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Author: eric lin

Displaying records 21 to 30 of 198 records.
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21. The Effect of Interfacial Roughness on the Thin Film Morphology and Charge Transport of High-Performance Polythiophenes
Published: 3/11/2008
Authors: Y S Jung, Regis J Kline, Daniel A Fischer, Eric K Lin, Martin Heeney, Iain McCulloch, Dean M DeLongchamp
Abstract: We control and vary the roughness of a dielectric upon which a high-performance polymer semiconductor, poly(2,5-bis(3-alkylthiophen-2-yl)thieno[3,2-b]thiophene) (pBTTT) is cast, to determine the effects of roughness on thin-film microstructure and th ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=852764

22. Thermodynamic Interactions in Double-Network Hydrogels
Published: 3/11/2008
Authors: Taiki Tominaga, Vijay Tirumala, Sanghun Lee, Eric K Lin, Jian P. Gong, Wen-Li Wu
Abstract: Double-network hydrogels (DN-gels) prepared from the combination of a moderately crosslinked anionic polyelectrolyte and an uncrosslinked linear polymer solution exhibit mechanical properties such as fracture toughness that are intriguingly superior ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=852792

23. Single cantilever peel test for analysis of adhesion strength in nanotransfer printing
Published: 2/17/2008
Authors: Deuk Y. Lee, Gottlieb Oehrlein, Daniel R. Hines, Jiong Liu, Jun Y. Chung, Christopher M Stafford, Christopher L Soles, Eric K Lin
Abstract: Nanotransfer printing (NTP) has attracted much attention as a method for fabricating nanoscale structures using materials that are not generally compatible with conventional lithographic techniques. For NTP of a polymer film to a polymer substrate, t ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=854489

24. Characterization of the In-Plane Structure of Buried Interfaces by Off-Specular X-Ray and Neutron Reflectometry
Published: 2/14/2008
Authors: Kristopher Lavery, Vivek M Prabhu, Eric K Lin, Wen-Li Wu, Kwang-Woo Choi, Sushil K. Satija, M Wormington
Abstract: Off-specular reflectivity, or diffuse scattering, probes the lateral compositional variations at surfaces and interfaces. Of particular interest is the characterization at buried interfaces for the form and amplitude of roughness. Recent advances i ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=852736

25. Lateral Length Scales of Latent Image Roughness as Determined by Off-Specular Neutron Reflectivity
Published: 2/14/2008
Authors: Kristopher Lavery, Vivek M Prabhu, Eric K Lin, Wen-Li Wu, Sushil K. Satija, Kwang-Woo Choi, M Wormington
Abstract: A combination of specular and off-specular neutron reflectometry was used to measure the buried lateral roughness of the reaction-diffusion front in a model extreme ultraviolet lithography photoresist. Compositional heterogeneity at the latent react ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=852777

26. Interfacial Modification of Silica Surfaces through Gamma-Isocyanatopropyl Triethoxy Silane {?} Amine Coupling Reactions
Published: 1/15/2008
Authors: Brandon M. Vogel, Dean M DeLongchamp, Christine M. Mahoney, Leah A. Lucas, Daniel A Fischer, Eric K Lin
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=854340

27. Direct measurement of the spatial extent of the in situ developed latent image by neutron reflectivity
Published: 12/11/2007
Authors: Vivek M Prabhu, B D. Vogt, Shuhui Kang, Eric K Lin, Sushil K. Satija
Abstract: The spatial distribution of polymer photoresist and deuterium labeled base developer highlights a fraction of the line edge that swells but does not dissolve. This residual swelling fraction remains swollen during both the in situ aqueous hydroxide ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=852747

28. Critical Role of Side-Chain Attachment Density on the Order and Device Performance of Polythiophenes
Published: 10/30/2007
Authors: Regis J Kline, Dean M DeLongchamp, Daniel A Fischer, Eric K Lin, Lee J Richter, Michael L. Chabinyc, Martin Heeney, Iain McCulloch
Abstract: High performance, solution processable semiconductors are critical to the realization of low cost, large area electronics. We show that a signature molecular packing motif - side-chain interdigitation - correlates to high performance for a large and ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=852680

29. Non Uniform Structural Degradation in Porous Organosilicate Films Exposed to Plasma, Etching and Ashing as Characterized by X-Ray Porosimetry
Published: 10/25/2007
Authors: Hae-Jeong Lee, Christopher L Soles, Eric K Lin, Wen-Li Wu, Yiping Liu
Abstract: The microelectronics industry critically needs non-destructive methodologies capable of profiling the porosity characteristics as a function of depth in the highly porous film that are used as interlayer dielectric insulators in integrated semiconduc ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=852742

30. Mesoporous Silica Films with Long-Range Order Prepared from Strongly Segregated Block Copolymer/Homopolymer Blend Templates
Published: 10/24/2007
Authors: Vijay Tirumala, R A. Pai, Sumit Agarwal, Curran Chandler, Gaurav Bhatnagar, Alvin Omang, Eric K Lin, J J. Watkins
Abstract: Well ordered mesoporous silica films were prepared by infusion and selective condensation of Si alkoxides within pre-organized block copolymer/homopolymer blend templates using supercritical CO2 as the delivery medium. The morphologies of mesoporou ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=852651



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