NIST logo

Publications Portal

You searched on:
Author: william guthrie

Displaying records 11 to 20 of 77 records.
Resort by: Date / Title


11. Comparison of SEM and HRTEM CD Measurements Extracted from Test-Structures Having Feature Linewidths from 40 nm to 240 nm
Published: 1/1/2008
Authors: Michael W Cresswell, Richard A Allen, William F Guthrie, Christine E. Murabito, Ronald G Dixson, Amy Hunt
Abstract: CD (Critical Diminsion) measurements have been extracted from SEM (Scanning Electron Microscopy) and HRTEM (High Resolution Transmission Electron Microscopy) images of the same set of monocrystalline silicon features having linewidths between 40 nm a ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=32240

12. Nano- and Atomic-Scale Length Metrology
Published: 12/14/2007
Authors: Theodore Vincent Vorburger, Ronald G Dixson, Joseph Fu, Ndubuisi George Orji, Shaw C Feng, Michael W Cresswell, Richard A Allen, William F Guthrie, Wei Chu
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=824603

13. Interlaboratory Comparisons
Published: 12/10/2007
Author: William F Guthrie
Abstract: An interlaboratory comparison for a measurement procedure is an exercise carried out by a group of laboratories to compare their performance or assess a measurement standard. Interlaboratory comparisons are typically used for one of three main purpos ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=51102

14. Development of Certified Reference Materials of Ion-Implanted Dopants in Silicon for Calibration of Secondary Ion Mass Spectrometers
Published: 11/1/2007
Authors: Robert G Downing, David S Simons, George Paul Lamaze, Richard Mark Lindstrom, Robert Russ Greenberg, Rick L Paul, Susannah B. Schiller, William F Guthrie
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=904275

15. Effect of Static Analysis Tools on Software Security: Preliminary Investigation
Published: 10/29/2007
Authors: Vadim Okun, William F Guthrie, Romain Gaucher, Paul E Black
Abstract: Static analysis tools can handle large-scale software and find thousands of defects. But do they improve software security? We evaluate the effect of static analysis tool use on software security in open source projects. We measure security by vulner ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=51237

16. Single Crystal Critical Dimension Reference Materials (SCCDRM): Process Optimization for the Next Generation of Standards
Published: 4/5/2007
Authors: Ronald G Dixson, William F Guthrie, Michael W Cresswell, Richard A Allen, Ndubuisi George Orji
Abstract: Critical dimension atomic force microscopes (CD-AFMs) are rapidly gaining acceptance in semiconductor manufacturing metrology.  These instruments offer non-destructive three dimensional imaging of structures and can provide a valuable complement ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=823219

17. Development of Certified Reference Materials of Ion-Implanted Dopants in Silicon for Calibration of Secondary Ion Mass Spectrometers
Published: 1/1/2007
Authors: David S Simons, Robert G Downing, George Paul Lamaze, Richard Mark Lindstrom, Robert Russ Greenberg, Rick L Paul, Susannah Schiller, William F Guthrie
Abstract: Certified reference materials have been developed for calibration of the concentrations of the most common dopants used in silicon semiconductor technology boron, arsenic, and phosphorus. These materials consist of a single dopant species that is ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831437

18. Calcium Phosphate Cement With Non-Rigidity and Strength Durability for Periodontal Bone Repair
Published: 8/1/2006
Authors: Hockin D. Xu, Shozo Takagi, Limin Sun, L A Hussain, Laurence Chung Lung Chow, William F Guthrie, James H Yen
Abstract: Background. The need for biomaterials to treat periodontal osseous defects has increased as the world population ages. The objective of the present study was to develop a self-hardening, resorbable, and mech/anically strong calcium phosphate cement ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=852519

19. Certification of SRM 114q: Part I
Series: Special Publication (NIST SP)
Report Number: 260-161
Published: 6/14/2006
Authors: Chiara F Ferraris, William F Guthrie, A Aviles, Robin K Haupt, Bruce S MacDonald
Abstract: The standard reference material (SRM) for fineness of cement, SRM 114, is an integral part of the calibration material routinely used in the cement industry to qualify cements. Being a powder, the main physical properties of cement, prior to hydratio ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=860624

20. Certification of SRM 114q: Part II
Series: Special Publication (NIST SP)
Report Number: 260-166
Published: 6/14/2006
Authors: Chiara F Ferraris, Max A Peltz, William F Guthrie, A Aviles, Robin K Haupt, Bruce S MacDonald
Abstract: The standard reference material (SRM) for fineness of cement, SRM 114, is an integral part of the calibration material routinely used in the cement industry to qualify cements. Being a powder, the main physical properties of cement, prior to hydratio ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=860657



Search NIST-wide:


(Search abstract and keywords)


Last Name:
First Name:







Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series