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You searched on: Author: william guthrie

Displaying records 11 to 20 of 83 records.
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11. Performance of New and Aged Residential Fire Sprinklers
Series: Technical Note (NIST TN)
Report Number: 1702
Published: 8/31/2011
Authors: Anthony D Putorti Jr., William F Guthrie, Jason D Averill, Richard George Gann
Abstract: The U.S. Consumer Product Safety Commission (CPSC) initiated a program to determine the effects of emissions from problem drywall on residential electrical, gas distribution, and fire safety components. As part of this program, the National Institut ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908556

12. Origin and Early History of Die Methode des Eichzusatzes or The Method of Standard Addition with Primary Emphasis on Its Origin, Early Design, Dissemination, and Usage of Terms
Published: 6/1/2011
Authors: William R. Kelly, Kenneth W Pratt, William F Guthrie, Keith R Martin
Abstract: The Method of Standard Additions or the Standard Addition Method, often referred by its acronym as just SAM, is now a proverbial workhorse in both inorganic and organic quantitative analytical chemistry and in related disciplines such as geochemistry ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=904911

13. Performance of New and Aged Residential Fire Smoke Detectors
Series: Technical Note (NIST TN)
Report Number: 1691
Published: 4/1/2011
Authors: Jason D Averill, Richard George Gann, William F Guthrie, Daniel Murphy
Abstract: As part of the Consumer Product Safety Commission (CPSC) technical staff program to determine the effects of emissions from imported drywall on residential electrical, gas distribution, and fire safety components, the National Institute of Standards ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908100

14. Nodal Analysis Estimates of Fluid Flow from the BP Macondo MC252 Well
Published: 3/10/2011
Authors: George Guthrie, Rajesh Pawar, Curt Oldenburg, Todd Weisgraber, Grant Bromhal, Phil Gauglitz, John Bernardin, David Dixon, Rick Kapernick, Bruce Letellier, Brett Okhuysen, Robert Reid, Barry M Freifeld, Karsten Pruess, Lehua Pan, Stefan Finsterle, George J Moridis, Matthew T Reagan, Thomas A Buscheck, Christopher M Spadaccini, Roger D Aines, Brian Anderson, Robert Enick, Roy Long, Shahab Mohaghegh, Bryan Morreale, Neal Sams, Doug Wyatt, L A Mahoney, J A Bamberger, J Blanchard, J Bontha, C W Enderlin, J A Fort, P A Meyer, Y Onishi, D M Pfund, D R Rector, M L Stewart, B E Wells, S T Yokuda, Antonio M Possolo, William F Guthrie, Pedro I Espina
Abstract: The Nodal-Analysis Team within the Flow Rate Technical Group predicted the flow-related pressure drops from the reservoir to release points to estimate flow rates for various time periods for the Macondo well. These estimates were based on predictio ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908725

15. Interlaboratory Study of Alternate Filter Papers for Use in ASTM E 2187
Series: Technical Note (NIST TN)
Report Number: 1649
Published: 12/11/2009
Authors: Richard George Gann, William F Guthrie
Abstract: ASTM E 2187 has become the internationally referenced standard for designing and specifying less fire-prone cigarettes. In this test method, a lit cigarette is laid on multiple layers of filter paper, and the observer identifies whether the cigarett ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=904159

16. Three Statistical Paradigms for the Assessment and Interpretation of Measurement Uncertainty
Published: 1/12/2009
Authors: William F Guthrie, Hung-Kung Liu, Andrew L Rukhin, Blaza Toman, Chih-Ming Wang, Nien F Zhang
Abstract: The goals of this chapter are to present different approaches to uncertainty assessment from a statistical point of view and to relate them to the methods that are currently being used in metrology or are being developed within the metrology communit ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=51273

17. Comparison of SEM and HRTEM CD Measurements Extracted from Test-Structures Having Feature Linewidths from 40 nm to 240 nm
Published: 1/1/2008
Authors: Michael W. Cresswell, Richard A Allen, William F Guthrie, Christine E. Murabito, Ronald G Dixson, Amy Hunt
Abstract: CD (Critical Diminsion) measurements have been extracted from SEM (Scanning Electron Microscopy) and HRTEM (High Resolution Transmission Electron Microscopy) images of the same set of monocrystalline silicon features having linewidths between 40 nm a ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=32240

18. Nano- and Atomic-Scale Length Metrology
Published: 12/14/2007
Authors: Theodore Vincent Vorburger, Ronald G Dixson, Joseph Fu, Ndubuisi George Orji, Shaw C Feng, Michael W. Cresswell, Richard A Allen, William F Guthrie, Wei Chu
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=824603

19. Interlaboratory Comparisons
Published: 12/10/2007
Author: William F Guthrie
Abstract: An interlaboratory comparison for a measurement procedure is an exercise carried out by a group of laboratories to compare their performance or assess a measurement standard. Interlaboratory comparisons are typically used for one of three main purpos ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=51102

20. Development of Certified Reference Materials of Ion-Implanted Dopants in Silicon for Calibration of Secondary Ion Mass Spectrometers
Published: 11/1/2007
Authors: Robert G Downing, David S Simons, George Paul Lamaze, Richard Mark Lindstrom, Robert Russ Greenberg, Rick L. Paul, Susannah B. Schiller, William F Guthrie
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=904275



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