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Author: michael postek

Displaying records 221 to 226.
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221. Some Observations on Tool Sharpness and Sub-Surface Damage in Single Point Diamond Turning
Published: 12/31/1987
Authors: C J Evans, R. Polvani, Michael T Postek, R. Rohrer
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=8576

222. Submicrometer Dimensional Metrology in the Scanning Electron Microscope
Published: 12/31/1987
Author: Michael T Postek
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=20595

223. Submicrometer Microelectronics Dimensional Metrology: Scanning Electron Microscopy
Series: Journal of Research (NIST JRES)
Published: 6/30/1987
Author: Michael T Postek
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=9834

224. Electron Detection Modes and Their Relation to Linewidth Measurement in the Scanning Electron Microscope
Published: 12/31/1986
Author: Michael T Postek
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=14904

225. Microelectronics Dimensional Metrology in the Scanning Electron Microscope, Part I
Published: 12/31/1986
Author: Michael T Postek
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=10160

226. Microelectronics Dimensional Metrology in the Scanning Electron Microscope, Part II
Published: 12/31/1986
Authors: Michael T Postek, D. C. Joy
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=15630



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