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You searched on: Author: jon pratt

Displaying records 21 to 30 of 83 records.
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21. Accurate Picometers for DC and Low-Frequency Displacement Measurement
Published: 4/6/2009
Authors: Jon Robert Pratt, Douglas T Smith, Lowell Howard
Abstract: We have developed a fiber-optic interferometer optimized for best performance in the frequency range from DC to 1 kHz, with displacement linearity of 1 % over a range of 25 nm, and noise-limited resolution of 2 pm [1]. The interferometer uses a tun ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902317

22. A Fiber-Optic Interferometer with Sub-Picometer Resolution for DC and Low-Frequency Displacement Measurement
Published: 3/13/2009
Authors: Douglas T Smith, Jon Robert Pratt, L Howard
Abstract: We have developed a fiber-optic interferometer optimized for best performance in the frequency range from DC to 1 kHz, with displacement linearity of 1 % over a range of ± 25 nm, and noise-limited resolution of 2 pm. The interferometer uses a tunabl ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=854438

23. 2nd Annual Tri-National Workshop on Standards for Nanotechnology - (NIST presentations)
Published: 12/10/2008
Authors: Ronald G Dixson, Jon Robert Pratt, Vincent A Hackley, James Edward Potzick, Richard A Allen, Ndubuisi George Orji, Michael T Postek, Herbert S Bennett, Theodore Vincent Vorburger, Jeffrey A Fagan, Robert L. Watters
Abstract: A new era of cooperation between North American National Measurement Institutes (NMIs) was ushered by the National Research Council of Canada Institute for National Measurement Standards (NRC-INMS) on February 7, 2007 when the first Tri-National wo ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=824641

24. A Platform for Observing the Behavior of AFM Cantilevers During Quasi-Static Loading
Published: 10/19/2008
Authors: Jon Robert Pratt, Lee M. Kumanchik, Tony L. Schmitz
Abstract: This paper describes a platform for studying the bending behavior of ultra-compliant (stiffness less than 1 N/m) atomic force microscope (AFM) cantilevers. The fundamental issue is that a cantilever does not represent an ideal design for precision fo ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=824719

25. Comparison of NIST SI Force Scale to NPL SI Mass Scale
Published: 10/19/2008
Authors: Christopher W. Jones, John A Kramar, Stuart Davidson, Richard Leach, Jon Robert Pratt
Abstract: Small masses in the 1.0 mg to 0.1 mg range were developed and calibrated at NPL with traceability to the IPK. These masses were transported to NIST at Gaithersburg and used as deadweights on the NIST electrostatic force balance, to facilitate a mass- ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=824727

26. SI traceable calibration of an instrumented indentation sensor spring constant using electrostatic force
Published: 9/22/2008
Authors: Koo-Hyun Chung, Stefan Scholz, Gordon Allan Shaw, John A Kramar, Jon Robert Pratt
Abstract: We present a measurement scheme for creating reference electrostatic forces that are traceable to the International System of Units (SI). This scheme yields references forces suitable for calibrating the force sensitivity of instrumented indentation ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=823024

27. Development of a Self-Excited Oscillator for SI-Traceable Measurements in Atomic Force Microscopy
Published: 8/3/2008
Authors: Gregory W Vogl, Jon Robert Pratt
Abstract: A new self-excited micro-oscillator is proposed as a velocity reference that could aid the dissemination of nanonewton-level forces that are traceable to the International System of Units (SI). An analog control system is developed to keep the actuat ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=824663

28. A New Microdevice for SI-Traceable Forces in Atomic Force Microscopy
Published: 6/2/2008
Authors: Gregory W Vogl, Jason John Gorman, Gordon Allan Shaw, Jon Robert Pratt
Abstract: A new self-excited micro-oscillator is proposed as a velocity standard for dissemination of nanoNewton-level forces that are traceable to the International System of Units (SI). The microfabricated oscillator is top-coated with magnetic thin films an ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=824627

29. A New Oscillator for SI-Traceable Measurements in Atomic Force Microscopy
Published: 6/1/2008
Authors: Gregory W Vogl, Jason John Gorman, Gordon Allan Shaw, Jon Robert Pratt
Abstract: See attached.
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=824441

30. A New Oscillator for SI-Traceable Measurements in Atomic Force Microscopy
Published: 5/29/2008
Authors: Gregory W Vogl, Jason John Gorman, Gordon Allan Shaw, Jon Robert Pratt
Abstract: See attached
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=824439



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