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Author: jon pratt

Displaying records 21 to 30 of 82 records.
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21. 2nd Annual Tri-National Workshop on Standards for Nanotechnology - (NIST presentations)
Published: 12/10/2008
Authors: Ronald G Dixson, Jon Robert Pratt, Vincent A Hackley, James Edward Potzick, Richard A Allen, Ndubuisi George Orji, Michael T Postek, Herbert S Bennett, Theodore Vincent Vorburger, Jeffrey A Fagan, Robert L. Watters
Abstract: A new era of cooperation between North American National Measurement Institutes (NMIs) was ushered by the National Research Council of Canada Institute for National Measurement Standards (NRC-INMS) on February 7, 2007 when the first Tri-National wo ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=824641

22. A Platform for Observing the Behavior of AFM Cantilevers During Quasi-Static Loading
Published: 10/19/2008
Authors: Jon Robert Pratt, Lee M. Kumanchik, Tony L. Schmitz
Abstract: This paper describes a platform for studying the bending behavior of ultra-compliant (stiffness less than 1 N/m) atomic force microscope (AFM) cantilevers. The fundamental issue is that a cantilever does not represent an ideal design for precision fo ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=824719

23. Comparison of NIST SI Force Scale to NPL SI Mass Scale
Published: 10/19/2008
Authors: Christopher W. Jones, John A Kramar, Stuart Davidson, Richard Leach, Jon Robert Pratt
Abstract: Small masses in the 1.0 mg to 0.1 mg range were developed and calibrated at NPL with traceability to the IPK. These masses were transported to NIST at Gaithersburg and used as deadweights on the NIST electrostatic force balance, to facilitate a mass- ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=824727

24. SI traceable calibration of an instrumented indentation sensor spring constant using electrostatic force
Published: 9/22/2008
Authors: Koo-Hyun Chung, Stefan Scholz, Gordon Allan Shaw, John A Kramar, Jon Robert Pratt
Abstract: We present a measurement scheme for creating reference electrostatic forces that are traceable to the International System of Units (SI). This scheme yields references forces suitable for calibrating the force sensitivity of instrumented indentation ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=823024

25. Development of a Self-Excited Oscillator for SI-Traceable Measurements in Atomic Force Microscopy
Published: 8/3/2008
Authors: Gregory W Vogl, Jon Robert Pratt
Abstract: A new self-excited micro-oscillator is proposed as a velocity reference that could aid the dissemination of nanonewton-level forces that are traceable to the International System of Units (SI). An analog control system is developed to keep the actuat ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=824663

26. A New Microdevice for SI-Traceable Forces in Atomic Force Microscopy
Published: 6/2/2008
Authors: Gregory W Vogl, Jason John Gorman, Gordon Allan Shaw, Jon Robert Pratt
Abstract: A new self-excited micro-oscillator is proposed as a velocity standard for dissemination of nanoNewton-level forces that are traceable to the International System of Units (SI). The microfabricated oscillator is top-coated with magnetic thin films an ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=824627

27. A New Oscillator for SI-Traceable Measurements in Atomic Force Microscopy
Published: 6/1/2008
Authors: Gregory W Vogl, Jason John Gorman, Gordon Allan Shaw, Jon Robert Pratt
Abstract: See attached.
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=824441

28. A New Oscillator for SI-Traceable Measurements in Atomic Force Microscopy
Published: 5/29/2008
Authors: Gregory W Vogl, Jason John Gorman, Gordon Allan Shaw, Jon Robert Pratt
Abstract: See attached
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=824439

29. Spring constant calibration of AFM cantilevers with a piezoresistive cantilever transfer standard
Published: 9/24/2007
Authors: Eric Langlois, G. A. Shaw, J. A. Kramar, Jon Robert Pratt, Donna C. Hurley
Abstract: We describe a method to calibrate the spring constants of cantilevers used in atomic force microscopy (AFM) by means of a piezoresistive cantilever. Before use, the piezoresistive cantilever was calibrated with an absolute force standard, the NIST el ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=50568

30. Spring constant calibration of AFM cantilevers with a piezosensor transfer standard
Published: 9/24/2007
Authors: Eric Langlois, Gordon Allan Shaw, John A Kramar, Jon Robert Pratt, Donna C. Hurley
Abstract: We describe a method to calibrate the spring constants of cantilevers for atomic force microscopy (AFM). The method makes use of a piezosensor comprised of a piezoresistive cantilever and  accompanying electronics. The piezosensor was calibrated ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=824626



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