NIST logo

Publications Portal

You searched on: Author: zachary levine

Displaying records 31 to 40 of 118 records.
Resort by: Date / Title

31. Optical to UV spectra and birefringence of SiO2 and TiO2:  first-principles calculations with excitonic effects
Published: 1/1/2008
Authors: H M Lawler, J J Rehr, F Vila, SD Dalosto, Eric L Shirley, Zachary H Levine
Abstract: A first-principles approach is presented for calculations of optical to ultraviolet spectra including excitonic effects.  The approach is based on the Bethe-Salpeter equation calculations using the NBSE code combined with ABINIT.  The appro ...

32. Synthetic Incoherence for Electron Microscopy
Published: 7/11/2007
Authors: Zachary H Levine, Robyn M Dunstan
Abstract: Tomographic studies of submicrometer samples in materials science using electron microscopy have been inhibited by diffraction effects. In the present work, we describe two practical methods for ameliorating these effects. In one, the sample is sca ...

33. Alignment of Fiducial Marks in a Tomographic Tilt Series with an Unknown Rotation Axis
Published: 4/1/2007
Authors: Zachary H Levine, Peter Volkovitsky, Howard Hung
Abstract: Alignment for tomography using a transmission electron microscopy frequently uses colloidal gold particles as fiducial reference marks. Typically, there is an implicit assumption that the tilt axis of the tomographic series is orthogonal to the beam ...

34. Bayesian Tomography for Projections With an Arbitrary Transmission Function With an Application in Electron Microscopy
Series: Journal of Research (NIST JRES)
Published: 12/1/2006
Authors: Zachary H Levine, Anthony J Kearsley, John G Hagedorn
Abstract: The vast majority of the developments in tomography assume that the transmission of the probe trhought he sample follows Beer s Law, i.e., the rule of exponential attenuation. However, for transmission electron microscopy of samples a few times thei ...

35. Synthetic Incoherence Via Scanned Gaussian Beams
Series: Journal of Research (NIST JRES)
Published: 12/1/2006
Author: Zachary H Levine
Abstract: Tomography, in most formulations, requires an incoherent signal. For a conventional transmission electron microscope, the coherence of the beam often results in diffraction effects which limit the utility of a tilt series with conventional tomograph ...

36. Wake Fields in the Electron Gas, Including Transverse Response
Published: 12/1/2006
Authors: Eric J Cockayne, Zachary H Levine

37. Wake Fields in the Electron Gas Including Transverse Response
Published: 1/19/2006
Authors: Eric J Cockayne, Zachary H Levine
Abstract: Relativistic electrons have transverse electric fields comparable in magnitude to the longitudinal fields. We determine the relative effects of transverse and longitudinal fields of a moving point charge on the dielectric response of a uniform elect ...

38. Ab Initio Calculations of Mean Free Paths and Stopping Powers
Published: 1/2/2006
Authors: A P Sorini, J. Kas, J J Rehr, M P Prange, Zachary H Levine
Abstract: An approach is presented for theortical calculations of inelastic losses in solids over a broad energy range. The method is based on a many-pole model dielectric function, which is derived from ab initio calculations of optical constants using a rea ...

39. A Bayesian approach to tomography of multiply scattered beams, ed. by A. Bouman, E.L. Miller and I. Pollack
Published: 1/1/2006
Author: Zachary H Levine

40. Ab initio calculations of mean free paths and stopping powers,
Published: 1/1/2006
Authors: A P Sorini, J. Kas, J J Rehr, M P Prange, Zachary H Levine

Search NIST-wide:

(Search abstract and keywords)

Last Name:
First Name:

Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series