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Author: simon kaplan

Displaying records 21 to 30 of 73 records.
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21. High Accuracy Ultraviolet Index of Refraction Measurements Using a Fourier Transform Spectrometer
Series: Journal of Research (NIST JRES)
Published: 1/1/2003
Authors: Simon Grant Kaplan, R Gupta
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=103911

22. Linearity Characterization of NIST's Infrared Regular Transmittance and Reflectance Scales
Published: 1/1/2003
Authors: Leonard M Hanssen, Simon Grant Kaplan
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=103844

23. Linearity Characterization of NIST's Infrared Spectral Regular Transmittance and Reflectance Scales
Published: 1/1/2003
Authors: Leonard M Hanssen, Simon Grant Kaplan
Abstract: System Linearity is a fundamental characterization performed on spectrophotometers. Yet it is one that is not adequately performed on Fourier transform instruments, because of the lack of a method for linearity characterization that will work suffici ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841636

24. Measurement of the refractive index and thermo-optic coefficient of water near 193 nm, ed. by Anthony Yen Page
Published: 1/1/2003
Authors: John H. Burnett, Simon Grant Kaplan
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=102649

25. Measurement of the refractive index and thermo-optic coefficient of water near 193nm, ed. by A. Yen
Published: 1/1/2003
Authors: J H Burnett, Simon Grant Kaplan
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=104347

26. NIST-NPL Comparison of Mid-infrared Regular Transmittance and Reflectance
Published: 1/1/2003
Authors: C J Chunnilall, F J Clarke, Leonard M Hanssen, Simon Grant Kaplan, M P Smart
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=104364

27. Silicon as a Standard Material for Infrared Reflectance and Transmittance From 2 to 5 m
Published: 12/1/2002
Authors: Simon Grant Kaplan, Leonard M Hanssen
Abstract: We have investigated the specular reflectance and transmittance of polished, high-resistivity single-crystal Si in the spectral range from 2 m to 5 m. Measurements were performed with a nearly collimated (-0.7 divergence) beam at angles of incidence ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841588

28. Measurement of the O-ray and E-ray Infrared Refractive Index and Absorption Coefficients of Sapphire From 10K to 295K
Published: 9/1/2002
Authors: Simon Grant Kaplan, M E Thomas
Abstract: We present the results of index of refraction and absorption coefficient measurements of high-quality optical grade sapphire over the 1850 cm^u-1^ 10000 cm^u-1^ wave number range and temperatures from 10 K to 295 K. The refractive index is determine ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841648

29. Comparison of Near-infrared Transmittance and Reflectance Measurements using Dispersive and Fourier Transform Spectrophotometers
Published: 1/1/2002
Authors: David W Allen, E A. Early, Leonard M Hanssen, Simon Grant Kaplan, E Nadal m
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=100958

30. Intercomparison of Transmittance and Reflectance Measurements Using Dispersive and Fourier Transform Spectrophotometers
Published: 1/1/2002
Authors: Simon Grant Kaplan, Leonard M Hanssen, E A. Early, Maria E Nadal, David W Allen
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=103912