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1. Controlling Formation of Atomic Step Morphology on Micro-patterned Si (100)
Published: 8/9/2011
Authors: Kai Li, Pradeep Narayanan Namboodiri, Sumanth B. Chikkamaranahalli, Gheorghe Stan, Ravikiran Attota, Joseph Fu, Richard M Silver
Abstract: Micro scale features are fabricated on Si (100) surfaces using lithographic techniques and then thermally processed in an ultra high vacuum (UHV) environment. Samples are flash heated at 1200 °C and further annealed at 1050 °C for 18 hours. The surf ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907301

2. Estimation of Contact Area of Nanoparticles in Chains Using Continuum Elastic Contact Mechanics
Published: 6/19/2008
Authors: Jaroslaw Grobelny, Pradeep Narayanan Namboodiri, Doo-In Kim
Abstract: The key challenge in understanding the nanomechanical behavior of nanoparticle chains is strongly dependent on accurate determination of the contact area between individual particles. Experimental determination of the contacting radius is extremely d ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=851061

3. Low temperature silicon epitaxy on H terminated Si (100) surfaces
Published: 3/31/2016
Authors: Xiao Deng, Pradeep Narayanan Namboodiri, Kai Li, Xiqiao Wang, Gheorghe Stan, Alline F Myers, Xinbin Cheng, Tongbao Li, Richard M Silver
Abstract: Silicon on silicon growth at low temperatures has become increasing important due to its use to encapsulate buried nanoscale dopant devices. The performance of atomic scale devices is fundamentally affected by the quality of the silicon matrix in whi ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=920036

4. Mechanical and electrical coupling at metal-insulator-metal nano-scale contacts
Published: 5/22/2008
Authors: Doo-In Kim, Pradeep Narayanan Namboodiri, Frank W DelRio, Robert Francis Cook
Abstract: Mechanical and electrical coupling at nano-scale metallic contacts was investigated using a conducting-probe atomic force microscope (AFM). The current-voltage responses were non-Ohmic, symmetric about zero bias, with conductance values smaller than ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=854471

5. Nanoparticle Lithography and Imaging Scanning Probe Microscopy
Published: 10/1/2006
Authors: Jaroslaw Grobelny, De-Hao D. Tsai, Doo-In Kim, Pradeep Narayanan Namboodiri, Robert Francis Cook, Michael Russel Zachariah
Abstract: Scanning tunnelling microscopy (STM) imaging was performed on goldsurfaces with a large coverage of monodispersed silver nanoparticlessoft-landed on the surface from the gas phase. In both ambient and ultra-highvacuum conditions, STM scanning was fou ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=850977

6. Nothing is Brittle at the Nanoscale
Published: 11/15/2007
Authors: Pradeep Narayanan Namboodiri, Doo-In Kim, Jaroslaw Grobelny, T Hawa, B Henz, Michael Russel Zachariah
Abstract: Fracture of nanoscale contacts formed between spherical probes and flat samples is studied using an atomic force microscope (AFM) in ultra high vacuum environment. Analysis of the nonlinear elastic behavior observed during the fracture process in the ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=851062

7. Origin of Adhesion in Humid Air
Published: 4/18/2008
Authors: Doo-In Kim, Jaroslaw Grobelny, Pradeep Narayanan Namboodiri, Robert Francis Cook
Abstract: The origin of adhesion at nanoscale contacts in humid air is investigated by pull-off force measurements using atomic force microscopes in controlled environments from ultra-high vacuum through various humidity conditions to water. An equivalent work ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=851021

8. Pattern Transfer of Hydrogen Depassivation Lithography Patterns into Silicon with Atomically Traceable Placement and Size Control
Published: 7/17/2014
Authors: Josh Ballard, Stephen McDonnell, Don Dick, Maia Bischof, Joseph Fu, D Jaeger, James Owen , w Owen, Justin Alexander, Udi Fuchs, Pradeep Narayanan Namboodiri, Kai Li, John Randall, Robert Wallace, Yves Chabal, Richard Reidy, Richard M Silver
Abstract: Reducing the scale of etched nanostructures below the 10 nm range eventually will require an atomic scale understanding of the masks being used in order to maintain exquisite control over both feature size and feature density. Here, we demonstrate a ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=915583

9. Quantification of the Meniscus Effect in Adhesion Force Measurements
Published: 2/1/2006
Authors: Jaroslaw Grobelny, Pradeep Narayanan Namboodiri, Doo-In Kim, Z C. Ying
Abstract: Adhesion forces between a gold sphere and flat gold substrate are studied using atomic force microscopy in different environments. The pull-off force measured in vacuum is found to be a small fraction of that in ambient air or nitrogen atmosphere. In ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=850926

10. Size Measurement of Nanoparticles Using Atomic Force Microscopy, ASTM E2859-11
Report Number: 1200-7
Published: 1/2/2012
Authors: Jaroslaw Grobelny, Frank W DelRio, Pradeep Narayanan Namboodiri, Doo-In Kim, Vincent A Hackley, Robert Francis Cook
Abstract: The purpose of this document is to provide guidance on the quantitative application of atomic force microscopy (AFM) to determine the size of nanoparticles2 deposited in dry form on flat substrates using height (z-displacement) measurement. Unlike el ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910685



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