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You searched on: Author: simon kaplan

Displaying records 21 to 30 of 78 records.
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21. High Accuracy Ultraviolet Index of Refraction Measurements Using a Fourier Transform Spectrometer
Series: Journal of Research (NIST JRES)
Published: 11/1/2003
Authors: R Gupta, Simon Grant Kaplan
Abstract: We have constructed a new facility at the National Institute of Standrds and Technology to measure the index of refraction of transmissive materials in the wavelength range from the visible down to the vacuum ultraviolet (VUV). The interferometric t ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841724

22. 40 Years of Metrology With Synchrotron Radiation at SURF
Published: 9/1/2003
Authors: Uwe Arp, Steven E Grantham, Simon Grant Kaplan, Ping-Shine Shaw, Charles S Tarrio, Robert Edward Vest
Abstract: the advantages of a compact synchrotron radiation source like the Synchrotron Ultraviolet Radiation Facility for metrology in the ultraviolet and extreme ultraviolet are shown. The capabilities of the different experimental stations are explained an ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=840164

23. Forty Years of Metrology with Synchrtron Radiation at SURF
Published: 1/1/2003
Authors: Uwe Arp, Alex P. Farrell, Mitchell L. Furst, Steven E Grantham, Edward W Hagley, Simon Grant Kaplan, Ping-Shine Shaw, Charles S Tarrio, Robert Edward Vest
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=100995

24. Forty years of metrology with synchrotron radiation at SURF
Published: 1/1/2003
Authors: Uwe Arp, Alex P. Farrell, Mitchell L. Furst, Steven E Grantham, Edward W Hagley, Simon Grant Kaplan, Ping-Shine Shaw, Charles S Tarrio, Robert Edward Vest
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=100997

25. Fourier Transform System for Characterization of Infrared Spectral Emittance of Materials, ed. by B. Fellmuth, J. Seidel, and G. Scholz
Published: 1/1/2003
Authors: Leonard M Hanssen, Simon Grant Kaplan, Sergey Mekhontsev
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=104518

26. High Accuracy Ultraviolet Index of Refraction Measurements Using a Fourier Transform Spectrometer
Series: Journal of Research (NIST JRES)
Published: 1/1/2003
Authors: Simon Grant Kaplan, R Gupta
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=103911

27. Linearity Characterization of NIST's Infrared Regular Transmittance and Reflectance Scales
Published: 1/1/2003
Authors: Leonard M Hanssen, Simon Grant Kaplan
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=103844

28. Linearity Characterization of NIST's Infrared Spectral Regular Transmittance and Reflectance Scales
Published: 1/1/2003
Authors: Leonard M Hanssen, Simon Grant Kaplan
Abstract: System Linearity is a fundamental characterization performed on spectrophotometers. Yet it is one that is not adequately performed on Fourier transform instruments, because of the lack of a method for linearity characterization that will work suffici ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841636

29. Measurement of the refractive index and thermo-optic coefficient of water near 193 nm, ed. by Anthony Yen Page
Published: 1/1/2003
Authors: John H. Burnett, Simon Grant Kaplan
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=102649

30. Measurement of the refractive index and thermo-optic coefficient of water near 193nm, ed. by A. Yen
Published: 1/1/2003
Authors: J H Burnett, Simon Grant Kaplan
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=104347



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