  accompanying electronics. The piezosensor was calibrated ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=824626

33. Direct  Electrostatic Calibration of Hybrid Sensors for Small Force Measurement
Published: 6/4/2007
Authors: Koo-Hyun Chung, Gordon Allan Shaw, Jon Robert Pratt
Abstract: The measurement of forces from piconewtons to millinewtons is an area of interest from both an applied and pure research standpoint, however creating a link between small forces and the International System of Units (SI) has been difficult. In this w ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=822725

34. Traceable Micro-Force Sensor for Instrumented Indentation Calibration
Published: 4/10/2007
Authors: Douglas T Smith, Gordon Allan Shaw, R M Seugling, D Xiang, Jon Robert Pratt
Abstract: Instrumented indentation testing (IIT), commonly referred to as nanoindentation when small forces are used, is a popular technique for determining the mechanical properties of small volumes of material. Sample preparation is relatively easy, usuall ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=824624

35. A Piezoresistive Cantilever Force Sensor for Direct AFM Force Calibration
Published: 4/8/2007
Authors: Jon Robert Pratt, John A Kramar, Gordon Allan Shaw, Douglas T Smith, John M Moreland
Abstract: We describe the design, fabrication, and calibration testing of a new piezoresistive cantilever force sensor suitable for the force calibration of atomic force microscopes in a range between tens of nanonewtons to hundreds of micronewtons. The sens ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=822731

36. Traceable Micro-Force Calibration for Instrumented Indentation Testing
Published: 2/13/2007
Authors: Douglas T Smith, Gordon Allan Shaw, Richard Seugling, Jon Robert Pratt, Dan Xiang
Abstract: We describe the development, performance and application of an accurate SI-traceable force calibration and verification system for potential use in the field calibration of commercial instrumented indentation testing (IIT) instruments. The system co ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=854482

37. Prototype Cantilevers for SI Traceable NanoNewton Force Calibration
Published: 9/20/2006
Authors: Richard Swift Gates, Jon Robert Pratt
Abstract: A series of extremely uniform prototype reference cantilevers has been created that can be used to calibrate the spring constants of atomic force microscope (AFM) cantilevers and other micromechanical structures. By utilizing optimal combinations of ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=822599

38. Prototype Cantilevers for SI-Traceable NanoNewton Force Calibration
Published: 9/20/2006
Authors: Richard Swift Gates, Jon Robert Pratt
Abstract: A series of extremely uniform prototype reference cantilevers have been created that can be used to calibrate the spring constants of atomic force microscope (AFM) cantilevers and other micromechanical structures. By utilizing optimal combinations o ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=850947

39. SI-Traceable Spring Constant Calibration of Microfabricated Cantilevers for Small Force Measurement
Published: 9/14/2006
Authors: Gordon Allan Shaw, John A Kramar, Jon Robert Pratt
Abstract: A variety of methods exist to measure the stiffness of microfabricated cantilever beams such as those used as mechanical sensors in atomic force microscopy (AFM). In order for AFM to be used as a quantitative small force measurement tool, these meth ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=822356

40. New reference standards and artifacts for nanoscale physical property characterization
Published: 7/1/2006
Authors: Jon Robert Pratt, John A Kramar, Gordon Shaw, Richard Gates, Paul Rice, John M Moreland
Abstract: This paper provides an overview of calibration artifacts being developed at the National Institute of Standards and Technology (NIST) that are intended to aid the accurate determination of nanoscale physical properties across a broad range of applica ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=32411



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