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Author: jason killgore
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1. SPRITE: A modernized approach to scanning probe contact resonance imaging
Published: 1/20/2014
Authors: Anthony B Kos, Jason Philip Killgore, Donna C. Hurley
Abstract: We describe a system for contact resonance tracking called Scanning Probe Resonance Image Tracking Electronics (SPRITE). SPRITE can image two contact resonance frequencies simultaneously and thus can be used to acquire quantitative mechanical prope ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=914785

2. Dynamic contact AFM methods for nanomechanical properties
Published: 12/1/2013
Authors: Donna C. Hurley, Jason Philip Killgore
Abstract: This chapter focuses on two atomic force microscopy (AFM) methods for nanomechanical characterization: force modulation microscopy (FMM) and contact resonance (CR) techniques. FMM and CR methods share several common features that distinguish them fro ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=911068

3. Measurement of viscoelastic loss tangent with contact resonance modes of atomic force microscopy
Published: 11/26/2013
Authors: Donna C. Hurley, Sara E. Campbell, Jason Philip Killgore, Lewis M Cox, Yifu Ding
Abstract: We show how atomic force microscopy techniques based on contact resonance (CR) can be used to measure the viscoelastic loss tangent tan δ of polymeric materials. Absolute values of tan δ do not involve intermediate calculation of loss modul ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=914560

4. Hydrodynamic Corrections to Contact Resonance Force Microscopy Measurements of Viscoelastic Loss Tangent
Published: 7/9/2013
Authors: Ryan C Tung, Jason Philip Killgore, Donna C. Hurley
Abstract: We present a method to improve accuracy in measurements of nanoscale viscoelastic material properties with contact resonance (CR) AFM methods. Through the use of the two-dimensional hydrodynamic function, we obtain a more precise estimate of the flu ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913520

5. Anomalous Friction in Suspended Graphene
Published: 9/20/2012
Authors: Alexander Y. Smolyanitsky, Jason Philip Killgore
Abstract: Since the discovery of the Amonton's law and with support of modern tribological models, friction between surfaces of three-dimensional materials is known to generally increase when the surfaces are in closer contact. Here, using molecular dynamics s ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910882

6. Quantitative Viscoelastic Mapping of Polyolefin Blends with Contact Resonance Atomic Force Microscopy
Published: 5/9/2012
Authors: Dalia Yablon, Anil Gannepalli, Roger Proksch, Jason Philip Killgore, Donna C. Hurley, Andy Tsou
Abstract: The storage modulus (E') and loss modulus (E") of polyolefin blends have been mapped on the nanoscale with contact resonance force microscopy (CR-FM), a dynamic contact mode of atomic force microscopy (AFM). CR-FM maps for a blend of polyethylene, po ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=909881

7. Relationship between Barrier Layer Tg and TFC Membrane Performance: Effect of Chlorine Treatment
Published: 3/8/2012
Authors: Sajjad H. Maruf, Dae U. Ahn, John Pellegrino, Jason Philip Killgore, Alan R. Greenberg, Yifu Ding
Abstract: Thin film composite (TFC) reverse osmosis (RO) membranes play a significant role in addressing rapidly expanding global needs for potable water. A well-known problem of TFC membranes is their sensitivity to oxidizing agents such as chlorine, whi ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910101

8. Pulsed Contact Resonance in the Atomic Force Microscope
Published: 1/30/2012
Authors: Jason Philip Killgore, Donna C. Hurley
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910331

9. Low Force AFM Nanomechanics with Higher-Eigenmode Contact Resonance Spectroscopy
Published: 1/11/2012
Authors: Jason Philip Killgore, Donna C. Hurley
Abstract: Atomic force microscopy (AFM) methods for quantitative measurements of elastic modulus on stiff (>10 GPa) materials typically require tip-sample contact forces in the hundreds of nanonewton to few micronewton range. Such large forces can incur sa ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=909735

10. Effect of elastic deformation on frictional properties of few-layer graphene
Published: 1/9/2012
Authors: Alexander Y. Smolyanitsky, Jason Philip Killgore, Vinod K Tewary
Abstract: We describe the results of Brownian dynamics (BD) simulations of an AFM tip scanned on locally suspended few-layer graphene. The effects of surface compliance and sample relaxation are directly related to the observed friction force. We demonstrate t ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=909404



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