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Author: ulf griesmann

Displaying records 31 to 40 of 49 records.
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31. Atomic Oscillator Strengths by Emission Spectroscopy and Lifetime Measurements
Published: 5/3/2002
Authors: Ulf Griesmann, J Kling, J Musielok
Abstract: A series of atomic oscillator strengths measurements was carried out in the last seven years at NIST with a combination of emission spectroscopy and lifetime measurements. Several light elements, specifically C, N, O, F and Ne, and two medium-heavy e ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=822076

32. Absolute Refractive Indices and Thermal Coefficients of CaF^d2^, SrF^d2^, BaF^d2^, and LiF Near 157 nm
Published: 5/1/2002
Authors: Ulf Griesmann, J H Burnett, R Gupta
Abstract: We present accurate measurements near 157 nm of the absolute index of refraction, the index dispersion, and the temperature dependence of the index, for the cubic-symmetry, ultraviolet optical materials CaF^d2^, SrF^d2^, BaF^d2^, and LiF. Accurate va ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=822086

33. Absolute Refractive Indices and Thermal Coefficients of CaF^d2^, SrF^d2^, BaF^d2^, and LiF Near 157 nm
Published: 5/1/2002
Authors: John H. Burnett, R Gupta, Ulf Griesmann
Abstract: We present accurate measurements near 157 nm of the absolute index of refraction, the index dispersion, and the temperature dependence of the index, for the cubic-symmetry, ultraviolet optical materials CaF^d2^, SrF^d2^, BaF^d2^, and LiF. Accurate v ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=840544

34. Atomic Oscillator Strengths by Emission Spectroscopy and Lifetime Measurements
Published: 5/1/2002
Authors: Wolfgang Lothar Wiese, Ulf Griesmann, R Kling, J Musielok
Abstract: A series of atomic oscillator strengths measurements was carried out in the last seven years at NIST with a combination of emission spectroscopy and lifetime measurements. Several light elements, specifically C, N, O, F and Ne, and two medium-heavy ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=840587

35. New Optical Metrology at NIST for Semiconductor Lithography
Published: 4/17/2002
Authors: Ulf Griesmann, Tony L Schmitz, Johannes A Soons
Abstract: Optical semiconductor lithography in the deep ultraviolet (DUV) and next generation lithographies such as extreme ultraviolet lithography (EUVL) create many new challenges for surface figure metrology.  We discuss the needs for flatness metrolog ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=821894

36. Accurate Lifetimes and Absolute Transition Rates for Ultraviolet Transitions From 3d^u5^ (^u4^G) 4p and 3d^u5^ (^u4^P) 4p levels in Mn II
Published: 5/1/2001
Authors: R Kling, R Schnabel, Ulf Griesmann
Abstract: A novel laser-induced fluorescence technique was used to measure lifetimes of 14 3d5 (4G) 4p and 3d5(4P) 4p levels in the Mn+ ion. Branching fractions for electric dipole transitions from these levels were measured with a vacuum ultraviolet Fourier ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=840473

37. Absolute Transition Rates for Transitions From 5p Levels in Kr II
Published: 3/1/2001
Authors: Krzysztof Dzierzega, Ulf Griesmann, Gillian Nave, L Bratasz
Abstract: Branching ratios were measured for 155 electric dipole transitions from 5p and 5p1 levels of singly ionized Kr between 200 nm and 2400 nm. Of these, 83 were measured for the first time. Absolute transition rates for prominent lines, with uncertaint ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=840467

38. New Energy Levels and Classifications of Spectral Lines From Neutral and Singly-Ionized Dysprosium (Dy I and Dy II)
Published: 12/1/2000
Authors: Gillian Nave, Ulf Griesmann
Abstract: We present over 4000 new energy-level classifications in the spectra of neutral and singly ionized dysprosium. These lines were observed using Fourier transform spectrometry of high current hollow cathode lamps, and cover the wavelength range 23 nm t ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=840424

39. Accurate Transition Rates for the 5p-5s Transitions in Kr I
Published: 8/1/2000
Authors: Krzysztof Dzierzega, U Volz, Gillian Nave, Ulf Griesmann
Abstract: Branching fractions were measured for electric dipole transitions for the 5p upper levels to the 5s levels in neutral Krypton atoms. The measurements were made with a wall-stabilized electric arc for the spectral lines in the visible, and with a hol ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=840401

40. Interferometric Measurement of Resonance Transition Wavelengths in CIV, SiIV, AlIII, Al II, and SiII
Published: 6/1/2000
Authors: Ulf Griesmann, R Kling
Abstract: The wavelength of the important ultraviolet diagnostic lines in the spectra C IV near 155 nm and Si IV near 139 nm were measured with a vacuum ultraviolet Fourier transform spectrometer and a high-current Penning discharge source. Our measurement als ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=840425



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