NIST logo

Publications Portal

You searched on: Author: terrence jach

Displaying records 21 to 30 of 31 records.
Resort by: Date / Title

21. Dynamical Diffraction and X-Ray Standing Waves from Atomic Planes Normal in a Twofold Symmetry Axis of the Quasicrystal A1PdMn
Published: 4/1/1999
Authors: Terrence J Jach, Yanbao Zhang, R. Colella, M. De Boissieu, M. Boudard, A. I. Goldman, T Lograsso, D W Delaney, S. Kycia
Abstract: We have observed dynamical diffraction in the [024024] and[046046] reflections of the icosahedral quasicrystal A1PdMn in the back-reflection geometry ({theta}^dB^ = 90 ). The x-ray fluorescence from the Al and Pd atoms exhibits strong standing w ...

22. Polycapillary X-Ray Optic Spectral Gain and Transmission
Published: 4/1/1999
Authors: J E Gormley, Eric B Steel, Q Xiao, Terrence J Jach
Abstract: Polycapillary x-ray optics are gaining increased attention as their transmission characteristics and manufacturing difficulties are better understood. This paper reports experimental results obtained with an optic that was designed for use with both ...

23. A UHV-Compatible Two-Crystal Monochromator for Synchrotron Radiation
Published: 12/1/1998
Authors: P L Cowan, J B Hastings, Terrence J Jach, J P Kirkland

24. Use of Kirkpatrick-Baez Multilayer Optics for X-Ring Fluorescence Imaging
Published: 7/1/1998
Authors: A S Bakulin, S M Durbin, C Liu, J Erdmann, A T Macrander, Terrence J Jach
Abstract: We discuss the possibilities for using Kirkpatrick-Baez (K-B) multilayer elements to directly image the fluorescence distribution from a specimen under x-ray illumination. X-ray fluorescence would be collected by K-B elements close in contrast to th ...

25. Dynamical Diffraction and X-Ray Standing Waves from 2-Fold Reflections in the Quasicrystal AlPdMn
Published: 1/15/1998
Authors: Terrence J Jach, S. M. Thurgate, Y. Zhang, R. Colella, A. I. Goldman, S. Kycia, M. De Boissieu, M. Boudard

26. An X-Ray Monochromator Crystal Which Detects the Bragg Condition
Published: 5/1/1988
Authors: Terrence J Jach, Donald B. Novotny, G. P. Carver, Jon C Geist, R D Spal

27. Reversible Step Rearrangement and Segregation on Nickel Surfaces at the Curie Temperature
Published: 10/1/1982
Authors: Terrence J Jach, J Hamilton
Abstract: Reversible step period rearrangement and carbon segregation have been observed on clean nickel single-crystal surfaces whose bulk is also relatively free of impurities. These transitions occurred over a temperature range of 35 K at the nickel Curie ...

28. Structural Phase Transitions on Nickel at the Curie Temperature
Published: 3/16/1981
Authors: J Hamilton, Terrence J Jach
Abstract: It is observed that a reversible step period rearrangement on clean nickel single-crystal surfaces occurs in the immediate vicinity of the Curie temperature. Reversible carbon segregation is observed on the same crystal surfaces below the Curie poin ...

29. Characterization of Ultrathin Silicon-Oxynitride Films Using Grazing Incidence X-Ray
Published: Date unknown
Authors: E Landree, Terrence J Jach
Abstract: This work describes the use of Grazing Incidence X-ray Photoemission Spectroscopy (GIXPS) to characterize the thickness of a silicon oxynitride ultrathin film. GIXPS utilizes the inherent optical and material properties of the film, along with the a ...

30. Controllable Catastrophe X-Ray Focusing
Published: Date unknown
Authors: S M Durbin, Terrence J Jach, S. Kim, V. Gopalan
Abstract: The interaction of waves with inhomogeneous media leads to the natural focusing of light, the channelling of waves into stable caustics such as the pattern of sunlight seen at the bottom of a rippled swimming pool. These effects are also found in sur ...

Search NIST-wide:

(Search abstract and keywords)

Last Name:
First Name:

Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series