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You searched on: Author: john kramar

Displaying records 41 to 50 of 60 records.
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41. A Flexure Balance With Adjustable Restoring Torque for Nanonewton Force Measurement
Published: 1/1/2002
Authors: Jon Robert Pratt, David B Newell, John A Kramar
Abstract: The NIST electrostatic force balance compares mechanical probe forces to an SI realization of force derived from measurements of the capacitance gradient and voltage in an electronic null balance. As we approach the nanonewton regime, the finite stif ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=822422

42. NIST Electrostatic Force Balance Experiment
Published: 1/1/2002
Authors: John A Kramar, David B Newell, Jon Robert Pratt
Abstract: We have designed and built a prototype electrostatic force balance for realizing forces in the micronewton range. The active electrodes are concentric cylinders, the outer serving as the reference and the inner suspended and guided by a rectilinear f ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=821769

43. SI Traceability of Force at the Nanonewton Level
Published: 7/1/2001
Authors: David B Newell, Jon Robert Pratt, John A Kramar, Douglas T Smith, L. A. Feeney, Edwin Ross Williams
Abstract: Although nanonewton force measurements are commonplace in industry, no National Measurement Institute supports a link to the International System of Units (SI) below one newton. The National Institute of Standards and Technology has launched a five- ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=7241

44. Towards a Traceable Nanoscale Force Standard
Published: 5/1/2001
Authors: Jon Robert Pratt, David B Newell, Edwin Ross Williams, Douglas T Smith, John A Kramar
Abstract: The National Institute of Standards and Technology has launched a five-year project to traceably link the International System of Units (SI) to forces between 10^u-8^N and 10^u-2^N. In this paper, we give a background and overview of this project, di ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=821765

45. Towards a Traceable Nanoscale Force Standard
Published: 5/1/2001
Authors: Jon Robert Pratt, David B Newell, Edwin Ross Williams, Douglas T Smith, John A Kramar
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=9718

46. Kinematic Modeling and Analysis of a Planar Micro-Positioner
Published: 1/1/2001
Authors: Nicholas G Dagalakis, John A Kramar, E Amatucci, Robert Bunch
Abstract: The static and dynamic performance of a control system depends on the accuracy of the mathematical model of the plant that is being controlled. In this work, the accuracies of a linear and a second-order kinematic model were evaluated for a two-dimen ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=821767

47. Molecular Measuring Machine Design and Performance
Published: 1/1/2001
Authors: John A Kramar, Jay Shi Jun, William B. Penzes, Vincent P. Scheuerman, Fredric Scire, E Clayton Teague
Abstract: We have developed a metrology instrument called the Molecular Measuring Machine (M3) with the goal of performing two-dimensional point-to-point measurements with nanometer-level uncertainties over a 50 mm by 50 mm area. The scanning tunneling microsc ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=821689

48. SI Traceability of Force at the Nanonewton Level
Published: 1/1/2001
Authors: David B Newell, Jon Robert Pratt, John A Kramar, Douglas T Smith, L Feeney, Edwin Ross Williams
Abstract: Although nanonewton force measurements are commonplace in industry, no National Measurement Institute supports a link to the International System of Units (SI) below one newton. The National Institute of Standards and Technology has launched a five-y ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=821766

49. Molecular Measuring Machine Design and Measurements
Published: 5/1/2000
Authors: John A Kramar, Jay Shi Jun, William B. Penzes, Fredric Scire, E Clayton Teague, John S Villarrubia
Abstract: We at the National Institute of Standards and Technology are building a metrology instrument called the Molecular Measuring Machine (M3) with the goal of performing nanometer-accuracy, two-dimensional, point-to-point measurements over a 50 mm by 50 m ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=821763

50. Performance Evaluation of a Parallel Cantilever Biaxial Micropositioning Stage
Published: 1/1/2000
Authors: E Amatucci, Nicholas G Dagalakis, John A Kramar, Fredric Scire
Abstract: The phenomenal growth of opto-electronic manufacturing and future applications in micro and nano manufacturing has raised the need for low-cost high performance micro-positioners. The National Institutes of Standards and Technology (NIST) Advanced Te ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=821764



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