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You searched on: Author: leonard hanssen

Displaying records 31 to 40 of 164 records.
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31. SRM 2036 Near Infrared Reflection Wavelength Standard
Published: 11/1/2005
Authors: David Lee Duewer, Steven J Choquette, Leonard M Hanssen, E A. Early

32. Infrared Emittance Measurements at NIST
Published: 10/5/2005
Authors: Leonard M Hanssen, Benjamin K Tsai, Sergey Mekhontsev
Abstract: A new capability for the measurement of the temperature-dependent emittance of specular samples in the near infrared spectral region has been developed in NIST s Infrared Spectrophotometry Laboratory to provide emittance measurements and standards fo ...

33. Comparison of direct and indirect methods of spectral infrared emittance measurement, ed. by D. Zvizdic
Published: 1/1/2005
Authors: Leonard M Hanssen, Alexander Prokhorov, V B Khromchenko, Sergey Mekhontsev

34. Emissivity evaluation of fixed point blackbodies, ed. by D. Zvizdic
Published: 1/1/2005
Authors: Sergey Mekhontsev, V B Khromchenko, Alexander Prokhorov, Leonard M Hanssen

35. Emittance standards for improved radiation thermometry during thermal processing of silicon materials, ed. by D. Zvizdic
Published: 1/1/2005
Authors: Benjamin K Tsai, D P DeWitt, E A. Early, Leonard M Hanssen, Sergey Mekhontsev, Matthias Rink, K G Kreider, B J Lee, Z M Zhang

36. Near infrared indirect emissivity measurements and system employing a vacuum goniometer, ed. by D. Zvizdic
Published: 1/1/2005
Authors: Matthias Rink, V B Khromchenko, Sergey Mekhontsev, Leonard M Hanssen

37. Optical Diagnostics
Published: 1/1/2005
Authors: Leonard M Hanssen, P V Farrell

38. Standard Reference Material 2036 Near-Infrared Reflection Wavelength Standard
Published: 1/1/2005
Authors: S J Choquette, Leonard M Hanssen, E A. Early

39. Emissivity Modeling of Thermal Radiation Sources With Concentric Grooves
Published: 7/1/2004
Authors: A Prokhorov, Sergey Mekhontsev, Leonard M Hanssen
Abstract: Monte Carlo based specialized software has been applied to the statistical modeling of effective emissivity of radiators with concentric grooves of trapezoidal and triangular profile. A specular-diffuse model is used in which the thermal emission fr ...

40. Emittance Standards for Improved Radiation Thermometry During Thermal Processing of Silicon Materials
Published: 6/22/2004
Authors: Benjamin K Tsai, D P DeWitt, E A. Early, Leonard M Hanssen, Sergey Mekhontsev, Matthias Rink, Kenneth Gruber Kreider, B J Lee, Zhuomin Zhang

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