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Author: yaw obeng

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11. Advanced Metrology for Nanoelectronics at the National Institute of Standards and Technology
Published: 3/11/2009
Authors: Joaquin (Jack) Martinez, Yaw S Obeng, Stephen Knight
Abstract: A broad range of programs at the National Institute of Standards and Technology address critical metrology and characterization challenges facing the nanoelectronics industry. A brief history of the program will be included. From these programs we ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=901409

12. Identity management standards for product life cycle of electronic parts
Published: 9/10/2008
Authors: YaShian Li-Baboud, Eric D Simmon, Yaw S Obeng
Abstract: The high profit opportunities, the diffused outsourcing of manufacturing and the structure of distribution networks make the electronics and its components susceptible to counterfeiting. Distinguishing the genuine article from counterfeit is increasi ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=33159

13. Strategies for Closing the ITRS Funding Gap
Published: 8/18/2008
Authors: Yaw S Obeng, Stephen Knight, Joaquin (Jack) Martinez
Abstract: For over 35 years, each IC generation has doubled the transistor count while cutting the cost per function in half. This progress, described by Moore's Law, has resulted primarily from scaling device dimensions and wafer size. In reality, the 'Moore ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=33009

14. Semiconductor Microelectronics and Nanoelectronics Programs
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 7513
Published: 7/1/2008
Authors: Stephen Knight, Joaquin (Jack) Martinez, Yaw S Obeng, Michele L. Buckley
Abstract: The microelectronics industry supplies vital components to the electronics industry and to the U.S. economy, enabling rapid improvements in productivity and in new high technology growth industries such as electronic commerce and biotechnology. The N ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=33067

15. ECS Transactions
Published: 5/18/2008
Authors: Yaw S Obeng, Stephen Knight, Joaquin (Jack) Martinez
Abstract: Nanoelectronics require the introduction of several new uncharacterized material(s) combinations and new processing techniques. The critical metrology and characterization needs of the nanoelectronics industry are being addressed with a broad range o ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=32939