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Author: michael postek

Displaying records 191 to 200 of 217 records.
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191. Submicrometer Critical Dimensional Metrology
Published: 12/1/1991
Authors: Robert D. Larrabee, Loren W. Linholm, Michael T Postek
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=15444

192. Development of a Low-Profile High-Efficiency Microchannel-Plate Detector System for SEM Imaging and Metrology
Published: 12/31/1990
Authors: Michael T Postek, William J. Keery, Nolan V. Frederick
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=2071

193. Low-Profile Microchannel-Plate Electron Detector System for SEM
Published: 12/31/1990
Authors: Michael T Postek, William J. Keery, Nolan V. Frederick
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=2557

194. Modification of Hydrogen-Passivated Silicon by a Scanning Tunneling Microscope Operating in Air
Published: 12/31/1990
Authors: John A. Dagata, J. Schneir, Howard H. Harary, C J Evans, Michael T Postek, J. Bennett
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=1704

195. Low Accelerating Voltage SEM Imaging and Metrology Using Backscattered Electrons
Published: 12/1/1990
Author: Michael T Postek
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=13038

196. Low-Profile High-Efficiency Microchannel-Plate Detector System for Scanning Electron Microscopy Applications
Published: 6/1/1990
Authors: Michael T Postek, William J. Keery, Nolan V. Frederick
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=3462

197. Inspection of Single-Point Diamond Turning Tools at Low Accelerating Voltage in a Scanning Electron Microscope
Published: 12/31/1989
Authors: Michael T Postek, C J Evans
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=14724

198. Metrological Electron Microscope for the Certification of Magnification and Linewidth Artifacts for the Semiconductor Industry
Published: 12/31/1989
Authors: Michael T Postek, William J. Keery, S. Jones
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=13631

199. Scanning Electron Microscope-Based Metrological Electron Microscope System and New Prototype SEM Magnification Standard
Published: 12/31/1989
Author: Michael T Postek
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=28937

200. Specimen Biasing to Enhance or Suppress Secondary Electron Emission from Charging Specimens at Low Accelerating Voltages
Published: 12/31/1989
Authors: Michael T Postek, William J. Keery, Robert D. Larrabee
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=5505