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Author: steven phillips
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Displaying records 1 to 10 of 56 records.
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1. A Careful Consideration of the Calibration Concept
Series: Journal of Research (NIST JRES)
Published: 3/1/2001
Authors: Steven David Phillips, William Tyler Estler, Theodore D Doiron, K Eberhardt, M Levenson
Abstract: This paper is a detailed discussion of the technical aspects of the calibration process with emphasis on the definition of the measurand, the conditions under which the calibration results are valid, and the subsequent use of the calibration results ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=823126

2. A Careful Consideration of the Calibration Concept
Published: 1/1/2001
Authors: Steven David Phillips, William Tyler Estler, Theodore D Doiron, K Eberhardt, M. Levenson
Abstract: This paper is a detailed discussion of the technical aspects of the calibration process with emphasis on the definition of the measurand, the conditions under which the calibration results are valid, and the subsequent use of the calibration results ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=824612

3. A Constrained Monte Carlo Simulation Method for the Calculation of CMM Measurement Uncertainty
Published: 1/1/1999
Authors: Steven David Phillips, Bruce R. Borchardt, Daniel S Sawyer, William Tyler Estler, K Eberhardt, M Levenson, Marjorie A McClain, Ted Hopp
Abstract: We describe a Monte Carlo simulation technique where known information about a metrology system is employed as a constraint to distinguish the errors associated with the instrument under consideration from the set of all possible instrument errors. T ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820941

4. A General Quantitative Method to Validate Instrument Calibration Techniques
Published: 11/1/1999
Author: Steven David Phillips
Abstract: In this paper a method to validate proposed calibration procedures for coordinate measuring machines (CMMs) is presented. Conceptually, the validation procedure is based on a computer generated population of CMMs assumed to include any real CMM that ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820940

5. A Laser Tracker Calibration System
Published: 1/1/2002
Authors: Daniel S Sawyer, Bruce R. Borchardt, Steven David Phillips, Charles Fronczek, William Tyler Estler
Abstract: We describe a laser tracker calibration system developed for frameless coordinate metrology systems. The system employs a laser rail to provide an 'in situ' calibrated length standard that is used to test a tracker in several different configurations ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=821749

6. A Model for Geometry-Dependent Errors in Length Artifacts
Series: Journal of Research (NIST JRES)
Report Number: 117.013
Published: 9/27/2012
Authors: Daniel S Sawyer, Brian Parry, Christopher J Blackburn, Balasubramanian Muralikrishnan, Steven David Phillips
Abstract: We present a detailed model of dimensional changes in long length artifacts, such as step gauges and ball bars, due to bending under gravity. The comprehensive model is based on evaluation of the gauge points relative to the neutral bending surf ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910861

7. A Novel Artifact for Testing Large Coordinate Measuring Machines
Published: 1/1/2000
Authors: Steven David Phillips, Daniel S Sawyer, Bruce R. Borchardt, David E Ward, D E Beutel
Abstract: We present a high accuracy artifact useful for the evaluation of large CMMs. This artifact can be physically probed by the CMM in contrast to conventional techniques that use purely optical methods such as laser interferometers. The system can be use ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820971

8. A Novel Artifact for Testing Large Coordinate Measuring Machines
Published: 1/1/2001
Authors: Steven David Phillips, Daniel S Sawyer, Bruce R. Borchardt, D E Ward, D E Beutel
Abstract: We present a high accuracy artifact useful for the evaluation of large CMMs. This artifact can be physically probed by the CMM in contrast to conventional techniques that use purely optical methods such as laser interferometers. The system can be use ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=824606

9. A Novel CMM Interim Testing Artifact
Published: 1/1/1994
Authors: Steven David Phillips, Bruce R. Borchardt, Gregory W Caskey, David E Ward, Bryon S. Faust, Daniel S Sawyer
Abstract: NIST is currently developing equipment and techniques to rapidly access the performance of Coordinate Measuring machines (CMMs). This will allow the frequent testing of CMMs to insure that they measure parts accurately. A novel interim testing artifa ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820700

10. A Users' Guide to NIST SRM 2084: CMM Probe Performance Standards
Published: 6/1/1994
Authors: Gregory W Caskey, Steven David Phillips, Bruce R. Borchardt, David E Ward, Daniel S Sawyer
Abstract: Standard Reference Materials (SRMs) as defined by the National Institute of Standards and Technology (NIST) are well-characterized materials, produced in quantity and certified for one or more physical or chemical properties. They are used to assure ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820674



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