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Author: w wyatt miller

Displaying records 11 to 20 of 21 records.
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11. Interlaboratory Comparison of Josephson Voltage Standards Between NIST and Lockheed Martin Astronautics
Published: 4/1/2001
Authors: Yi-hua Tang, W Wyatt Miller
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=2664

12. Strong Anisotropy in Thin Magnetic Films Deposited on Obliquely Sputtered Ta Underlayers
Published: 11/1/2000
Authors: Robert D McMichael, C G Lee, John E Bonevich, P J Chen, W Wyatt Miller, William F. Egelhoff Jr.
Abstract: Anisotropy fields in excess of 120 kA/m (1500 Oe) have been produced in 3-5 nm- thick polycrystalline films of Co by oblique sputtering of Ta underlayers. The unusually high anisotropy is magnetostatic in origin, and is induced by corrugations on th ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=852975

13. Measurement Assurance Program for an Intercomparison of Josephson Voltage Standards between NIST and Lockheed Martin Astronautics
Published: 7/1/2000
Authors: W Wyatt Miller, Yi-hua Tang
Abstract: An intercomparison of 10 V Josephson voltage standards (JVS) between NIST and Lockheed Martin Astronautics (LMA) using four travelling Zener standards will be presented. The main purpose of the intercomparison was to establish traceability of LMA's ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=22395

14. Interlaboratory Comparison of Josephson Voltage Standards (JVS) Between NIST and Lockheed Martin Astronautics (LMA)
Published: 5/1/2000
Authors: Yi-hua Tang, W Wyatt Miller
Abstract: Two JVS systems operated at the NIST and LMA were compared by using four traveling Zener standards. A MAP protocol was adopted for the comparison. The mean difference between the measurements of the two laboratories was found to be 0.059 5V with an ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=4886

15. Experimental Investigation of the Validity of TDDB Voltage Acceleration Models
Published: 12/31/1994
Authors: John S Suehle, P Chaparala, C. Messick, W Wyatt Miller, K. C. Boyko
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=18788

16. Field and Temperature Acceleration of Time-Dependent Dielectric Breakdown in Intrinsic Thin SiO^d2^
Published: 12/31/1994
Authors: John S Suehle, P Chaparala, C. Messick, W Wyatt Miller, K. C. Boyko
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=16710

17. Controlled Interface Roughness in GaAs/AlAs Superlattices
Published: 12/31/1992
Authors: W Wyatt Miller, William J Boettinger, W. F. Tseng, Joseph G. Pellegrino, J. Comas
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=27202

18. Interface Roughness, Composition, and Alloying of Low-Order AlAs/GaAs Superlattices Studied by X-Ray Diffraction
Published: 12/31/1992
Authors: W Wyatt Miller, Joseph G. Pellegrino, J. Comas
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=5149

19. Periodicities in the X-Ray Diffraction of Low Order AlAs/GaAs Superlattices
Published: 12/31/1992
Authors: Joseph G. Pellegrino, S. B. Qadri, W. F. Tseng, W Wyatt Miller, J. Comas
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=16776

20. Calibration of Water Permeation Tubes
Series: Special Publication (NIST SP)
Report Number: 250-82
Published: Date unknown
Authors: Gregory E Scace, W Wyatt Miller
Abstract: NIST provides traceability of permeation tube humidity generators to national humidity standards by measuring the water permeation rate of permeation tubes submitted for calibration. Permeation tubes undergoing calibration are installed into a speci ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831014



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