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Author: simon kaplan

Displaying records 31 to 40 of 73 records.
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31. Si as a Standard Material for Infrared Reflectance and Transmittance from 2 {mu}m to 5 {mu}m
Published: 1/1/2002
Authors: Leonard M Hanssen, Simon Grant Kaplan
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=104520

32. Fourier Transform System for Characterization of Infrared Spectral Emittance of Materials
Published: 6/1/2001
Authors: Leonard M Hanssen, Simon Grant Kaplan, Sergey Mekhontsev
Abstract: To meet the existing demand for measurements of emittance of opaque and semi-transparent materials, a new facility is being built at NIST around a bench-top Fourier spectrometer. This facility will complement existing capabilities for characterizati ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841571

33. Infrared Transmittance Standards-2053, 2054, 2055, and 2056
Published: 5/1/2001
Authors: Leonard M Hanssen, Simon Grant Kaplan
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=104522

34. Standard Reference Materials: Infrared Transmittance Standards--SRM's 2053, 2054, 2055, and 2056
Series: Special Publication (NIST SP)
Report Number: 260-123
Published: 5/1/2001
Authors: Simon Grant Kaplan, Leonard M Hanssen
Abstract: Standard Reference Materials 2053, 2054, 2055, and 2056 are transmission filters designed to have nominally neutral attenuation over the 2 mm to 25 mm wavelength region, with optical densities near 1, 2, 3, and 4, respectively. The filters are made o ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841489

35. Development of an Adiabatic Laser Calorimeter
Published: 1/1/2001
Authors: Leonard M Hanssen, E Kawate, Simon Grant Kaplan, Raju Vsnu Datla
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=103846

36. Infrared Refractive Index Measurements using a New Method
Published: 1/1/2001
Authors: D Yang, M E Thomas, W J Tropf, Simon Grant Kaplan
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=104266

37. Angle-Dependent Absolute Infrared Reflectance and Transmittance Measurements
Published: 10/1/2000
Authors: Simon Grant Kaplan, Leonard M Hanssen
Abstract: A goniometric system is used in conjuction with an FT-IR (Fourier-Transform Infrared) spectrophotometer to perform reflectance and transmittance measurements as a function of angle of incidence from 12 to 80 . The input beam is polarized using a hi ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841483

38. Intercomparison of Regular Spectral Transmittance and Reflectance Measurements with FTIR- and Monochromator-Based Spectrophotometers
Published: 10/1/2000
Authors: Simon Grant Kaplan, Leonard M Hanssen, E A. Early, Maria E Nadal
Abstract: We have performed regular spectral transmittance and reflectance measurements over the 1 mm to 2.5 mm wavelength region on several different types of materials using three different spectrophotometer systems. Two of the systems employ grating-based ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841485

39. Angle-dependent absolute infrared reflectance and transmittance measurements
Published: 1/1/2000
Authors: Simon Grant Kaplan, Leonard M Hanssen
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=103914

40. Intercomparison of regular spectral transmittance and reflectance measurements with monochromator and FTIR based spectrophotometers
Published: 1/1/2000
Authors: Simon Grant Kaplan, Leonard M Hanssen, E A. Early, Maria E Nadal
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=103913



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