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Author: ulf griesmann

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41. Accurate f-Values for Ultraviolet Transitions From the 3d^u5^ (^u6^S) 4p Levels in Mn II
Published: 3/1/2000
Authors: R Kling, Ulf Griesmann
Abstract: We have measured branching fractions for ultraviolet electric dipole transitions from upper levels belonging to the 3d^u5^(^u6^S)4p^u5^P and 3d^u5^ (^u6^S)4p^u7^P terms of Mn II. The levels were excited in a hollow cathode lamp and the spectra were ...

42. Refractivity of Nitrogen Gas in the Vacuum Ultraviolet
Published: 12/1/1999
Authors: Ulf Griesmann, John H. Burnett
Abstract: We have measured the refractivity of nitrogen gas in the ultraviolet and vacuum ultraviolet using a Fourier transform spectrometer. A new two-term Sellmeier formula for the standard refractivity between 145 nm and 270 nm is derived.

43. Absolute Refractive Indices and Thermal Coefficients of Fused Silica and Calcium Fluoride Near 193 nm
Published: 9/1/1998
Authors: John H. Burnett, Ulf Griesmann, M Walhout, J L Dehmer, J R Roberts, R Gupta
Abstract: The refractive indices of several fused silica and calcium fluoride samples from different suppliers were measured with the minimum deviation method in the deep UV between 191 and 196 nm with a standard uncertainty of 7 ppm. For both materials the d ...

44. Atomic Oscillator Strengths in the Vacuum Ultraviolet using Fourier Transform and Grating Spectroscopy
Published: Date unknown
Authors: Gillian Nave, Zhigang Li, Craig J Sansonetti, Ulf Griesmann, Alexander Fried
Abstract: We describe our program to measure branching fractions of Fe II in the vacuum ultraviolet. Branching ratios above 1400 are measured using Fourier transform spectroscopy of hollow cathode and Penning discharge sources. The spectra are radiometrica ...

45. Index of Retraction and its Temperature Dependence of Calcium Fluoride Near 157nm
Published: Date unknown
Authors: John H. Burnett, Ulf Griesmann, R Gupta, T E Jou
Abstract: We have made accurate measurements near 157 nm of the relative index of refraction, its dispersion, and its temperature dependence for two grades of calcium fluoride in N^d2^ gas. Accurate measurements of the quantitites are needed for the design of ...

46. Manufacture of Extremely Flat 300 mm Silicon Wafers
Published: Date unknown
Authors: Marc Tricard, Paul Dumas, Christopher Hall, Ulf Griesmann, Quandou Wang
Abstract: The flatness requirement for silicon wafers at the exposure site will be lower than 50 nm by 2010 and may be as low as 25nm by 2015 (TRS 2005).  This creates new challenges for both wafer polishing and metrology tools capable of meeting the spec ...

47. Measurements of Refraction in the Deep and Vacuum Ultraviolet Uusing the Minimum Deviation Method
Published: Date unknown
Authors: John H. Burnett, R Gupta, Ulf Griesmann
Abstract: We discuss a procedure to make accurate measurements of the index of refraction, its dispersion, and its temperature dependence, in the deep ultraviolet (near 193 nm), using precision goniometric spectrometers and the minimum deviation method. Measur ...

48. Modal Reconstruction of Aspheric Surfaces From Experimental Second Derivatives
Published: Date unknown
Authors: Nadia Machkour-Deshayes, Byoung Chang Kim, Robert S. Polvani, Ulf Griesmann
Abstract: A method for the measurement of precise aspheric optical surfaces based on measurements of the second derivatives of the surface is evaluated. A compact phase-measuring interferometer is used to determine the second derivatives of a surface on a surv ...

49. The NIST FT 700 Vacuum Ultraviolet Fourier Transform Spectrometer: Applications in Ultraviolt Spectrometry and Radiometry
Published: Date unknown
Authors: Ulf Griesmann, R Kling, John H. Burnett, L Bratasz
Abstract: In the minds of many, Fourier transform spectrometry is restricted to applications in the infrared. In the ultraviolet, the increasingly severe demands on optical, data acquisition, and motion control systems of the interferometer diminish the effec ...

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