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You searched on: Author: david kuhn

Displaying records 31 to 40 of 112 records.
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31. Combinatorial Coverage Measurement
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 7878
Published: 10/26/2012
Authors: David R Kuhn, Raghu N Kacker, Yu Lei
Abstract: Combinatorial testing applies factor covering arrays to test all t-way combinations of input or configuration state space. In some testing situations, it is not practical to use covering arrays, but any set of tests covers at least some portion ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=912065

32. Efficient Algorithms for T-way Test Sequence Generation
Published: 10/16/2012
Authors: Linbin Yu, Yu Lei, Raghu N Kacker, David R Kuhn, James F Lawrence
Abstract: Combinatorial testing has been shown to be a very effective testing strategy. Most work on combinatorial testing focuses on t-way test data generation, where each test is an unordered set of parameter values. In this paper, we study the problem of t- ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=911348

33. Measuring Combinatorial Coverage of System State-space for IV&V
Published: 9/13/2012
Authors: David R Kuhn, Raghu N Kacker
Abstract: This report describes some measures of combinatorial coverage that can be helpful in estimating this risk that we have applied to tests for spacecraft software but have general application to any combinatorial coverage problem. This method will be i ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=911324

34. Efficient Methods for Interoperability Testing Using Event Sequences
Published: 7/31/2012
Authors: David R Kuhn, James M. Higdon, J .M. Lawrence, Raghu N Kacker, Yu Lei
Abstract: Many software testing problems involve sequences of events. The methods described in this paper were motivated by testing needs of mission critical systems that may accept multiple communication or sensor inputs and generate output to several commun ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=909665

35. Combinatorial Testing
Published: 6/25/2012
Authors: David R Kuhn, Raghu N Kacker, Yu Lei
Abstract: Combinatorial testing is a method that can reduce cost and improve test effectiveness significantly for many applications. The key insight underlying this form of testing is that not every parameter contributes to every failure, and empirical data su ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910001

36. Evaluation of Fault Detection Effectiveness for Combinatorial and Exhaustive Selection of Discretized Test Inputs
Published: 6/4/2012
Authors: Carmelo Montanez-Rivera, David R Kuhn, Mary C Brady, Richard M Rivello, Jenise Reyes Rodriguez, Michael K. Powers
Abstract: Testing components of web browsers and other graphical interface software can be extremely expensive because of the need for human review of screen appearance and interactive behavior. Combinatorial testing has been advocated as a method that provid ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=909661

37. Combinatorial Methods for Event Sequence Testing
Published: 4/21/2012
Authors: David R Kuhn, James M. Higdon, James F Lawrence, Raghu N Kacker, Yu Lei
Abstract: Many software testing problems involve sequences. This paper presents an application of combinatorial methods to testing problems for which it is important to test multiple configurations, but also to test the order in which events occur. For exam ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=906770

38. Combinatorial Testing of ACTS: A Case Study
Published: 4/21/2012
Authors: Mehra N. Borazjany, Linbin Yu, Yu Lei, Raghu N Kacker, David R Kuhn
Abstract: In this paper we present a case study of applying combinatorial testing to test a combinatorial test generation tool called ACTS. The purpose of this study is two-fold. First, we want to gain experience and insights about how to apply combinatorial t ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=911345

39. Isolating Failure-Inducing Combinations in Combinatorial Testing using Test Augmentation and Classification
Published: 4/21/2012
Authors: Kiran Shakya, Tao Xie, Nuo Li, Yu Lei, Raghu N Kacker, David R Kuhn
Abstract: Combinatorial Testing (CT) is a systematic way of sampling input parameters of the software under test (SUT). A t-way combinatorial test set can exercise all behaviors of the SUT caused by interactions between t input parameters or less. Although com ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=911450

40. Vulnerability Hierarchies in Access Control Configurations
Published: 12/27/2011
Author: David R Kuhn
Abstract: This paper applies methods for analyzing fault hierarchies to the analysis of relationships among vulnerabilities in misconfigured access control rule structures. Hierarchies have been discovered previously for faults in arbitrary logic formulae, s ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=909742



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