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Author: david gundlach

Displaying records 11 to 20 of 63 records.
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11. Determination of graphene work function and graphene-insulator-semiconductor band alignment by internal photoemission spectroscopy
Published: 7/11/2012
Authors: Rusen Yan, Qin Q. Zhang, Wei Li, Irene G. Calizo, Tian T. Shen, Curt A Richter, Angela R Hight Walker, Xuelei X. Liang, David J Gundlach, Nhan V Nguyen, Huili Grace Xing, Alan Seabaugh
Abstract: We determined the band alignment of a graphene-oxide-silicon structure using internal photoemission spectroscopy. From the flatband voltage and Dirac voltage we infer a 4.3  10e11 cm-2 negative extrinsic charge present on the graphene surface. Als ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=911396

12. Measuring domain sizes and compositional heterogeneities in P3HT-PCBM bulk heterojunction thin films with 1H spin diffusion NMR spectroscopy
Published: 3/21/2012
Authors: Ryan C Nieuwendaal, Hyun W. Ro, David Germack, Regis J Kline, Calvin Chan, Amit Kumar Agrawal, David J Gundlach, David Lloyd VanderHart, Dean M DeLongchamp
Abstract: In this manuscript we show that 1H spin diffusion NMR is a valuable method for estimating the domain sizes in thin films of a polymer-fullerene blend for bulk heterojunction (BHJ) photovoltaics. Variations in common BHJ film processing parameters hav ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908099

13. Flip Chip Lamination to electrically contact organic single crystals on flexible substrates
Published: 4/20/2011
Authors: Oana Jurchescu, Brad Conrad, Christina Ann Hacker, David J Gundlach, Curt A Richter
Abstract: The fabrication of top metal contacts for organic electronics represents a challenge and has important consequences for electrical properties of such systems. We report a low cost and non-destructive printing process, Flip Chip Lamination (FCL), to f ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907524

14. Controlling the Microstructure of Solution-Processible Small Molecules in Thin-Film Transistors through Substrate Chemistry
Published: 2/4/2011
Authors: Regis J Kline, Steven D Hudson, Xinran Zhang, David J Gundlach, Andrew Moad, Lee J Richter, Oana Jurchescu, Thomas Jackson, Sanker Subramanian, John E Anthony, Michael F. Toney
Abstract: Solution-processible small molecules have tremendous potential for providing both high charge carrier mobility and low cost processing. This study outlines a detailed microstructural study of the effect of substrate chemistry on fluorinated 5,11-bis ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=906810

15. Mapping Crystal Orientation in High Performance Thienothiophene Copolymer Thin Films
Published: 12/8/2010
Authors: Xinran Zhang, Steven D Hudson, Dean M DeLongchamp, David J Gundlach, Martin Heeney, Iain McCulloch
Abstract: Mapping of crystalline grain orientation for solution-processed semiconducting polymer thin films is key to understanding charge transport in electronic devices based on them and yet challenging. In this work, a high mobility thienothiophene copolyme ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=903893

16. Thermo-Magneto-Electrical Measurement Platform
Published: 10/19/2010
Authors: Kurt Pernstich, Curt A Richter, David J Gundlach
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907222

17. Characterization of a Soluble Anthradithiophene Derivative
Published: 10/1/2010
Authors: Brad Conrad, Calvin Chan, Marsha A. Loth, Sean R Parkin, Xinran Zhang, John E Anthony, David J Gundlach
Abstract: The structural and electrical properties of a new solution processable material, 2,8-diflouro-5,11-tert-butyldimethylsilylethynl anthradithiophene (TBDMS), were measured for single crystal and spun cast thin-film transistors. TBDMS is observed to rea ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905704

18. In-plane liquid Crystalline Texture of High Performance Thienothiophene Copolymer Thin Films
Published: 9/23/2010
Authors: Xinran Zhang, Steven D Hudson, Dean M DeLongchamp, David J Gundlach, Martin Heeney, Iain McCulloch
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907178

19. Why Contacts Matter
Published: 7/7/2010
Authors: David J Gundlach, Y. Li, D. A. Zhou, D A Mourey, Thomas Jackson
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907164

20. Probing Stress Effects in Single Crystal Organic Transistors by Scanning Kelvin Probe Microscopy
Published: 6/23/2010
Authors: LC Teague, Oana Jurchescu, Curt A Richter, Sankar Subramanian, John E Anthony, Thomas Jackson, David J Gundlach, James G. Kushmerick
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907141



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