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Author: nathanael heckert

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31. Dependence Characteristics of Face Recognition Algorithms
Published: 1/1/2002
Authors: Andrew L Rukhin, Patrick J Grother, P Jonathon Phillips, Stefan D Leigh, E M Newton, Nathanael A Heckert
Abstract: Nonparametric statistics for quantifying dependence between the output rankings of face recognition algorithms are described. Analysis of the archived results of a large face recognition study shows that even the better algorithms exhibit significan ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=51048

32. Transformation, Ranking, and Clustering for Face Recognition Algorithm Performance
Published: 1/1/2002
Authors: Stefan D Leigh, Nathanael A Heckert, Andrew L Rukhin, P Jonathon Phillips, Patrick J Grother, E M Newton, M Moody, K Kniskern, S Heath
Abstract: The performance of face recognition algorithms is recently of increased interest, although to date empirical analyses of algorithms have been limited to rank-based scores such a cumulative match score and receiver operating characteristic. This pape ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=151783

33. A Statistical Test Suite for Random and Pseudorandom Number Generators for Cryptographic Applications
Series: Special Publication (NIST SP)
Report Number: 800-22
Published: 10/1/2000
Authors: Andrew L Rukhin, Juan Soto, James R Nechvatal, Miles E. Smid, Elaine B Barker, Stefan D Leigh, M Levenson, M Vangel, D L. Banks, Nathanael A Heckert, James F Dray Jr, S C. Vo
Abstract: This paper discusses some aspects of selecting and testing random and pseudorandom number generators. The outputs of such generators may be used in many cryptographic applications, such as the generation of key material. Generators suitable for use ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=151222

34. Statistical Analysis of Partial Discharge Phenomena - Time of Occurrence Distributions
Published: 10/1/1998
Authors: X. Han, Nathanael A Heckert, James J Filliben, Yicheng Wang
Abstract: This paper presents time-of-occurrence (phase) distributions of individual pulsating partial discharges (PDs) which occur in a point-dielectric gap in air for ac voltage conditions. It is determined that the pulse phase distribution is adequately mo ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=13362



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