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Author: john lu
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1. An Empirical Bayes Approach to Robust Variance Estimation: A Statistical Proposal for Quantitative Medical Image Testing
Published: 10/23/2012
Authors: John Lu, Charles D. Fenimore
Abstract: The current standard for measuring tumor response using X-ray, CT and MRI is based on the response evaluation crite- rion in solid tumors (RECIST) which, while providing simplifications over previous (WHO) 2-D methods, stipulate four response categor ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=912176

2. Big Data Issues in Quantitative Imaging
Series: OTHER
Published: 8/29/2012
Authors: Mary C Brady, Alden A Dima, Charles D. Fenimore, James J Filliben, John Lu, Adele P Peskin, Mala Ramaiah, Ganesh Saiprasad, Ram D Sriram
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=911670

3. Comparison of 1D, 2D and 3D nodule sizing methods by radiologists for spherical and complex nodules on thoracic CT phantom images
Published: 1/11/2014
Authors: John Lu, Charles D. Fenimore
Abstract: Purpose: To estimate the bias and variance of radiologists measuring the size of spherical and complex synthetic nodules. Methods: This study did not require IRB approval. Six radiologists estimated the size of 10 synthetic nodules embedded within ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=912057

4. Comparison of Confidence Intervals for Large Operational Biometric Data by Parametric and Non-parametric Methods
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 7740
Published: 11/23/2010
Authors: Su Lan Cheng, Ross J Micheals, John Lu
Abstract: Receiver operating characteristic (ROC) or Detection Error Trade-off (DET) curves are used to measure the performance of a biometric verification or identification system. To go beyond the ROC/DET and to enhance evaluation of a verification system w ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=906844

5. Development of a Seebeck Coefficient Standard Reference Material
Published: 8/7/2009
Authors: Nathan Lowhorn, Winnie K Wong-Ng, John Lu, Evan L. Thomas, Makoto Otani, Martin L Green, Neil Dilley, Jeffrey Sharp, Thanh N. Tran
Abstract: We have successfully developed a Seebeck coefficient Standard Reference Material (SRM ), Bi2Te3, that is crucial for interlaboratory data comparison and for instrument calibration. Certification measurements were performed using two different techniq ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=854458

6. Development of a Seebeck Coefficient Standard Reference Material (SRM),
Published: 8/1/2011
Authors: Nathan Lowhorn, Winnie K Wong-Ng, John Lu, Joshua Brooks Martin, Martin L Green, John E Bonevich, Evan L. Thomas, Neil Dilley, Jeff Sharp
Abstract: We have successfully developed a Seebeck coefficient Standard Reference Material (SRM,), Bi2Te3, that is essential for interlaboratory data comparison and for instrument calibration. Certification measurements were performed using a differential stea ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907792

7. Form-Profiling of Optics Using the Geometry Measuring Machine and NIST M-48 CMM
Published: 1/1/2006
Authors: Nadia Machkour-Deshayes, John Richard Stoup, John Lu, Johannes A Soons, Ulf Griesmann, Robert S. Polvani
Abstract: We are developing an instrument, the Geometry Measuring Machine (GEMM), to measure the profile errors of aspheric and free form optical surfaces, which require measurement uncertainties near 1nm. Using GEMM, an optical profile is reconstructed from ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=822545

8. Phase-coded volume holographic gratings for spatial-spectral imaging filters
Published: 2/15/2013
Author: John Lu
Abstract: We present a design of phase contrast filters embedded in a three-dimensional (3D) pupil to form phase-coded volume holographic gratings (VHG) for spatial-spectral imaging. The phase-coded VHG improves image contrast and results in strong filtering p ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913186

9. Radiochemical Neutron Activation Analysis for Certification of Ion-Implanted Phosphorus in Silicon
Published: 7/11/2003
Authors: Rick L Paul, David S Simons, William F Guthrie, John Lu
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=903386

10. Round-Robin Studies of Two Potential Seebeck Coefficient Standard Reference Materials
Published: 1/14/2009
Authors: Nathan Lowhorn, Winnie K Wong-Ng, Weiping Zhang, John Lu, Makoto Otani, Evan L. Thomas, Martin L Green, Thanh Tran
Abstract: The scientific activities of NIST include the development and distribution of standard reference materials (SRM) for instrument calibration and inter-laboratory data comparison. Full characterization of a thermoelectric material requires measurement ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=851059



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