You searched on: Author: bin ming
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11. Understanding Imaging and Metrology with the Helium Ion Microscope
Michael T Postek, Andras Vladar, Bin Ming
The development of accurate metrology for the characterization of nanomaterials is one barrier to innovation confronting all phases of nanotechnology. Ultra-high resolution microscopy is a key technology needed to achieve this goal. But, current micr ...
12. Cellulose Nanocrystals the Next Big Nano-thing?
Michael T Postek, Andras Vladar, John A Dagata, Natalia Farkas, Bin Ming, Ronald Sabo, Theodore H Wegner
Biomass surrounds us from the smallest alga to the largest redwood tree. Even the largest trees owe their strength to a newly-appreciated class of nanomaterials known as cellulose nanocrystals (CNC). Cellulose, the world s most abundant natural, rene ...
13. Simulated SEM Images for Resolution Measurement
Petr Cizmar, Andras Vladar, Bin Ming, Michael T Postek
Resolution is a key performance metric, which often defines the quality of a scanning electron microscope (SEM). Traditionally, there is the subjective measurement of the distance between two points on special ''resolution'' samples and there are sev ...
14. Focused Ion Beam Manufacturing Methods for Nickel-Titanium Shape-Memory Alloy Thin Films
Gordon Allan Shaw, Koo-Hyun Chung, Bin Ming, Andras Vladar
Nickel-titanium shape-memory alloy is an interesting and technologically relevant material that can recover large amounts of mechanical strain through a thermally-activated phase transformation. Because of is unusual properties, it has been used wide ...