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You searched on: Author: john kramar

Displaying records 11 to 20 of 57 records.
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11. Instrumentation, Metrology, and Standards for Nanomanufacturing
Published: 9/10/2007
Authors: Michael T Postek, Andras Vladar, John A Kramar, L A Stern, John Notte, Sean McVey
Abstract: Helium Ion Microscopy (HIM) is a new, potentially disruptive technology for nanotechnology and nanomanufacturing. This methodology presents a potentially revolutionary approach to imaging and measurements which has several potential advantages over t ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=824601

12. The Helium Ion Microscope: A New Tool for Nanotechnology and  Nanomanufacturing
Published: 9/1/2007
Authors: Michael T Postek, Andras Vladar, John A Kramar, L A Stern, John Notte, Sean McVey
Abstract: Helium Ion Microscopy (HIM) is a new, potentially disruptive technology for nanotechnology and nanomanufacturing. This methodology presents a potentially revolutionary approach to imaging and measurements which has several potential advantages over t ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=823238

13. A Piezoresistive Cantilever Force Sensor for Direct AFM Force Calibration
Published: 4/8/2007
Authors: Jon Robert Pratt, John A Kramar, Gordon Allan Shaw, Douglas T Smith, John M Moreland
Abstract: We describe the design, fabrication, and calibration testing of a new piezoresistive cantilever force sensor suitable for the force calibration of atomic force microscopes in a range between tens of nanonewtons to hundreds of micronewtons. The sens ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=822731

14. Helium Ion Microscopy: A New Technique for Semiconductor Metrology and Nanotechnology
Published: 1/1/2007
Authors: Michael T Postek, Andras Vladar, John A Kramar, L A Stern, John Notte, Sean McVey
Abstract: The Helium Ion Microscope (HIM) offers a new, potentially disruptive technique for nano-metrology. This methodology presents an approach to measurements for nanotechnology and nano-manufacturing which has several potential advantages over the traditi ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=823231

15. SI-Traceable Spring Constant Calibration of Microfabricated Cantilevers for Small Force Measurement
Published: 9/14/2006
Authors: Gordon Allan Shaw, John A Kramar, Jon Robert Pratt
Abstract: A variety of methods exist to measure the stiffness of microfabricated cantilever beams such as those used as mechanical sensors in atomic force microscopy (AFM). In order for AFM to be used as a quantitative small force measurement tool, these meth ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=822356

16. New reference standards and artifacts for nanoscale physical property characterization
Published: 7/1/2006
Authors: Jon Robert Pratt, John A Kramar, Gordon Shaw, Richard Gates, Paul Rice, John M Moreland
Abstract: This paper provides an overview of calibration artifacts being developed at the National Institute of Standards and Technology (NIST) that are intended to aid the accurate determination of nanoscale physical properties across a broad range of applica ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=32411

17. Calibration of Microfabricated Cantilevers for SI-Traceable Small Force Measurement
Published: 1/1/2006
Authors: Gordon Allan Shaw, Jon Robert Pratt, John A Kramar
Abstract: A procedure is described by which the spring constant of a microfabricated cantilever beam can be calibrated for the measurement of small forces in an atomic force microscope (AFM) or other device. The procedure utilizes dynamic force instrumented i ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=821950

18. Force Calibration Via Electrostatics
Published: 1/1/2006
Authors: Jon Robert Pratt, John A Kramar, Gordon Allan Shaw, Lee Kumanchik
Abstract: We describe the electrical and length measurements necessary to realize micronewton forces in a fashion consistent with the International System of Units (SI). We first discuss instrumentation and procedures required to accurately characterize an el ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=822547

19. New Reference Standards and Artifacts for Nanoscale Physical Property Characterization
Published: 1/1/2006
Authors: Jon Robert Pratt, John A Kramar, Gordon Allan Shaw, Richard Swift Gates, Paul Rice, John M Moreland
Abstract: This paper provides an overview of calibration artifacts being developed at the National Institute of Standards and Technology (NIST) that are intended to aid the accurate determination of nanoscale physical properties across a broad range of applica ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=822462

20. SI Realization of Small Forces Using an Electrostatic Force Balance
Published: 1/1/2006
Authors: Jon Robert Pratt, John A Kramar
Abstract: We describe the realization of micronewton forces in a fashion consistent with the International System of Units (SI) using the National Institute of Standards and Technology (NIST) electrostatic force balance. A comparison between deadweight and el ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=822598



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