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Author: keith lykke

Displaying records 31 to 40 of 114 records.
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31. Absolute radiant flux measurement for the angular distribution of synchrotron radiation
Published: 1/1/2006
Authors: Ping-Shine Shaw, Uwe Arp, Keith R Lykke
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=104163

32. Absolute radiant flux measurement of the angular distribution of synchrotron radiation,
Published: 1/1/2006
Authors: Ping-Shine Shaw, Uwe Arp, Keith R Lykke
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=101711

33. Facility for spectral irradiance and radiance responsivity calibrations using uniform sources
Published: 1/1/2006
Authors: Steven W Brown, George P Eppeldauer, Keith R Lykke
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=101303

34. Transfer Standard Filter Radiometers: Applications to Fundamental Scales
Published: 1/1/2006
Authors: George P Eppeldauer, Steven W Brown, Keith R Lykke
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=104436

35. UV and VUV radiometry programs at the Synchrotron Ultraviolet Radiation Facility (SURF III)
Published: 1/1/2006
Authors: Zhigang Li, Ping-Shine Shaw, Uwe Arp, Keith R Lykke
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=103972

36. Correction of Stray Light in Spectrographs: Implications for Remote Sensing
Published: 8/22/2005
Authors: Yuqin Zong, Steven W Brown, Bettye C Johnson, Keith R Lykke, Yoshihiro Ohno
Abstract: Spectrographs are used in a variety of applications in the field of remote sensing for radiometric measurements due to the benefits of measurement speed, sensitivity, and portability. However, spectrographs are single grating instruments that are su ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=840972

37. Damage to Solid-State Photodiodes by Vacuum Ultraviolet Radiation
Published: 6/1/2005
Authors: Uwe Arp, Ping-Shine Shaw, R Gupta, Keith R Lykke
Abstract: We report experimental results on the stability of photodiodes obtained at three different wavelengths in the vacuum ultraviolet spectral region. Two of these experiments were based on radiation damage inflicted with excimer lasers at 193 nm and 157 ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=840194

38. Realization and Application of a Detector-Based Tristimulus Color Scale at the National Institute of Standards and Technology, USA
Published: 5/13/2005
Authors: George P Eppeldauer, Steven W Brown, Keith R Lykke, Yoshihiro Ohno
Abstract: The recently introduced detector-based calibration method for tristimulus colorimeters has been realized. The NIST reference colorimeter has been calibrated for spectral irradiance responsivity with an uncertainty of 0.15 % (coverage factor k=2) res ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=840951

39. Stability of Photodiodes Under Irradiation With 157-nm Pulsed Excimer Laser
Published: 1/1/2005
Authors: Ping-Shine Shaw, R Gupta, Keith R Lykke
Abstract: We have measured the stability of a variety of photodiodes as they are irradiated with UV light from a pulsed excimer laser source operating at 157 nm using a radiometry beamline at the Synchrotron Ultraviolet Radiation Facility (SURF III) at the Nat ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841808

40. Measurement of Total Radiant Flux of UV LEDS
Published: 6/7/2004
Authors: Yuqin Zong, Carl C Miller, Keith R Lykke, Yoshihiro Ohno
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841828



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