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Author: ulf griesmann
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1. A Simple Ball Averager for Reference Sphere Calibrations
Published: 1/1/2005
Authors: Ulf Griesmann, Quandou Wang, Johannes A Soons, Remi Carakos
Abstract: When measuring the form errors of precision optics with an interferometer, the calibration of the reference wavefront is of central importance.  Ball averaging, or random ball testing, has in recent years emerged as a robust method for calibrati ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=822303

2. A Toolbox for Designing and Analyzing Phase-Shifting Interferometry Algorithms with Characteristic Polynomials
Published: 6/13/2010
Author: Ulf Griesmann
Abstract: Many of the recent advances in understanding of phase-shifting algorithms have yet to be incorporated into the software for commercial phase shifting interferometers. A toolbox, for the open-source computer algebra system Maxima, simplifies analysis ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905043

3. A modified Roberts-Langenbeck test for measuring thickness and refractive index variation of silicon wafers
Published: 8/17/2012
Authors: Jungjae Park, Lingfeng Chen, Quandou Wang, Ulf Griesmann
Abstract: We describe a method to simultaneously measure thickness variation and refractive index homogeneity of 300 mm diameter silicon wafers using a wavelength shifting Fizeau interferometer operating at 1550 nm. Only three measurements are required, corres ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=911565

4. A versatile bilayer resist for laser lithography at 405 nm on glass substrates
Published: 10/23/2013
Authors: Quandou Wang, Ulf Griesmann
Abstract: We describe a simple bilayer photoresist that is particularly well suited for laser lithography at an exposure wavelength of 405 nm on glass substrates, which is often used for the fabrication of binary diffractive optics and computer generated holog ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913532

5. Absolute Refractive Indices and Thermal Coefficients of CaF^d2^, SrF^d2^, BaF^d2^, and LiF Near 157 nm
Published: 5/1/2002
Authors: Ulf Griesmann, J H Burnett, R Gupta
Abstract: We present accurate measurements near 157 nm of the absolute index of refraction, the index dispersion, and the temperature dependence of the index, for the cubic-symmetry, ultraviolet optical materials CaF^d2^, SrF^d2^, BaF^d2^, and LiF. Accurate va ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=822086

6. Absolute Refractive Indices and Thermal Coefficients of CaF^d2^, SrF^d2^, BaF^d2^, and LiF Near 157 nm
Published: 5/1/2002
Authors: John H. Burnett, R Gupta, Ulf Griesmann
Abstract: We present accurate measurements near 157 nm of the absolute index of refraction, the index dispersion, and the temperature dependence of the index, for the cubic-symmetry, ultraviolet optical materials CaF^d2^, SrF^d2^, BaF^d2^, and LiF. Accurate v ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=840544

7. Absolute Refractive Indices and Thermal Coefficients of Fused Silica and Calcium Fluoride Near 193 nm
Published: 9/1/1998
Authors: John H. Burnett, Ulf Griesmann, M Walhout, J L Dehmer, J R Roberts, R Gupta
Abstract: The refractive indices of several fused silica and calcium fluoride samples from different suppliers were measured with the minimum deviation method in the deep UV between 191 and 196 nm with a standard uncertainty of 7 ppm. For both materials the d ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=840308

8. Absolute Transition Rates for Transitions From 5p Levels in Kr II
Published: 3/1/2001
Authors: Krzysztof Dzierzega, Ulf Griesmann, Gillian Nave, L Bratasz
Abstract: Branching ratios were measured for 155 electric dipole transitions from 5p and 5p1 levels of singly ionized Kr between 200 nm and 2400 nm. Of these, 83 were measured for the first time. Absolute transition rates for prominent lines, with uncertaint ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=840467

9. Absolute interferometric tests of spherical surfaces based on rotational and translational shears
Published: 9/13/2012
Authors: Johannes A Soons, Ulf Griesmann
Abstract: Traceability of interferometric form measurements requires characterization of the reference wavefront. We investigate absolute tests for spherical surfaces where the form errors of both reference and test surface are estimated by minimizing the diff ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=911749

10. Accurate Lifetimes and Absolute Transition Rates for Ultraviolet Transitions From 3d^u5^ (^u4^G) 4p and 3d^u5^ (^u4^P) 4p levels in Mn II
Published: 5/1/2001
Authors: R Kling, R Schnabel, Ulf Griesmann
Abstract: A novel laser-induced fluorescence technique was used to measure lifetimes of 14 3d5 (4G) 4p and 3d5(4P) 4p levels in the Mn+ ion. Branching fractions for electric dipole transitions from these levels were measured with a vacuum ultraviolet Fourier ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=840473



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  • SP 250-XX: Calibration Services
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