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You searched on: Author: simon kaplan

Displaying records 41 to 50 of 79 records.
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41. Development of an Adiabatic Laser Calorimeter
Published: 1/1/2001
Authors: Leonard M Hanssen, E Kawate, Simon Grant Kaplan, Raju Vsnu Datla
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=103846

42. Infrared Refractive Index Measurements using a New Method
Published: 1/1/2001
Authors: D Yang, M E Thomas, W J Tropf, Simon Grant Kaplan
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=104266

43. Angle-Dependent Absolute Infrared Reflectance and Transmittance Measurements
Published: 10/1/2000
Authors: Simon Grant Kaplan, Leonard M Hanssen
Abstract: A goniometric system is used in conjuction with an FT-IR (Fourier-Transform Infrared) spectrophotometer to perform reflectance and transmittance measurements as a function of angle of incidence from 12 to 80 . The input beam is polarized using a hi ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841483

44. Intercomparison of Regular Spectral Transmittance and Reflectance Measurements with FTIR- and Monochromator-Based Spectrophotometers
Published: 10/1/2000
Authors: Simon Grant Kaplan, Leonard M Hanssen, E A. Early, Maria E Nadal
Abstract: We have performed regular spectral transmittance and reflectance measurements over the 1 mm to 2.5 mm wavelength region on several different types of materials using three different spectrophotometer systems. Two of the systems employ grating-based ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841485

45. Angle-dependent absolute infrared reflectance and transmittance measurements
Published: 1/1/2000
Authors: Simon Grant Kaplan, Leonard M Hanssen
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=103914

46. Intercomparison of regular spectral transmittance and reflectance measurements with monochromator and FTIR based spectrophotometers
Published: 1/1/2000
Authors: Simon Grant Kaplan, Leonard M Hanssen, E A. Early, Maria E Nadal
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=103913

47. FT-IR Based Ellipsometer Using High-Quality Brewster-Angle Polarizers
Published: 1/1/1999
Authors: Simon Grant Kaplan, Leonard M Hanssen
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=104565

48. Infrared diffuse reflectance instrumentation and standards at NIST
Published: 1/1/1999
Authors: Leonard M Hanssen, Simon Grant Kaplan
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=103848

49. Characterization of High-OD Ultrathin Infrared Neutral Density Filters
Published: 10/8/1998
Authors: Simon Grant Kaplan, Leonard M Hanssen, Alan L Migdall, G Lefever-Button
Abstract: We have performed transmittance measurements of metal-film neutral density filters on ultrathin polymer substrates using both Fourier-transform infrared spectrometer and laser-based (3.39 mm and 10.6 mm) systems. The use of ultrathin substrates, fre ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841303

50. High Quality Broadband Brewster's Angle Reflective Polarizer for Infrared Applications
Published: 3/1/1998
Authors: D J Dummer, Simon Grant Kaplan, Leonard M Hanssen, A S Pine, Yuqin Zong
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=104408



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