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Author: ulf griesmann

Displaying records 31 to 40 of 52 records.
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31. Modal Reconstruction of Aspheric Surfaces from Experimental Second Derivatives
Published: 1/1/2005
Authors: Nadia Machkour-Deshayes, Ulf Griesmann, Byoung Chang Kim
Abstract: A method for the measurement of precise aspheric optical surfaces based on measurements of the second derivatives of the surface is evaluated. A compact phase-measuring interferometer is used to determine the second derivatives of a surface on a sur ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=822079

32. Characterization of Precision Spheres With XCALIBIR
Published: 1/1/2004
Authors: Ulf Griesmann, Johannes A Soons, Quandou Wang
Abstract: The geometry of a nearly spherical surface, for example that of a precision optic, is completely determined by the radius-of-curvature at one point and the deviation from the perfect spherical form at all other points of the sphere. Measurements of ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=822216

33. Measuring Form and Radius of Spheres With Interferometry
Published: 1/1/2004
Authors: Quandou Wang, Johannes A Soons, Ulf Griesmann
Abstract: The geometry of a nearly spherical surface, for example that of a precision optic, is completely determined by the radius of curvature at one point and deviation from the perfect spherical form at all other points of the sphere. Measurements of radi ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=822167

34. Atomic Oscillator Strengths by Emission Spectroscopy and Lifetime Measurements
Published: 5/3/2002
Authors: Ulf Griesmann, J Kling, J Musielok
Abstract: A series of atomic oscillator strengths measurements was carried out in the last seven years at NIST with a combination of emission spectroscopy and lifetime measurements. Several light elements, specifically C, N, O, F and Ne, and two medium-heavy e ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=822076

35. Absolute Refractive Indices and Thermal Coefficients of CaF^d2^, SrF^d2^, BaF^d2^, and LiF Near 157 nm
Published: 5/1/2002
Authors: Ulf Griesmann, J H Burnett, R Gupta
Abstract: We present accurate measurements near 157 nm of the absolute index of refraction, the index dispersion, and the temperature dependence of the index, for the cubic-symmetry, ultraviolet optical materials CaF^d2^, SrF^d2^, BaF^d2^, and LiF. Accurate va ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=822086

36. Absolute Refractive Indices and Thermal Coefficients of CaF^d2^, SrF^d2^, BaF^d2^, and LiF Near 157 nm
Published: 5/1/2002
Authors: John H. Burnett, R Gupta, Ulf Griesmann
Abstract: We present accurate measurements near 157 nm of the absolute index of refraction, the index dispersion, and the temperature dependence of the index, for the cubic-symmetry, ultraviolet optical materials CaF^d2^, SrF^d2^, BaF^d2^, and LiF. Accurate v ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=840544

37. Atomic Oscillator Strengths by Emission Spectroscopy and Lifetime Measurements
Published: 5/1/2002
Authors: Wolfgang Lothar Wiese, Ulf Griesmann, R Kling, J Musielok
Abstract: A series of atomic oscillator strengths measurements was carried out in the last seven years at NIST with a combination of emission spectroscopy and lifetime measurements. Several light elements, specifically C, N, O, F and Ne, and two medium-heavy ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=840587

38. New Optical Metrology at NIST for Semiconductor Lithography
Published: 4/17/2002
Authors: Ulf Griesmann, Tony L Schmitz, Johannes A Soons
Abstract: Optical semiconductor lithography in the deep ultraviolet (DUV) and next generation lithographies such as extreme ultraviolet lithography (EUVL) create many new challenges for surface figure metrology.  We discuss the needs for flatness metrolog ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=821894

39. Accurate Lifetimes and Absolute Transition Rates for Ultraviolet Transitions From 3d^u5^ (^u4^G) 4p and 3d^u5^ (^u4^P) 4p levels in Mn II
Published: 5/1/2001
Authors: R Kling, R Schnabel, Ulf Griesmann
Abstract: A novel laser-induced fluorescence technique was used to measure lifetimes of 14 3d5 (4G) 4p and 3d5(4P) 4p levels in the Mn+ ion. Branching fractions for electric dipole transitions from these levels were measured with a vacuum ultraviolet Fourier ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=840473

40. Absolute Transition Rates for Transitions From 5p Levels in Kr II
Published: 3/1/2001
Authors: Krzysztof Dzierzega, Ulf Griesmann, Gillian Nave, L Bratasz
Abstract: Branching ratios were measured for 155 electric dipole transitions from 5p and 5p1 levels of singly ionized Kr between 200 nm and 2400 nm. Of these, 83 were measured for the first time. Absolute transition rates for prominent lines, with uncertaint ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=840467



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