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Author: william guthrie

Displaying records 71 to 77.
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71. Recent Developments in Electrical Linewidth and Overlay Metrology for Integrated Circuit Fabrication Processes
Published: 12/31/1996
Authors: Michael W Cresswell, J. J. Sniegowski, Rathindra Ghoshtagore, Richard A Allen, William F Guthrie, A. W. Gurnell, Loren W. Linholm, E Clayton Teague
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=27620

72. A Gravimetric Approach to the Standard Addition Method in Instrumental Analysis 1
Published: Date unknown
Authors: William R. Kelly, Bruce S MacDonald, William F Guthrie
Abstract: A general mathematical formulation for the method of standard additions is presented that has universal applicability. It is based on gravimetry rather than volumetry which reduces the preparation time, gives greater flexibility to design because on ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=832173

73. A Survey of Key Comparisons A Survey of Design, Analysis, and Reporting of Results in Key Comparisons
Published: Date unknown
Authors: Adriana Hornikova, William F Guthrie
Abstract: Key comparisons are international inter-laboratory studies used to establish the degree of equivalence between national measurement standards. These studies, carried out by National Metrology Institutes (NMIs), are time-consuming, but necessary to fa ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=50656

74. Determination of Sulfur in Biodiesel by XRF Using the Gravimetric Standard Addition Method
Published: Date unknown
Authors: Lydia Baker, William R. Kelly, William F Guthrie
Abstract: The sulfur content of three biodiesels samples was determined XRF using a calibration curve based on petroleum-based diesel SRMs and by the standard addition method using a high sulfur diesel fuel SRM as the spike. Biodiesel contains about 11 % oxyg ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=832183

75. MCMC in StRD
Published: Date unknown
Authors: Hung-Kung Liu, William F Guthrie, D Malec, Grace L Yang
Abstract: The numerical inaccuracies caused by floating point arithmetic, although often not important, can change the conclusions of an analysis. Computational accuracy is of increasing concern because the number of software packages has exploded as computer ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=151788

76. Open-Source Excel Tools For Statistical Metrology
Published: Date unknown
Authors: Hung-Kung Liu, William F Guthrie, Juan Soto
Abstract: In this paper we introduce an approach to construct statistical metrology tools with a Microsoft Excel based interface that use the open source statistical package R as the computational engine. These metrology tools will enable Excel users to access ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=150668

77. Troubleshooting Key Comparisons
Published: Date unknown
Authors: Adriana Hornikova, William F Guthrie
Abstract: Key Comparisons are international inter-laboratory studies used to establish the degree of equivalence between national measurement standards. These studies, carried out by National Metrology Institutes, are time-consuming, but necessary to facilitat ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=50863



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