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Author: william guthrie

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71. MCMC in StRD
Published: Date unknown
Authors: Hung-Kung Liu, William F Guthrie, D Malec, Grace L Yang
Abstract: The numerical inaccuracies caused by floating point arithmetic, although often not important, can change the conclusions of an analysis. Computational accuracy is of increasing concern because the number of software packages has exploded as computer ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=151788

72. Open-Source Excel Tools For Statistical Metrology
Published: Date unknown
Authors: Hung-Kung Liu, William F Guthrie, Juan Soto
Abstract: In this paper we introduce an approach to construct statistical metrology tools with a Microsoft Excel based interface that use the open source statistical package R as the computational engine. These metrology tools will enable Excel users to access ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=150668

73. Troubleshooting Key Comparisons
Published: Date unknown
Authors: Adriana Hornikova, William F Guthrie
Abstract: Key Comparisons are international inter-laboratory studies used to establish the degree of equivalence between national measurement standards. These studies, carried out by National Metrology Institutes, are time-consuming, but necessary to facilitat ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=50863

74. k=2 and Other Sometimes Hidden Assumptions in Chemical Measurement Uncertainty Intervals
Published: Date unknown
Authors: David Lee Duewer, S LR Ellison, William F Guthrie, D B Hibbert, C Jackson, A Kallner, Stefan D Leigh, Reenie M. Parris, Kenneth W Pratt, Michele M Schantz, Katherine E Sharpless
Abstract: A recent interlaboratory study that required individual analysts to estimate uncertainty intervals for their results revealed that some experienced chemical analysts have difficulty with measurement uncertainty calculations. To help validate assumpti ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=832153