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Author: david gundlach

Displaying records 11 to 20 of 60 records.
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11. Controlling the Microstructure of Solution-Processible Small Molecules in Thin-Film Transistors through Substrate Chemistry
Published: 2/4/2011
Authors: Regis J Kline, Steven D Hudson, Xinran Zhang, David J Gundlach, Andrew Moad, Lee J Richter, Oana Jurchescu, Thomas Jackson, Sanker Subramanian, John E Anthony, Michael F. Toney
Abstract: Solution-processible small molecules have tremendous potential for providing both high charge carrier mobility and low cost processing. This study outlines a detailed microstructural study of the effect of substrate chemistry on fluorinated 5,11-bis ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=906810

12. Mapping Crystal Orientation in High Performance Thienothiophene Copolymer Thin Films
Published: 12/8/2010
Authors: Xinran Zhang, Steven D Hudson, Dean M DeLongchamp, David J Gundlach, Martin Heeney, Iain McCulloch
Abstract: Mapping of crystalline grain orientation for solution-processed semiconducting polymer thin films is key to understanding charge transport in electronic devices based on them and yet challenging. In this work, a high mobility thienothiophene copolyme ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=903893

13. Thermo-Magneto-Electrical Measurement Platform
Published: 10/19/2010
Authors: Kurt Pernstich, Curt A Richter, David J Gundlach
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907222

14. Characterization of a Soluble Anthradithiophene Derivative
Published: 10/1/2010
Authors: Brad Conrad, Calvin Chan, Marsha A. Loth, Sean R Parkin, Xinran Zhang, John E Anthony, David J Gundlach
Abstract: The structural and electrical properties of a new solution processable material, 2,8-diflouro-5,11-tert-butyldimethylsilylethynl anthradithiophene (TBDMS), were measured for single crystal and spun cast thin-film transistors. TBDMS is observed to rea ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905704

15. In-plane liquid Crystalline Texture of High Performance Thienothiophene Copolymer Thin Films
Published: 9/23/2010
Authors: Xinran Zhang, Steven D Hudson, Dean M DeLongchamp, David J Gundlach, Martin Heeney, Iain McCulloch
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907178

16. Why Contacts Matter
Published: 7/7/2010
Authors: David J Gundlach, Y. Li, D. A. Zhou, D A Mourey, Thomas Jackson
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907164

17. Probing Stress Effects in Single Crystal Organic Transistors by Scanning Kelvin Probe Microscopy
Published: 6/23/2010
Authors: LC Teague, Oana Jurchescu, Curt A Richter, Sankar Subramanian, John E Anthony, Thomas Jackson, David J Gundlach, James G. Kushmerick
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907141

18. Compact and Distributed Modeling of Cryogenic Bulk MOSFET Operation
Published: 6/1/2010
Authors: Akin Akturk, M. Holloway, S. Potbhare, David J Gundlach, B Li, Neil Goldsman, M Peckerar, Kin P Cheung
Abstract: We have developed compact and physics-based distributed numerical models for cryogenic bulkMOSFET operation down to 20 K to advance simulation and first-pass design of device and circuit operation at low temperatures. To achieve this, we measured and ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907042

19. Probing Stress Effects in Single Crystal Organic Transistors by Scanning Kelvin Probe Microscopy
Published: 5/1/2010
Authors: L C Teague, Oana Jurchescu, Curt A Richter, Sanker Subramanian, John E Anthony, Thomas Jackson, David J Gundlach, James Kushmerick
Abstract: We report scanning Kelvin probe microscopy SKPM of single crystal difluoro bistriethylsilylethynyl anthradithiophene diF-TESADT organic transistors. SKPM provides a direct measurement of the intrinsic charge transport in the crystals independent of c ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907043

20. Using Interfacial Chemistry to Improve the Performance of Organic Semiconductor Devices
Published: 4/28/2010
Author: David J Gundlach
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907165



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