NIST logo

Publications Portal

You searched on:
Author: keith lykke

Displaying records 31 to 40 of 111 records.
Resort by: Date / Title


31. Transfer Standard Filter Radiometers: Applications to Fundamental Scales
Published: 1/1/2006
Authors: George P Eppeldauer, Steven W Brown, Keith R Lykke
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=104436

32. UV and VUV radiometry programs at the Synchrotron Ultraviolet Radiation Facility (SURF III)
Published: 1/1/2006
Authors: Zhigang Li, Ping-Shine Shaw, Uwe Arp, Keith R Lykke
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=103972

33. Correction of Stray Light in Spectrographs: Implications for Remote Sensing
Published: 8/22/2005
Authors: Yuqin Zong, Steven W Brown, Bettye C Johnson, Keith R Lykke, Yoshihiro Ohno
Abstract: Spectrographs are used in a variety of applications in the field of remote sensing for radiometric measurements due to the benefits of measurement speed, sensitivity, and portability. However, spectrographs are single grating instruments that are su ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=840972

34. Damage to Solid-State Photodiodes by Vacuum Ultraviolet Radiation
Published: 6/1/2005
Authors: Uwe Arp, Ping-Shine Shaw, R Gupta, Keith R Lykke
Abstract: We report experimental results on the stability of photodiodes obtained at three different wavelengths in the vacuum ultraviolet spectral region. Two of these experiments were based on radiation damage inflicted with excimer lasers at 193 nm and 157 ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=840194

35. Realization and Application of a Detector-Based Tristimulus Color Scale at the National Institute of Standards and Technology, USA
Published: 5/13/2005
Authors: George P Eppeldauer, Steven W Brown, Keith R Lykke, Yoshihiro Ohno
Abstract: The recently introduced detector-based calibration method for tristimulus colorimeters has been realized. The NIST reference colorimeter has been calibrated for spectral irradiance responsivity with an uncertainty of 0.15 % (coverage factor k=2) res ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=840951

36. Stability of Photodiodes Under Irradiation With 157-nm Pulsed Excimer Laser
Published: 1/1/2005
Authors: Ping-Shine Shaw, R Gupta, Keith R Lykke
Abstract: We have measured the stability of a variety of photodiodes as they are irradiated with UV light from a pulsed excimer laser source operating at 157 nm using a radiometry beamline at the Synchrotron Ultraviolet Radiation Facility (SURF III) at the Nat ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841808

37. Measurement of Total Radiant Flux of UV LEDS
Published: 6/7/2004
Authors: Yuqin Zong, Carl C Miller, Keith R Lykke, Yoshihiro Ohno
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841828

38. Spectral Irradiance and Radiance Responsivity Calibrations Using Uniform Sources (SIRCUS) Facility at NIST
Published: 1/1/2004
Authors: Steven W Brown, George P Eppeldauer, Joseph Paul Rice, Jun Zhang, Keith R Lykke
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=104332

39. Temperature determinations of the Ag and Au-freezing points using a detector-based radiation thermometer
Published: 1/1/2004
Authors: David W Allen, Steven W Brown, George P Eppeldauer, Charles E Gibson, Maritoni Abatayo Litorja, Keith R Lykke, Robert D. Saunders, Howard W Yoon
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=104295

40. The realization and the dissemination of the detector-based kelvin
Published: 1/1/2004
Authors: David W Allen, Steven W Brown, George P Eppeldauer, Charles E Gibson, Maritoni Abatayo Litorja, Keith R Lykke, Robert D. Saunders, Howard W Yoon
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=104293



Search NIST-wide:


(Search abstract and keywords)


Last Name:
First Name:







Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series