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Author: leonard hanssen

Displaying records 31 to 40 of 150 records.
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31. Algorithmic Model of Microfacet BRDF for Monte Carlo Calculation of Optical Radiation Transfer
Published: 8/1/2003
Authors: A Prokhorov, Leonard M Hanssen
Abstract: An algorithmic model of bi-directional reflectance distribution function (BRDF) based on the ray optics approximation and microfacet model of randomly rough surface is proposed. Its central idea is that for every incident ray, the normal vector to t ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841990

32. Monte Carlo Modeling of an Integrating Sphere Reflectometer
Published: 7/1/2003
Authors: A Prokhorov, Sergey Mekhontsev, Leonard M Hanssen
Abstract: The Monte Carlo method has been applied to numerical modeling of an integrating sphere designed for hemispherical-directional reflectance factor measurements. It is shown that a conventional algorithm of inverse ray tracing used for estimation of ch ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841638

33. Algorithmic Model of Microfacet BRDF For Monte Carlo Calculation of Optical Radiation Transfer
Published: 1/1/2003
Authors: Leonard M Hanssen, Alexander Prokhorov
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=103843

34. Emissivity Modeling of Thermal Radiation Sources With Concentric Grooves
Published: 1/1/2003
Authors: Leonard M Hanssen, Sergey Mekhontsev, Alexander Prokhorov
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=103841

35. Evaluation of Performance of Integrating Spheres For Indirect Emittance Measurement, ed. by B. Fellmuth, J. Seidel, and G. Scholz
Published: 1/1/2003
Authors: Leonard M Hanssen, Sergey Mekhontsev, Alexander Prokhorov
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=104517

36. Fourier Transform System for Characterization of Infrared Spectral Emittance of Materials, ed. by B. Fellmuth, J. Seidel, and G. Scholz
Published: 1/1/2003
Authors: Leonard M Hanssen, Simon Grant Kaplan, Sergey Mekhontsev
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=104518

37. Linearity Characterization of NIST's Infrared Regular Transmittance and Reflectance Scales
Published: 1/1/2003
Authors: Leonard M Hanssen, Simon Grant Kaplan
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=103844

38. Linearity Characterization of NIST's Infrared Spectral Regular Transmittance and Reflectance Scales
Published: 1/1/2003
Authors: Leonard M Hanssen, Simon Grant Kaplan
Abstract: System Linearity is a fundamental characterization performed on spectrophotometers. Yet it is one that is not adequately performed on Fourier transform instruments, because of the lack of a method for linearity characterization that will work suffici ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841636

39. Low Scatter Optical System For Emittance and Temperature Measurements
Published: 1/1/2003
Authors: Leonard M Hanssen, Sergey Mekhontsev
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=104516

40. Monte Carlo Modeling of an Integrating Sphere Reflectometer
Published: 1/1/2003
Authors: Leonard M Hanssen, Sergey Mekhontsev, Alexander Prokhorov
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=103845



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