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Author: ryna marinenko
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1. Uncertainties in Electron Probe Microanalysis
Published: 3/12/2010
Authors: Ryna B. Marinenko, Stefan D Leigh
Abstract: This tutorial discusses the importance of citing valid uncertainties when reporting analytical results and the need for a universally accepted approach for evaluating uncertainties. Today, the CIPM procedure has been accepted by numerous internation ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902270

2. Characterization of SiGe Films for use as a National Institute of Standards and Technology (NIST) Microanalysis Reference material (RM 8905)
Report Number: 8905
Published: 2/1/2010
Authors: Ryna B. Marinenko, Shirley Turner, David S Simons, Savelas A Rabb, Rolf Louis Zeisler, Lee Lijian Yu, Dale E Newbury, Rick L Paul, Nicholas W m Ritchie, Stefan D Leigh, Michael R Winchester, Lee J Richter, Douglas C Meier, Keana C K Scott, D Klinedinst, John A Small
Abstract: Bulk SiGe wafers cut from single-crystal boules and two SiGe thick films (4 m and 5 m thick) on Si wafers were evaluated with the electron probe microanalyzer for the extent of heterogeneity and composition for use as reference materi ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=900913

3. Characterization of SiGe Bulk Compositional Standards with Electron Probe Microanalysis
Published: 9/1/2003
Authors: Ryna B. Marinenko, J T. Armstrong, Shirley Turner, Eric B Steel, F A Stevie
Abstract: Bulk SiGe wafers cut from single-crystal boules were evaluated with the electron probe microanalyzer (EPMA) for micro- and macroheterogeneity for use as primary standards for future characterization of SiGe thin films on Si that are needed by the mic ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831299

4. High-Accuracy Determination of the Dependence of the PhotoluminescenceEmission Energy on Alloy Composition in Al^dx^Ga^d1-x^As Films
Published: 4/1/2003
Authors: Lawrence H Robins, J T. Armstrong, Ryna B. Marinenko, Albert J. Paul, J G Pellegrino, Kristine A Bertness
Abstract: In an effort to improve the accuracy of photoluminescence (PL)spectroscopy as a composition (Al mole fraction) measurement method forthe Al^dx^Ga^d1-x^As alloy system, the PL peak emission energy,E^dPL,peak^, was measured at room temperature for a se ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=850664

5. High-accuracy Determination of the Dependence of the Photoluminescence Emission Energy on Alloy Composition in Al^dx^Ga^d1-x^As Films
Published: 4/1/2003
Authors: Lawrence H Robins, J T. Armstrong, Ryna B. Marinenko, Albert J. Paul, John Pellegrino, Kristine A Bertness
Abstract: In an effort to improve the accuracy of photoluminescence (PL) measurements of the Al mole fraction (x) of Al^dx^Ga^d1-x^As alloys, the PL peak emission energy, E^dPL,peak^, was measured at room temperature for molecular-beam epitaxy-grown Al^dx^Ga^d ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=30775

6. Compositional Homogeneity of Ferroelectric (Pb,La)(Ti,Zr)O-^d3^ Thick Films
Published: 2/1/2003
Authors: S Bernik, Ryna B. Marinenko, J Holc, Z Samardzija, M Ceh, M Kosec
Abstract: Quantified WDS x-ray element maps were used to characterize active PLZT layers on Pt/PLZT/Al^d2^O^d3^ substrates, one fired at 1050 C and the other at 1150 C. In the layer fired at 1050 C randomly distributed micrometer size compositional irregul ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831261

7. X-ray Diffraction, Photoluminescence and Composition Standards of Compound Semiconductors
Published: 1/1/2003
Authors: Alexana Roshko, Kristine A Bertness, J T. Armstrong, Ryna B. Marinenko, Marc L Salit, Lawrence H Robins, Albert J. Paul, R J Matyi
Abstract: Work is underway to develop composition standards and standardized assessment procedures for compound semiconductors. An AlGaAs composition standard with less than 2% uncertainty is being developed. The improved accuracy of this standard is being ach ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=30117

8. NIST Standards for Microanalysis and the Certification Process
Published: 12/1/2002
Author: Ryna B. Marinenko
Abstract: Procedures for testing research materials for the determination of the extent of within-specimen heterogeneity and between-specimen heterogeneity are described. These procedures, which have been developed and used at NIST in the certification of sev ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831262

9. Composition Standards for III-V Semiconductor Epitaxial Films
Published: 11/11/2002
Authors: Kristine A Bertness, Lawrence H Robins, J T. Armstrong, Ryna B. Marinenko, Albert J. Paul, Marc L Salit
Abstract: A program is underway at NIST to establish standard reference materials (SRMs) for the calibration of instruments used to measure the chemical composition of epitaxially grown III-V semiconductor thin films. These SRMs are designed for the calibratio ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=30845

10. Chemical Characterization of Silicon-Germanium Single Crystals - Initial Evaluation of the Extent of Heterogeneity
Published: 8/1/2002
Authors: Ryna B. Marinenko, J T. Armstrong, Shirley Turner, Eric B Steel, F A Stevie
Abstract: Initial heterogeneity testing with the electron microprobe using WDS of three SiGe wafers cut from single-crystal boules of different concentrations (nominally 3.5, 6.5, and 14 atomic % Ge) is described. Random and repeat samplings over the entire s ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831283



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