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You searched on: Author: michael postek

Displaying records 221 to 230 of 231 records.
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221. A Lithographic SEM Magnification Standard
Published: 12/1/1988
Authors: Michael T Postek, R. C. Tiberio
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=100

222. Low Accelerating Voltage Pitch Standard Based on the Modification of NBS SRM 484
Series: NIST Interagency/Internal Report (NISTIR)
Published: 12/31/1987
Author: Michael T Postek
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=15586

223. Non-Destructive Submicron Dimensional Metrology Using the Scanning Electron Microscope
Published: 12/31/1987
Author: Michael T Postek
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=5875

224. Resolution and Measurement in the Scanning Electron Microscope
Published: 12/31/1987
Author: Michael T Postek
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=25567

225. Scanning Electron Microscope Linewidth Measurement Standards Programat the National Bureau of Standards
Published: 12/31/1987
Authors: Michael T Postek, Robert D. Larrabee, William J. Keery
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=23904

226. Some Observations on Tool Sharpness and Sub-Surface Damage in Single Point Diamond Turning
Published: 12/31/1987
Authors: C J Evans, R. Polvani, Michael T Postek, R. Rohrer
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=8576

227. Submicrometer Dimensional Metrology in the Scanning Electron Microscope
Published: 12/31/1987
Author: Michael T Postek
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=20595

228. Submicrometer Microelectronics Dimensional Metrology: Scanning Electron Microscopy
Series: Journal of Research (NIST JRES)
Published: 6/30/1987
Author: Michael T Postek
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=9834

229. Electron Detection Modes and Their Relation to Linewidth Measurement in the Scanning Electron Microscope
Published: 12/31/1986
Author: Michael T Postek
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=14904

230. Microelectronics Dimensional Metrology in the Scanning Electron Microscope, Part I
Published: 12/31/1986
Author: Michael T Postek
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=10160



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