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You searched on: Author: terrence jach

Displaying records 21 to 30 of 32 records.
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21. Micro X-Ray Fluorescence of Particles Using a Laboratory X-Ray Tube and a Polycapillary Optic
Published: 8/1/1999
Authors: J R. Swider, Terrence J Jach, Eric B Steel
Abstract: To create a microanalysis instrument that has low detection limits and can spatially resolve elemental distributions, we have utilized the benefits of X-ray Fluorescence (XRF) with a capillary focusing optic of the many methods used for x-ray focusin ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831203

22. Dynamical Diffraction and X-Ray Standing Waves from Atomic Planes Normal in a Twofold Symmetry Axis of the Quasicrystal A1PdMn
Published: 4/1/1999
Authors: Terrence J Jach, Yanbao Zhang, R. Colella, M. De Boissieu, M. Boudard, A. I. Goldman, T Lograsso, D W Delaney, S. Kycia
Abstract: We have observed dynamical diffraction in the [024024] and[046046] reflections of the icosahedral quasicrystal A1PdMn in the back-reflection geometry ({theta}^dB^ = 90 ). The x-ray fluorescence from the Al and Pd atoms exhibits strong standing w ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831075

23. Polycapillary X-Ray Optic Spectral Gain and Transmission
Published: 4/1/1999
Authors: J E Gormley, Eric B Steel, Q Xiao, Terrence J Jach
Abstract: Polycapillary x-ray optics are gaining increased attention as their transmission characteristics and manufacturing difficulties are better understood. This paper reports experimental results obtained with an optic that was designed for use with both ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831033

24. A UHV-Compatible Two-Crystal Monochromator for Synchrotron Radiation
Published: 12/1/1998
Authors: P L Cowan, J B Hastings, Terrence J Jach, J P Kirkland
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=100640

25. Use of Kirkpatrick-Baez Multilayer Optics for X-Ring Fluorescence Imaging
Published: 7/1/1998
Authors: A S Bakulin, S M Durbin, C Liu, J Erdmann, A T Macrander, Terrence J Jach
Abstract: We discuss the possibilities for using Kirkpatrick-Baez (K-B) multilayer elements to directly image the fluorescence distribution from a specimen under x-ray illumination. X-ray fluorescence would be collected by K-B elements close in contrast to th ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831073

26. Dynamical Diffraction and X-Ray Standing Waves from 2-Fold Reflections in the Quasicrystal AlPdMn
Published: 1/15/1998
Authors: Terrence J Jach, S. M. Thurgate, Y. Zhang, R. Colella, A. I. Goldman, S. Kycia, M. De Boissieu, M. Boudard
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=903858

27. An X-Ray Monochromator Crystal Which Detects the Bragg Condition
Published: 5/1/1988
Authors: Terrence J Jach, Donald B. Novotny, G. P. Carver, Jon C Geist, R D Spal
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=1570

28. Reversible Step Rearrangement and Segregation on Nickel Surfaces at the Curie Temperature
Published: 10/1/1982
Authors: Terrence J Jach, J Hamilton
Abstract: Reversible step period rearrangement and carbon segregation have been observed on clean nickel single-crystal surfaces whose bulk is also relatively free of impurities. These transitions occurred over a temperature range of 35 K at the nickel Curie ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=620231

29. Structural Phase Transitions on Nickel at the Curie Temperature
Published: 3/16/1981
Authors: J Hamilton, Terrence J Jach
Abstract: It is observed that a reversible step period rearrangement on clean nickel single-crystal surfaces occurs in the immediate vicinity of the Curie temperature. Reversible carbon segregation is observed on the same crystal surfaces below the Curie poin ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=620202

30. Characterization of Ultrathin Silicon-Oxynitride Films Using Grazing Incidence X-Ray
Published: Date unknown
Authors: E Landree, Terrence J Jach
Abstract: This work describes the use of Grazing Incidence X-ray Photoemission Spectroscopy (GIXPS) to characterize the thickness of a silicon oxynitride ultrathin film. GIXPS utilizes the inherent optical and material properties of the film, along with the a ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831585



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