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You searched on: Author: yoshihiro ohno

Displaying records 141 to 150 of 180 records.
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141. NIST Measurement Services: Photometric Calibration
Published: 1/1/1997
Author: Yoshihiro Ohno

142. Interference-Filter Characterization of Spectraradiometers and Colorimeters
Published: 5/1/1996
Authors: Paul A Boynton, Yoshihiro Ohno, Edward F. Kelley

143. Analysis of Integrating Sphere Errors for Lamps Having Different Angular Intensity Distributions
Published: 1/1/1996
Authors: Yoshihiro Ohno, M Lindermann, G Sauter

144. Characterization of Modified FEL Quartz-Halogen Lamps for Photometric Standards
Published: 1/1/1996
Authors: Yoshihiro Ohno, J K Jackson

145. Improved Photometric Standards and Calibration Procedures at NIST
Published: 1/1/1996
Author: Yoshihiro Ohno

146. Realization of NIST 1995 Luminous Flux Scale Using Integrating Sphere Method
Published: 1/1/1996
Author: Yoshihiro Ohno

147. The NIST Detector-Based Luminous Intensity Scale
Published: 1/1/1996
Authors: C L Cromer, George P Eppeldauer, Jonathan E Hardis, Thomas C Larason, Yoshihiro Ohno, Albert C Parr

148. 1993 Intercomparison of Photometric Units Maintained at NIST (USA) and PTB (Germany)
Published: 1/1/1995
Authors: Yoshihiro Ohno, G Sauter

149. New Method for Realizing Total Flux Scale Using an Integrating Sphere with an External Source
Published: 1/1/1995
Author: Yoshihiro Ohno

150. New Technologies for Optical Radiation Measurements
Published: 1/1/1995
Author: Yoshihiro Ohno

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Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series