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You searched on: Author: jon pratt

Displaying records 31 to 40 of 87 records.
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31. A New Microdevice for SI-Traceable Forces in Atomic Force Microscopy
Published: 6/2/2008
Authors: Gregory W Vogl, Jason John Gorman, Gordon Allan Shaw, Jon Robert Pratt
Abstract: A new self-excited micro-oscillator is proposed as a velocity standard for dissemination of nanoNewton-level forces that are traceable to the International System of Units (SI). The microfabricated oscillator is top-coated with magnetic thin films an ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=824627

32. A New Oscillator for SI-Traceable Measurements in Atomic Force Microscopy
Published: 6/1/2008
Authors: Gregory W Vogl, Jason John Gorman, Gordon Allan Shaw, Jon Robert Pratt
Abstract: See attached.
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=824441

33. A New Oscillator for SI-Traceable Measurements in Atomic Force Microscopy
Published: 5/29/2008
Authors: Gregory W Vogl, Jason John Gorman, Gordon Allan Shaw, Jon Robert Pratt
Abstract: See attached
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=824439

34. Spring constant calibration of AFM cantilevers with a piezoresistive cantilever transfer standard
Published: 9/24/2007
Authors: Eric Langlois, G. A. Shaw, J. A. Kramar, Jon Robert Pratt, Donna C. Hurley
Abstract: We describe a method to calibrate the spring constants of cantilevers used in atomic force microscopy (AFM) by means of a piezoresistive cantilever. Before use, the piezoresistive cantilever was calibrated with an absolute force standard, the NIST el ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=50568

35. Spring constant calibration of AFM cantilevers with a piezosensor transfer standard
Published: 9/24/2007
Authors: Eric Langlois, Gordon Allan Shaw, John A Kramar, Jon Robert Pratt, Donna C. Hurley
Abstract: We describe a method to calibrate the spring constants of cantilevers for atomic force microscopy (AFM). The method makes use of a piezosensor comprised of a piezoresistive cantilever and  accompanying electronics. The piezosensor was calibrated ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=824626

36. Direct  Electrostatic Calibration of Hybrid Sensors for Small Force Measurement
Published: 6/4/2007
Authors: Koo-Hyun Chung, Gordon Allan Shaw, Jon Robert Pratt
Abstract: The measurement of forces from piconewtons to millinewtons is an area of interest from both an applied and pure research standpoint, however creating a link between small forces and the International System of Units (SI) has been difficult. In this w ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=822725

37. Traceable Micro-Force Sensor for Instrumented Indentation Calibration
Published: 4/10/2007
Authors: Douglas T Smith, Gordon Allan Shaw, R M Seugling, D Xiang, Jon Robert Pratt
Abstract: Instrumented indentation testing (IIT), commonly referred to as nanoindentation when small forces are used, is a popular technique for determining the mechanical properties of small volumes of material. Sample preparation is relatively easy, usuall ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=824624

38. A Piezoresistive Cantilever Force Sensor for Direct AFM Force Calibration
Published: 4/8/2007
Authors: Jon Robert Pratt, John A Kramar, Gordon Allan Shaw, Douglas T Smith, John M Moreland
Abstract: We describe the design, fabrication, and calibration testing of a new piezoresistive cantilever force sensor suitable for the force calibration of atomic force microscopes in a range between tens of nanonewtons to hundreds of micronewtons. The sens ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=822731

39. Traceable Micro-Force Calibration for Instrumented Indentation Testing
Published: 2/13/2007
Authors: Douglas T Smith, Gordon Allan Shaw, Richard Seugling, Jon Robert Pratt, Dan Xiang
Abstract: We describe the development, performance and application of an accurate SI-traceable force calibration and verification system for potential use in the field calibration of commercial instrumented indentation testing (IIT) instruments. The system co ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=854482

40. Prototype Cantilevers for SI Traceable NanoNewton Force Calibration
Published: 9/20/2006
Authors: Richard Swift Gates, Jon Robert Pratt
Abstract: A series of extremely uniform prototype reference cantilevers has been created that can be used to calibrate the spring constants of atomic force microscope (AFM) cantilevers and other micromechanical structures. By utilizing optimal combinations of ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=822599



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