Publications Portal

You searched on:
Author: c o'brien

Displaying records 11 to 15.
Resort by: Date / Title


11. Comparison of the NIST and NPL Air Kerma Standards Used for X-ray Measurements Between 10 kV and 80 kV
Published: 1/1/2000
Authors: C Michelle O'Brien, P J. Lamperti, T T Williams, Tillman H. Sander
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=103603

12. Comparison of the NIST and NPL Air Kerma Standards Used for X-ray Measurements Between 10 kV and 80 kV
Published: 1/1/2000
Authors: C Michelle O'Brien, P J. Lamperti, T T Williams, Tillman H. Sander
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=103674

13. Comparison of the NIST and BIPM Air-Kerma Standards for Measurements in the Low-Energy X-Ray Range
Series: Journal of Research (NIST JRES)
Published: 2/1/1999
Authors: D T Burns, P J. Lamperti, C Michelle O'Brien
Abstract: A direct comparison was made between the air-kerma standards used for the measurement of low-energy x rays at the National Institute of Standards and Technology (NIST) and at the Bureau International des Poids et Mesures (BIPM). The comparison was ca ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831100

14. Comparison of the NIST BIPM Air-Kerma Standards for Measurements in the Low-Energy X-ray Range
Published: 1/1/1999
Authors: D T Burns, P J. Lamperti, C Michelle O'Brien
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=103460

15. Comparison of Exposure Standards in the Mammography X-Ray Region
Published: 1/1/1997
Authors: J G Coletti, D W Pearson, Larry A DeWerd, C Michelle O'Brien, P J. Lamperti
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=103033



Search NIST-wide:


(Search abstract and keywords)


Last Name:
First Name:







Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series