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You searched on: Author: john kramar

Displaying records 31 to 40 of 60 records.
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31. Progress Towards SI Traceable Force Metrology for Nanomechanics
Published: 1/1/2004
Authors: David B Newell, Eric Paul Whitenton, John A Kramar, Jon Robert Pratt, Douglas T Smith
Abstract: This paper is based, in its entirety, on NIST-approved publications: Calibration of Piezoresistive Cantilever Force Sensors Using the NIST Electrostatic Force Balance, The NIST Electrostatic Force Balance Experiment, The NIST Microforce Realization a ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=822096

32. Progress Towards Systeme International d'Unites Traceable Force Metrology for Nanomechanics
Published: 1/1/2004
Authors: Jon Robert Pratt, Douglas T Smith, David B Newell, John A Kramar, Eric Paul Whitenton
Abstract: Recent experiments with the National Institute of Standards and Technology (NIST) Electrostatic Force Balance (EFB) have achieved agreement between an electrostatic force and a gravitational force of 10^(-5) N to within a few hundred pN/¿N. This resu ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=822394

33. Calibration of Piezoresistive Cantilever Force Sensors Using the NIST Electrostatic Force Balance
Published: 11/16/2003
Authors: Jon Robert Pratt, David B Newell, John A Kramar, Eric Paul Whitenton
Abstract: The characterization of material properties and mechanical performance of micro-electromechanical devices often hinges on the accurate measurement of small forces.  Calibrated load cells of appropriate size and range are used, but are often not ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=823316

34. Dependency of Morphology on Miscut Angle for Si(111) Etched in NH^d4^F
Published: 5/1/2003
Authors: Joseph Fu, Hui Zhou, John A Kramar, Richard M Silver, S Gonda
Abstract: Using scanning probe microscopy, we have examined the surfaces produced by etching several different vicinal Si(111) samples in NH^d4^F aqueous solution. In agreement with others, we found that deoxygenation of the etchant generally reduces the numbe ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=823151

35. Dependence of Morphology on Miscut Angle for Si(111) Etched in NH(4)F
Published: 5/1/2003
Authors: S Gonda, Joseph Fu, John A Kramar, Richard M Silver, Hui Zhou
Abstract: Using scanning probe microscopy, we have examined the surfaces produced by etching several different vicinal Si(111) samples in NH(4)F aqueous solution. In agreement with others, we found that deoxygenation of the etchant generally reduces the number ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=822425

36. The NIST Microforce Realization and Measurement Project
Published: 4/1/2003
Authors: David B Newell, Edwin Ross Williams, John A Kramar, Jon Robert Pratt, Douglas T Smith
Abstract: The National Institute of Standards and Technology (NIST) has launched a five-year Micro-force Realization and Measurement project focusing on the development of an instrument and laboratory capable of realizing and measuring the SI unit of force bel ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=822085

37. Microforce and Instrumented Indentation Research at the National Institute of Standards and Technology, Gaithersburg, MD
Published: 1/1/2003
Authors: Jon Robert Pratt, David B Newell, John A Kramar, Douglas T Smith
Abstract: This paper provides an overview of recent efforts at the National Institute of Standards and TEchnology to develop metrology and standards to support general users of instrumented indentation and scan-probe devices. Research directed towards a primar ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=821956

38. Probe-Force Calibration Experiments Using the NIST Electrostatic Force Balance
Published: 1/1/2003
Authors: Jon Robert Pratt, David B Newell, John A Kramar, J Mulholland, Eric Paul Whitenton
Abstract: The sensitivity of a piezoresistive cantilever force sensor has been determined by probing the weighing pan of the NIST prototype electrostatic force balance. In this experiment, micronewton contact forces between a force probe and the balance''s wei ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=821900

39. The NIST Microforce Realization and Measurement Project
Published: 6/1/2002
Authors: David B Newell, Jon Robert Pratt, John A Kramar, Douglas T Smith, Edwin Ross Williams
Abstract: The National Institute of Standards and Technology (NIST) has launched a five-year Micro-force Realization and Measurement project focusing on the development of an instrument and laboratory capable of realizing and measuring the SI unit of force bel ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=30081

40. The NIST Microforce Realization and Measurement Project
Published: 6/1/2002
Authors: David B Newell, Jon Robert Pratt, John A Kramar, Douglas T Smith, Edwin Ross Williams
Abstract: The National Institute of Standards and Technology (NIST) has launched a five-year Microforce Realization and Measurement project focusing on the development of an instrument and laboratory capable of realizing and measuring the SI unit of force belo ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=20316



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