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You searched on: Author: john lu

Displaying records 11 to 16.
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11. Statistical analysis of a round-robin measurement survey of two candidate materials for a Seebeck coefficient Standard Reference Material
Published: 2/2/2009
Authors: John Lu, Nathan Lowhorn, Winnie K Wong-Ng, Weiping Zhang, Evan L. Thomas, Makoto Otani, Martin L Green, Thanh N. Tran, Chris Caylor, Neil Dilley, Adams Downey, B Edwards, Norbert Elsner, S Ghamaty, Timothy Hogan, Qing Jie, Qiang Li, Joshua Brooks Martin, George S. Nolas, H Obara, Jeffrey Sharp, Rama Venkatasubramanian, Rhonda Willigan, Jihui Yang, Terry Tritt
Abstract: In an effort to develop a Standard Reference Material (SRM ) for Seebeck coefficient, we have conducted a round-robin measurement survey of two candidate materials undoped Bi2Te3 and constantan (55% Cu and 45% Ni alloy). Measurements were performe ...

12. Round-Robin Studies of Two Potential Seebeck Coefficient Standard Reference Materials
Published: 1/14/2009
Authors: Nathan Lowhorn, Winnie K Wong-Ng, Weiping Zhang, John Lu, Makoto Otani, Evan L. Thomas, Martin L Green, Thanh Tran
Abstract: The scientific activities of NIST include the development and distribution of standard reference materials (SRM) for instrument calibration and inter-laboratory data comparison. Full characterization of a thermoelectric material requires measurement ...

13. Form-Profiling of Optics Using the Geometry Measuring Machine and NIST M-48 CMM
Published: 1/1/2006
Authors: Nadia Machkour-Deshayes, John Richard Stoup, John Lu, Johannes A Soons, Ulf Griesmann, Robert S. Polvani
Abstract: We are developing an instrument, the Geometry Measuring Machine (GEMM), to measure the profile errors of aspheric and free form optical surfaces, which require measurement uncertainties near 1nm. Using GEMM, an optical profile is reconstructed from ...

14. Radiochemical Neutron Activation Analysis for Certification of Ion-Implanted Phosphorus in Silicon
Published: 7/11/2003
Authors: Rick L Paul, David S Simons, William F Guthrie, John Lu

15. Some Approaches to the Statistical Analysis of the Overall Molecular Mass Distribution of Synthetic Polymers
Published: Date unknown
Authors: Kathleen M. Flynn, John Lu, Stephanie J Wetzel, Jennifer Huckette
Abstract: Two approaches to the statistical analysis of molecular mass distribution data derived from mass spectrometry are presented.

16. Statistical Methods For Holistic Mass Spectral Analysis
Published: Date unknown
Authors: John Lu, Charles Martin Guttman
Abstract: Analysis of molecular mass distribution data for characterizing the complex synthetic polymer structure has demanded new statistical methods. As with many other high throughput measurement devices, typically only very small number of replicates can b ...

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  • SP 250-XX: Calibration Services
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