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Author: john messina

Displaying records 21 to 30 of 42 records.
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21. Data Modeling to Support Environmental Information Exchange Throughout the Supply Chain
Published: 8/11/2007
Authors: John V Messina, Eric D Simmon
Abstract: With an ever-increasing awareness of the environmental impact of manufacturing, more and more political organizations (countries, states, and unions) are enacting legislation designed to protect the environment. One category of this restrictive legis ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=901689

22. Collaborative Augmented Reality for Better Standards
Published: 7/1/2007
Authors: Matthew L Aronoff, John V Messina
Abstract: Concurrent engineering depends on clear communication between all members of the development process. As that communication becomes more and more complex, the quality of the standards used to move and understand that information likewise becomes more ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=32769

23. Data Modeling to Support Environmental Information Exchange Throughout the Supply Chain
Published: 7/1/2007
Authors: Eric D Simmon, John V Messina
Abstract: With an ever-increasing awareness of the environmental impact of manufacturing, more and more political organizations (countries, states, and unions) are enacting legislation designed to protect the environment. One category of this restrictive legis ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=32621

24. Environmental Regulations Impose New Product Lifecycle Information Requirements
Published: 7/1/2007
Authors: John V Messina, Eric D Simmon, Matthew L Aronoff
Abstract: In a global response to increasing health and environmental concerns, there has been a trend towards governments enacting legislation to encourage sustainable manufacturing where industry creates products that minimize environmental impact. This legi ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=32620

25. North American Environmental Compliance Attitudes Towards Electronics
Published: 6/6/2007
Authors: Krista Botsford, John V Messina, Eric D Simmon
Abstract: More and more countries are beginning eco-compliance legislation for electronics products. Where does the USA stand? This paper will discuss the following areas and attitudes towards environmental compliance in the USA: levels of legislation, who is ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=32693

26. Focus 3D Telemodeling Tool: GUI Design for Iteration 1
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 32470
Published: 9/28/2006
Authors: Matthew L Aronoff, John V Messina, Eric D Simmon
Abstract: The Focus 3D Telemodeling Tool was designed as a novel graphical interface to data modeling for standards development. This paper describes the design intent for the proposed Graphical User Interface (GUI) of Focus -- how users interact with the syst ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=32470

27. Sands of Time: An External Stopwatch for Measuring the Timing of Events in a Computer or Distributed Computing Environment
Published: 9/1/2006
Authors: Eric D Simmon, YaShian Li-Baboud, John V Messina
Abstract: Meeting the rising complexity challenges of Advaced Process Control in semiconductor manufacturing requires improvement in the performance of software and networks utilized within the factory. Information must flow expeditiously throughout the APC sy ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=32077

28. Automating Thermo-Mechanical Warpage Estimation of PCBs/PCAs using a Design-Analysis Integration Framework
Published: 8/18/2006
Authors: Manas Bajaj, Russell Peak, Dirk Zwemer, Thomas Thurman, Lothar Klein, Giedrius Liutkus, Kevin G Brady, John V Messina, Mike Dickerson
Abstract: Accurate prediction, validation and reduction of thermally-induced PCB warpage are critical for enhancing manufacturing yield and reliability in time-to-market driven electronics product realization. In this paper, we describe a methodology to simula ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=32287

29. Focus: Augmented Reality for Standards Development
Published: 4/1/2006
Authors: Matthew L Aronoff, John V Messina
Abstract: The next generation of Product Data Exchange (PDE) standards will require the active participation of domain experts in the standards development process. Due to geographical separation and a lack of the XML expertise required to develop a high-quali ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=32766

30. Migrating Legacy Data in the PCB Industry
Published: 4/1/2006
Authors: Matthew L Aronoff, John V Messina
Abstract: The printed circuit board (PCB) industry has been using the Gerber (RS-274) file format for decades, resulting in a substantial library of legacy designs. One of the main drawbacks of the Gerber format is that it does not convey design intent. In ord ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=32767



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