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You searched on: Author: michael postek

Displaying records 11 to 20 of 235 records.
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11. Documentation for Reference Material (RM) 8820: A Versatile, Multipurpose Dimensional Metrology Calibration Standard for Scanned Particle Beam, Scanned Probe and Optical Microscopy
Series: Special Publication (NIST SP)
Report Number: 1170
Published: 2/3/2014
Authors: Michael T Postek, Andras Vladar, Bin Ming, Bunday Benjamin
Abstract: Reference Material (RM) 8820 is a multipurpose instrument calibration standard available from NIST. This is a dimensional standard initially developed to replace the out of stock RM 8090 used for X and Y scale calibrations of scanned particle beam mi ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=914808

12. Does Your SEM Really Tell the Truth? - How would you know? Part 1
Published: 12/16/2013
Authors: Michael T Postek, Andras Vladar
Abstract: The scanning electron microscope (SEM) has gone through a tremendous evolution to become a critical tool for many and diverse scientific and industrial applications. The high resolution of the SEM is especially suited for both qualitative and quantit ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=912761

13. Does Your SEM Really Tell the Truth? Part 2
Published: 11/1/2013
Authors: Michael T Postek, Andras Vladar, Premsagar Purushotham Kavuri
Abstract: The scanning electron microscope (SEM) has gone through a tremendous evolution to become indispensable for many and diverse scientific and industrial applications. The first paper in this series, discussed some of the issues related to signal generat ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913866

14. Nanomanufacturing Concerns about Measurements made in the SEM II: Specimen Contamination
Published: 11/1/2013
Authors: Michael T Postek, Andras Vladar, Premsagar Purushotham Kavuri
Abstract: The scanning electron microscope (SEM) has gone through a tremendous evolution to become a critical tool for many and diverse scientific and industrial applications. The improvements that have been made have significantly improved the overall SEM per ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=914028

15. Nanomanufacturing concerns about Measurements made in the SEM I: Imaging and its Measurement
Published: 11/1/2013
Authors: Michael T Postek, Andras Vladar
Abstract: The high resolution of the SEM is especially useful for qualitative and quantitative applications for both nanotechnology and nanomanufacturing. But, should users be concerned about the imaging and measurements made with this instrument? Perhaps one ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=914029

16. Production and Applications of Cellulose Nanomaterials
Published: 8/1/2013
Authors: Michael T Postek, Robert J Moon, Alan Rudie, Michael Bilodeau
Abstract: ,Production and Applications of Cellulosic NanomaterialsŠ was intended to help organize and highlight the wide range of research being conducted worldwide on the science and technology of cellulose nanomaterials. The format of this book consists of ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=914189

17. Dimensional Metrology and Imaging of Cellulose Nanocrystals
Published: 6/14/2013
Authors: Michael T Postek, Andras Vladar
Abstract: Cellulose nanocrystals are one group of nanoparticles that have high potential economic value but, also present many basic research and manufacturing challenges. These challenges are not only in development of the fundamental processes needed for the ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=914004

18. Nanoscale Reference Materials for Environmental, Health, and Safety Measurements: Needs, Gaps, and Opportunities
Published: 11/7/2012
Authors: Aleksandr B. Stefaniak, Vincent A Hackley, Gert Roebben, Kensei Ehara, Steve Hankin, Michael T Postek, Iseult Lynch, Wei-En Fu, Thomas P.J. Linsinger, Andreas Th?nemann
Abstract: There is a need to understand and manage potential risks posed to workers, the public, and the environment from exposure to engineered nanomaterials. In response, several organizations have developed lists of relevant nano-objects and of physico-che ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910519

19. Does Your SEM Really Tell the Truth?
Published: 8/1/2012
Authors: Michael T Postek, Andras Vladar
Abstract: The scanning electron microscope (SEM) has gone through a tremendous evolution to become a critical tool for many, diverse scientific and industrial applications. The high resolution of the SEM is especially useful for qualitative and quantitative ap ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910663

20. Microscopy for STEM Educators
Published: 5/21/2012
Authors: Michael T Postek, Mary B Satterfield, Bradley N Damazo, Robert Gordon
Abstract: The future of our nation hinges on our ability to prepare our next generation to be innovators in science, technology, engineering and math (STEM). Excitement for STEM must begin at the earliest stages of our education process. Yet, today far too few ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910648



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Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
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  • SP 823-XX: Integrated Services Digital Network Series