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You searched on: Author: john kramar

Displaying records 11 to 20 of 60 records.
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11. Comparison of NIST SI Force Scale to NPL SI Mass Scale
Published: 10/19/2008
Authors: Christopher W. Jones, John A Kramar, Stuart Davidson, Richard Leach, Jon Robert Pratt
Abstract: Small masses in the 1.0 mg to 0.1 mg range were developed and calibrated at NPL with traceability to the IPK. These masses were transported to NIST at Gaithersburg and used as deadweights on the NIST electrostatic force balance, to facilitate a mass- ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=824727

12. SI traceable calibration of an instrumented indentation sensor spring constant using electrostatic force
Published: 9/22/2008
Authors: Koo-Hyun Chung, Stefan Scholz, Gordon Allan Shaw, John A Kramar, Jon Robert Pratt
Abstract: We present a measurement scheme for creating reference electrostatic forces that are traceable to the International System of Units (SI). This scheme yields references forces suitable for calibrating the force sensitivity of instrumented indentation ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=823024

13. Spring constant calibration of AFM cantilevers with a piezosensor transfer standard
Published: 9/24/2007
Authors: Eric Langlois, Gordon Allan Shaw, John A Kramar, Jon Robert Pratt, Donna C. Hurley
Abstract: We describe a method to calibrate the spring constants of cantilevers for atomic force microscopy (AFM). The method makes use of a piezosensor comprised of a piezoresistive cantilever and  accompanying electronics. The piezosensor was calibrated ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=824626

14. Instrumentation, Metrology, and Standards for Nanomanufacturing
Published: 9/10/2007
Authors: Michael T Postek, Andras Vladar, John A Kramar, L A Stern, John Notte, Sean McVey
Abstract: Helium Ion Microscopy (HIM) is a new, potentially disruptive technology for nanotechnology and nanomanufacturing. This methodology presents a potentially revolutionary approach to imaging and measurements which has several potential advantages over t ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=824601

15. The Helium Ion Microscope: A New Tool for Nanotechnology and  Nanomanufacturing
Published: 9/1/2007
Authors: Michael T Postek, Andras Vladar, John A Kramar, L A Stern, John Notte, Sean McVey
Abstract: Helium Ion Microscopy (HIM) is a new, potentially disruptive technology for nanotechnology and nanomanufacturing. This methodology presents a potentially revolutionary approach to imaging and measurements which has several potential advantages over t ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=823238

16. A Piezoresistive Cantilever Force Sensor for Direct AFM Force Calibration
Published: 4/8/2007
Authors: Jon Robert Pratt, John A Kramar, Gordon Allan Shaw, Douglas T Smith, John M Moreland
Abstract: We describe the design, fabrication, and calibration testing of a new piezoresistive cantilever force sensor suitable for the force calibration of atomic force microscopes in a range between tens of nanonewtons to hundreds of micronewtons. The sens ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=822731

17. Helium Ion Microscopy: A New Technique for Semiconductor Metrology and Nanotechnology
Published: 1/1/2007
Authors: Michael T Postek, Andras Vladar, John A Kramar, L A Stern, John Notte, Sean McVey
Abstract: The Helium Ion Microscope (HIM) offers a new, potentially disruptive technique for nano-metrology. This methodology presents an approach to measurements for nanotechnology and nano-manufacturing which has several potential advantages over the traditi ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=823231

18. SI-Traceable Spring Constant Calibration of Microfabricated Cantilevers for Small Force Measurement
Published: 9/14/2006
Authors: Gordon Allan Shaw, John A Kramar, Jon Robert Pratt
Abstract: A variety of methods exist to measure the stiffness of microfabricated cantilever beams such as those used as mechanical sensors in atomic force microscopy (AFM). In order for AFM to be used as a quantitative small force measurement tool, these meth ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=822356

19. New reference standards and artifacts for nanoscale physical property characterization
Published: 7/1/2006
Authors: Jon Robert Pratt, John A Kramar, Gordon Shaw, Richard Gates, Paul Rice, John M Moreland
Abstract: This paper provides an overview of calibration artifacts being developed at the National Institute of Standards and Technology (NIST) that are intended to aid the accurate determination of nanoscale physical properties across a broad range of applica ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=32411

20. Calibration of Microfabricated Cantilevers for SI-Traceable Small Force Measurement
Published: 1/1/2006
Authors: Gordon Allan Shaw, Jon Robert Pratt, John A Kramar
Abstract: A procedure is described by which the spring constant of a microfabricated cantilever beam can be calibrated for the measurement of small forces in an atomic force microscope (AFM) or other device. The procedure utilizes dynamic force instrumented i ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=821950



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